Works matching IS 10637826 AND DT 2018 AND VI 52 AND IP 7
Results: 25
Concentric Hexagonal GaN Structures for Nanophotonics, Fabricated by Selective Vapor-Phase Epitaxy with Ion-Beam Etching.
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- Semiconductors, 2018, v. 52, n. 7, p. 954, doi. 10.1134/S1063782618070151
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On the Fabrication and Study of Lattice-Matched Heterostructures for Quantum Cascade Lasers.
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- Semiconductors, 2018, v. 52, n. 7, p. 950, doi. 10.1134/S106378261807014X
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Diversity of Properties of Device Structures Based on Group-III Nitrides, Related to Modification of the Fractal-Percolation System.
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- Semiconductors, 2018, v. 52, n. 7, p. 942, doi. 10.1134/S1063782618070072
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Effect of Deep Centers on Charge-Carrier Confinement in InGaN/GaN Quantum Wells and on LED Efficiency.
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- Semiconductors, 2018, v. 52, n. 7, p. 934, doi. 10.1134/S1063782618070035
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Investigation of the Characteristics of Heterojunction Solar Cells Based on Thin Single-Crystal Silicon Wafers.
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- Semiconductors, 2018, v. 52, n. 7, p. 931, doi. 10.1134/S1063782618070230
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Study of Deep Levels in a HIT Solar Cell.
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- Semiconductors, 2018, v. 52, n. 7, p. 926, doi. 10.1134/S1063782618070254
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Effect of Electron-Phonon Interaction on the Conductivity and Work Function of Epitaxial Graphene.
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- Semiconductors, 2018, v. 52, n. 7, p. 921, doi. 10.1134/S1063782618070047
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Structure and Properties of Thin Graphite-Like Films Produced by Magnetron-Assisted Sputtering.
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- Semiconductors, 2018, v. 52, n. 7, p. 914, doi. 10.1134/S1063782618070266
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Analysis of the Structure and Conductivity of Kinked Carbon Chains Obtained by Pulsed Plasma Deposition on Various Metal Substrates.
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- Semiconductors, 2018, v. 52, n. 7, p. 907, doi. 10.1134/S1063782618070102
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Modification of Photoconductivity Spectra in ZnO-CdSe Quantum- Dot Composites upon Exposure to Additional Photoexcitation.
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- Semiconductors, 2018, v. 52, n. 7, p. 902, doi. 10.1134/S1063782618070059
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Photoluminescence Properties of ZnO Nanorods Synthesized by Different Methods.
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- Semiconductors, 2018, v. 52, n. 7, p. 897, doi. 10.1134/S1063782618070126
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Study of Current Flow Mechanisms in a CdS/por-Si/p-Si Heterostructure.
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- Semiconductors, 2018, v. 52, n. 7, p. 891, doi. 10.1134/S1063782618070242
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Dielectric Properties of Nanocrystalline Tungsten Oxide in the Temperature Range of 223-293 K.
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- Semiconductors, 2018, v. 52, n. 7, p. 885, doi. 10.1134/S1063782618070114
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Photoelectric Properties of ZnO Threadlike Crystals.
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- Semiconductors, 2018, v. 52, n. 7, p. 881, doi. 10.1134/S1063782618070205
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Experimental Study of Spontaneous Emission in Bragg Multiple- Quantum-Well Structures with InAs Single-Layer Quantum Wells.
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- Semiconductors, 2018, v. 52, n. 7, p. 877, doi. 10.1134/S1063782618070187
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In<sub>0.8</sub>Ga<sub>0.2</sub>As Quantum Dots for GaAs Solar Cells: Metal-Organic Vapor-Phase Epitaxy Growth Peculiarities and Properties.
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- Semiconductors, 2018, v. 52, n. 7, p. 870, doi. 10.1134/S1063782618070199
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Ultrafast Dynamics of Photoexcited Charge Carriers in In<sub>0.53</sub>Ga<sub>0.47</sub>As/In<sub>0.52</sub>Al<sub>0.48</sub>As Superlattices under Femtosecond Laser Excitation.
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- Semiconductors, 2018, v. 52, n. 7, p. 864, doi. 10.1134/S1063782618070175
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Electrical Properties of p-NiO/n-Si Heterostructures Based on Nanostructured Silicon.
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- Semiconductors, 2018, v. 52, n. 7, p. 859, doi. 10.1134/S1063782618070163
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Transverse Nernst-Ettingshausen Effect in Superlattices Upon Electron-Phonon Scattering.
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- Semiconductors, 2018, v. 52, n. 7, p. 853, doi. 10.1134/S1063782618070084
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Photoreflectance Spectroscopy Study of LT-GaAs Layers Grown on Si and GaAs Substrates.
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- Semiconductors, 2018, v. 52, n. 7, p. 849, doi. 10.1134/S1063782618070023
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Effect of Boron Impurity on the Light-Emitting Properties of Dislocation Structures Formed in Silicon by Si<sup>+</sup> Ion Implantation.
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- Semiconductors, 2018, v. 52, n. 7, p. 843, doi. 10.1134/S1063782618070229
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Photothreshold of an α-GeS Layered Crystal: First-Principles Calculation.
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- Semiconductors, 2018, v. 52, n. 7, p. 840, doi. 10.1134/S1063782618070060
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Radiative Recombination, Carrier Capture at Traps, and Photocurrent Relaxation in PbSnTe:In with a Composition Close to Band Inversion.
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- Semiconductors, 2018, v. 52, n. 7, p. 836, doi. 10.1134/S1063782618070096
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Kinetics of the Variation in the Magnetic Impurity Ion Concentration in Pb<sub>1-x-y</sub>Sn<sub>x</sub>V<sub>y</sub>Te Alloys upon Doping.
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- Semiconductors, 2018, v. 52, n. 7, p. 828, doi. 10.1134/S1063782618070217
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Matrix Calculation of the Spectral Characteristics of AII-BVI Semiconductors Doped with Iron-Group Ions.
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- Semiconductors, 2018, v. 52, n. 7, p. 821, doi. 10.1134/S1063782618070138
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