Works matching IS 10637842 AND DT 2002 AND VI 47 AND IP 10
Results: 24
Electrophysical Characteristics of 2D Three-Component Regular Structures.
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- Technical Physics, 2002, v. 47, n. 10, p. 1205, doi. 10.1134/1.1514797
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On the Polarization Interaction between Two Closely Spaced Conducting Spheres in a Uniform Electrostatic Field.
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- Technical Physics, 2002, v. 47, n. 10, p. 1214, doi. 10.1134/1.1514798
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Analytical Calculation of the Velocity of a Rarefied Gas Sliding around a Solid Cylindrical Surface.
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- Technical Physics, 2002, v. 47, n. 10, p. 1219, doi. 10.1134/1.1514799
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Capillary Disintegration of a Suspended Filamentary Drop of a Viscous Magnetic Fluid in a Longitudinal Magnetic Field.
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- Technical Physics, 2002, v. 47, n. 10, p. 1226, doi. 10.1134/1.1514800
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- Article
Formation and Dispersion of an Electrolyte Film on an Ice Electrode Melting as a Result of Joule Heat Evolution.
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- Technical Physics, 2002, v. 47, n. 10, p. 1237
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Characteristic Features of Reactions Initiated by a Flash Corona Discharge.
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- Technical Physics, 2002, v. 47, n. 10, p. 1246, doi. 10.1134/1.1514802
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Transition Region between a Nonequilibrium Plasma and a Negative Electrode.
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- Technical Physics, 2002, v. 47, n. 10, p. 1250, doi. 10.1134/1.1514803
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- Article
Propagation of Nonlinear Longitudinal Waves in a Solid with Regard to the Interaction between the Strain Field and the Field of Defects.
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- Technical Physics, 2002, v. 47, n. 10, p. 1258, doi. 10.1134/1.1514804
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- Article
Current–Voltage Characteristic and Parameters of the Current Filament Region of an Amorphous Gallium Telluride–Crystalline Silicon Barrier Negistor Structure.
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- Technical Physics, 2002, v. 47, n. 10, p. 1263
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- Article
Effect of Hydrogen on the Photoelectronic Properties of GaAs/InGaAs Quantum-Well Heterostructures with an Island Palladium Layer on the Surface.
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- Technical Physics, 2002, v. 47, n. 10, p. 1268, doi. 10.1134/1.1514806
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Development of Methods for Multidimensional Measurements in the Optical Investigation of Surface.
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- Technical Physics, 2002, v. 47, n. 10, p. 1272, doi. 10.1134/1.1514807
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Laser Diagnostics of Ultrasonic Outgassing of an Insulating Liquid.
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- Technical Physics, 2002, v. 47, n. 10, p. 1277, doi. 10.1134/1.1514808
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- Article
Volume and Contact Photo-Emf in GaAs Adaptive Photodetectors.
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- Technical Physics, 2002, v. 47, n. 10, p. 1283, doi. 10.1134/1.1514809
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- Article
Quasi-Diffraction Effects during Irradiation of Moving Surfaces. Part I.
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- Technical Physics, 2002, v. 47, n. 10, p. 1291
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- Article
Efficiency of Optical-to-Acoustic Energy Conversion upon the Interaction of a Pulsed Laser Radiation with a Liquid: I. Calculation of the Efficiency upon Acoustooptic Interaction.
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- Technical Physics, 2002, v. 47, n. 10, p. 1299, doi. 10.1134/1.1514811
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- Article
On the Possibility of Monitoring Mechanical Displacements by Using Laser Beams of Different Wavelengths.
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- Technical Physics, 2002, v. 47, n. 10, p. 1306, doi. 10.1134/1.1514812
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- Article
Promising Variants of Single Crystal Tungsten Electrodes for High-Performance Thermionic Converters.
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- Technical Physics, 2002, v. 47, n. 10, p. 1310, doi. 10.1134/1.1514813
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Universal SAW Gas Sensor.
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- Technical Physics, 2002, v. 47, n. 10, p. 1316, doi. 10.1134/1.1514814
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Mirror-Type Mass Analyzer with Cylindrical Poles.
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- Technical Physics, 2002, v. 47, n. 10, p. 1321, doi. 10.1134/1.1514815
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- Article
Rapid Formation of an Electron Beam in a Magnetron Gun with a Secondary-Emission Metallic Cathode.
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- Technical Physics, 2002, v. 47, n. 10, p. 1326, doi. 10.1134/1.1514816
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- Article
Statistical Model of Internal Scattering of Vibrational Energy in Composites.
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- Technical Physics, 2002, v. 47, n. 10, p. 1330, doi. 10.1134/1.1514817
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Diffusion of As Ions and Self-Diffusion in Silicon during Implantation.
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- Technical Physics, 2002, v. 47, n. 10, p. 1333, doi. 10.1134/1.1514818
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Structure of Fullerene-Containing Soot at Different Formation Stages of Arc Discharge Vaporization of Graphite.
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- Technical Physics, 2002, v. 47, n. 10, p. 1337, doi. 10.1134/1.1514819
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Repetitive Low-Pressure Volume Discharge Induced by Attachment Instability in an Ar/Cl[sub 2] Mixture.
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- Technical Physics, 2002, v. 47, n. 10, p. 1341, doi. 10.1134/1.1514820
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