Works matching IS 10637826 AND DT 2018 AND VI 52 AND IP 13
Results: 23
New Manufacturing Approaches to Texture Formation and Thermal Expansion Matching in the Design of Highly Efficient Silicon Solar Photoconverters.
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- Semiconductors, 2018, v. 52, n. 13, p. 1782, doi. 10.1134/S1063782618130134
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Precision Chemical Etching of GaP(NAs) Epitaxial Layers for the Formation of Monolithic Optoelectronic Devices.
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- Semiconductors, 2018, v. 52, n. 13, p. 1775, doi. 10.1134/S1063782618130092
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Features of the Selective Growth of GaN Nanorods on Patterned c-Sapphire Substrates of Various Configurations.
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- Semiconductors, 2018, v. 52, n. 13, p. 1770, doi. 10.1134/S1063782618130158
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Determination of the Region of Thermal Stability of the Size and Phase Composition of Silver-Sulfide Semiconductor Nanoparticles.
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- Semiconductors, 2018, v. 52, n. 13, p. 1763, doi. 10.1134/S1063782618130146
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Radiation-Induced Damage of Silicon-Carbide Diodes by High-Energy Particles.
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- Semiconductors, 2018, v. 52, n. 13, p. 1758, doi. 10.1134/S1063782618130171
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AlGaAs/GaAs Photovoltaic Converters of Tritium Radioluminescent-Lamp Radiation.
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- Semiconductors, 2018, v. 52, n. 13, p. 1754, doi. 10.1134/S1063782618130080
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GaInAsP/InP-Based Laser Power Converters (λ = 1064 nm).
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- Semiconductors, 2018, v. 52, n. 13, p. 1748, doi. 10.1134/S1063782618130079
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nBn-Photodiode Based on InAsSb/AlAsSb Alloys with a Long-Wavelength Cutoff of 5 μm.
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- Semiconductors, 2018, v. 52, n. 13, p. 1743, doi. 10.1134/S1063782618130110
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Impact of the Device Geometric Parameters on Hot-Carrier Degradation in FinFETs.
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- Semiconductors, 2018, v. 52, n. 13, p. 1738, doi. 10.1134/S1063782618130183
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Charge Accumulation in MOS Structures with a Polysilicon Gate under Tunnel Injection.
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- Semiconductors, 2018, v. 52, n. 13, p. 1732, doi. 10.1134/S1063782618130031
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Influence of Hydrogen Peroxide on the Photoanodization of n-Si in the Breakdown Mode.
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- Semiconductors, 2018, v. 52, n. 13, p. 1721, doi. 10.1134/S1063782618130122
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Ab Initio Study of the ZnSnSb<sub>2</sub> Semiconductor.
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- Semiconductors, 2018, v. 52, n. 13, p. 1715, doi. 10.1134/S1063782618130043
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Specific Features of the Electron Structure of ZnTPP Aggregated Forms: Data of Optical Measurements and Quantum-Chemical Calculations.
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- Semiconductors, 2018, v. 52, n. 13, p. 1708, doi. 10.1134/S1063782618130237
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Diffusion Blurring of GaAs Quantum Wells Grown at Low Temperature.
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- Semiconductors, 2018, v. 52, n. 13, p. 1704, doi. 10.1134/S1063782618130213
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Redistribution of Erbium and Oxygen Recoil Atoms and the Structure of Silicon Thin Surface Layers Formed by High-Dose Argon Implantation through Er and SiO<sub>2</sub> Surface Films.
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- Semiconductors, 2018, v. 52, n. 13, p. 1696, doi. 10.1134/S1063782618130055
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Optical Studies of Heat Transfer in PbTe:Bi(Sb) Thin Films.
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- Semiconductors, 2018, v. 52, n. 13, p. 1691, doi. 10.1134/S1063782618130067
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Intracenter Radiative Transitions at Tantalum Impurity Centers in Cadmium Telluride.
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- Semiconductors, 2018, v. 52, n. 13, p. 1686, doi. 10.1134/S1063782618130201
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Interaction Rates of Group-III and Group-V Impurities with Intrinsic Point Defects in Irradiated Si and Ge.
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- Semiconductors, 2018, v. 52, n. 13, p. 1677, doi. 10.1134/S1063782618130249
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Conduction-Electron Spin Resonance in HgSe Crystals.
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- Semiconductors, 2018, v. 52, n. 13, p. 1672, doi. 10.1134/S1063782618130225
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Measurement of the Charge-Carrier Mobility in Gallium Arsenide Using a Near-Field Microwave Microscope by the Microwave-Magnetoresistance Method.
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- Semiconductors, 2018, v. 52, n. 13, p. 1669, doi. 10.1134/S1063782618130195
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Features of the Electron Mobility in the n-InSe Layered Semiconductor.
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- Semiconductors, 2018, v. 52, n. 13, p. 1662, doi. 10.1134/S106378261813002X
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Effect of a por-Si Buffer Layer on the Structure and Morphology of Epitaxial In<sub>x</sub>Ga<sub>1 - x</sub>N/Si(111) Heterostructures.
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- Semiconductors, 2018, v. 52, n. 13, p. 1653, doi. 10.1134/S106378261813016X
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McCurdy's Effects in the Thermal Conductivity of Elastically Anisotropic Crystals in the Mode of Knudsen Phonon-Gas Flow.
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- Semiconductors, 2018, v. 52, n. 13, p. 1643, doi. 10.1134/S1063782618130109
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