Works matching IS 10637842 AND DT 2001 AND VI 46 AND IP 4
Results: 26
Inhomogeneous Fluctuations in Liquids and Gases.
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- Technical Physics, 2001, v. 46, n. 4, p. 363, doi. 10.1134/1.1365456
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Hydrogen Atom in Quantum Mechanics and Quantization on Curved Surfaces.
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- Technical Physics, 2001, v. 46, n. 4, p. 368, doi. 10.1134/1.1365457
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Elastic Scattering of Slow Electrons by Calcium Atoms into an Angular Range Depending on the Collision Energy.
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- Technical Physics, 2001, v. 46, n. 4, p. 375, doi. 10.1134/1.1365458
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The Electromagnetic Field in the Plasma Jet of a Microwave Plasmatron.
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- Technical Physics, 2001, v. 46, n. 4, p. 386, doi. 10.1134/1.1365459
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Relaxation of the Electron Temperature in an Inert-Gas Afterglow Plasma at Elevated Pressures.
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- Technical Physics, 2001, v. 46, n. 4, p. 391, doi. 10.1134/1.1365460
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Dispersion Relation for the Lowest Mode of the Ion-Acoustic Instability in a High-Current Ion Laser.
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- Technical Physics, 2001, v. 46, n. 4, p. 400, doi. 10.1134/1.1365461
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Evolution of the Density Profiles and Flows of Charged Particles during the Diffusive Decay of an Electronegative Gas Plasma.
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- Technical Physics, 2001, v. 46, n. 4, p. 404, doi. 10.1134/1.1365462
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Study of the Structural Perfection and Distribution/Redistribution of Silicon in Epitaxial GaAs Films Grown by Molecular Beam Epitaxy on (100), (111)A, and (111)B Substrates.
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- Technical Physics, 2001, v. 46, n. 4, p. 411, doi. 10.1134/1.1365463
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Mass Transfer in Non-Steady-State Hydride Epitaxy of Si[sub 1 – ][sub x]Ge[sub x]/Si Structures.
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- Technical Physics, 2001, v. 46, n. 4, p. 417, doi. 10.1134/1.1365464
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Domain Dynamics in a Gunn Diode Inserted in a Resistive Circuit.
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- Technical Physics, 2001, v. 46, n. 4, p. 422, doi. 10.1134/1.1365465
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Dynamic Range of Materials for the Magneto-Optic Imaging of Magnetic Fields.
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- Technical Physics, 2001, v. 46, n. 4, p. 427, doi. 10.1134/1.1365466
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Recombination Population of Highly Excited CO[sub 2] States in a Shock-Heated Jet.
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- Technical Physics, 2001, v. 46, n. 4, p. 431, doi. 10.1134/1.1365467
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Analysis of the Active Region of Overheating Temperature in Green LEDs Based on Group III Nitrides.
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- Technical Physics, 2001, v. 46, n. 4, p. 438, doi. 10.1134/1.1365468
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Interaction between Multiple Spatial Solitons in the Diffraction Catastrophe Region upon Focusing a High-Power Laser Beam in a Nonlinear Medium.
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- Technical Physics, 2001, v. 46, n. 4, p. 442, doi. 10.1134/1.1365469
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Temperature-Stable Orientations in LGS and LGN Piezoelectric Crystals for Surface Acoustic Waves.
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- Technical Physics, 2001, v. 46, n. 4, p. 450, doi. 10.1134/1.1365470
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Slow Electromagnetic Waves in Tangentially Magnetized Ferromagnetic Films.
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- Technical Physics, 2001, v. 46, n. 4, p. 456, doi. 10.1134/1.1365471
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Microwave Pulse Compression in a Chain of Ring-Type Resonators.
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- Technical Physics, 2001, v. 46, n. 4, p. 460, doi. 10.1134/1.1365472
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Exchange Self-Polarization of an Electron Beam.
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- Technical Physics, 2001, v. 46, n. 4, p. 463, doi. 10.1134/1.1365473
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Computation of the Third-Order Matrizant for a Sectorial Electrostatic Field.
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- Technical Physics, 2001, v. 46, n. 4, p. 466, doi. 10.1134/1.1365474
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Dynamics of Electron Beams in Plasmas.
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- Technical Physics, 2001, v. 46, n. 4, p. 472, doi. 10.1134/1.1365475
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Molding Loose Metal Particles into Briquettes with the Use of Short Pulses of High Density Current.
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- Technical Physics, 2001, v. 46, n. 4, p. 484, doi. 10.1134/1.1365476
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Anomalous Behavior of Arsenic Ions Implanted into Silicon at 850°C.
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- Technical Physics, 2001, v. 46, n. 4, p. 490, doi. 10.1134/1.1365477
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The Ion-Optical Scheme of a Portable Mass Spectrometer.
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- Technical Physics, 2001, v. 46, n. 4, p. 492, doi. 10.1134/1.1365478
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Formation of Oriented Cadmium Telluride Films on an Amorphous Substrate under Extremely Nonequilibrium Conditions.
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- Technical Physics, 2001, v. 46, n. 4, p. 495, doi. 10.1134/1.1365479
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Study of the Effect of Manganese Impurities on Dielectric Characteristics of BSTO Films.
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- Technical Physics, 2001, v. 46, n. 4, p. 498, doi. 10.1134/1.1365480
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Condensation in Pulsed Free Jets of Silane–Argon Mixture: Time Characteristics of the Pulses.
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- Technical Physics, 2001, v. 46, n. 4, p. 503, doi. 10.1134/1.1365481
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