Works matching IS 10637826 AND DT 2014 AND VI 48 AND IP 4


Results: 26
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    Current flow through metal shunts in ohmic contacts to n-Si.

    Published in:
    Semiconductors, 2014, v. 48, n. 4, p. 492, doi. 10.1134/S1063782614040241
    By:
    • Sachenko, A.;
    • Belyaev, A.;
    • Pilipenko, V.;
    • Petlitskaya, T.;
    • Anischik, V.;
    • Boltovets, N.;
    • Konakova, R.;
    • Kudryk, Ya.;
    • Vinogradov, A.;
    • Sheremet, V.
    Publication type:
    Article
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