Works matching IS 10637826 AND DT 2014 AND VI 48 AND IP 11
Results: 27
Methods for estimating the compensating-impurity concentration in Hg-doped Ge.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1408, doi. 10.1134/S1063782614110062
- By:
- Publication type:
- Article
A DFT study of BeX ( X = S, Se, Te) semiconductor: Modified Becke Johnson (mBJ) potential.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1411, doi. 10.1134/S1063782614110244
- By:
- Publication type:
- Article
Hysteretic phenomena in a 2DEG in the quantum Hall effect regime, studied in a transport experiment.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1423, doi. 10.1134/S1063782614110074
- By:
- Publication type:
- Article
Hall effect in CdTe crystals doped with Sn from the vapor phase.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1432, doi. 10.1134/S1063782614110153
- By:
- Publication type:
- Article
Physical properties of FeGaSe under an applied alternating current.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1434, doi. 10.1134/S1063782614110219
- By:
- Publication type:
- Article
Vacancy-donor pairs and their formation in irradiated n-Si.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1438, doi. 10.1134/S1063782614110098
- By:
- Publication type:
- Article
Study of the vibrational states of CdTe and CdHgTe lattices under conditions of the adsorption of ammonia and carbon dioxide.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1444, doi. 10.1134/S1063782614110104
- By:
- Publication type:
- Article
Electron diffraction study of the phase formation of Tl-Fe-Se and kinetics of phase transformations of films TlFeSe.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1449, doi. 10.1134/S1063782614110037
- By:
- Publication type:
- Article
Multilayer quantum-dot arrays of high bulk density.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1452, doi. 10.1134/S1063782614110190
- By:
- Publication type:
- Article
Formation and annealing of metastable (interstitial oxygen)-(interstitial carbon) complexes in n- and p-type silicon.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1456, doi. 10.1134/S1063782614110141
- By:
- Publication type:
- Article
Investigation of GaAs/AlGaAs quantum cascade structures by optical methods based on hot luminescence in the near-infrared range.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1463, doi. 10.1134/S1063782614110165
- By:
- Publication type:
- Article
Electrically-detected electron paramagnetic resonance of point centers in 6 H-SiC nanostructures.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1467, doi. 10.1134/S1063782614110049
- By:
- Publication type:
- Article
Sensitization of the photoelectric effect in carbazole- and indolocarbazole-containing poly(phenylquinoline)s by benzothiadiazole acceptor molecules.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1481, doi. 10.1134/S1063782614110025
- By:
- Publication type:
- Article
Functionalization of nc-Si/SiO semiconductor quantum dots by oligonucleotides.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1485, doi. 10.1134/S1063782614110050
- By:
- Publication type:
- Article
On the applicability boundaries of the restoration method for the temporal shape of modulated optical signals with a frequency higher than the boundary frequency of a photoresistor.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1490, doi. 10.1134/S1063782614110220
- By:
- Publication type:
- Article
Features of the current-voltage characteristics in thin conductive layers of organic light-emitting diodes.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1494, doi. 10.1134/S1063782614110232
- By:
- Publication type:
- Article
Gas-sensitive layers based on fractal-percolation structures.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1499, doi. 10.1134/S1063782614110177
- By:
- Publication type:
- Article
Specific features of the recombination loss of the photocurrent in n-TiN/ p-Si anisotype heterojunctions.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1504, doi. 10.1134/S106378261411027X
- By:
- Publication type:
- Article
Planar microcavity containing luminescent diamond particles with embedded silicon-vacancy color centers in its active layer.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1507, doi. 10.1134/S1063782614110128
- By:
- Publication type:
- Article
Biosensors based on a method for determining the conductance matrix of multiterminal semiconductor nanostructures.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1512, doi. 10.1134/S1063782614110086
- By:
- Publication type:
- Article
Spectral features of the photoresponse of structures with silicon nanoparticles.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1518, doi. 10.1134/S106378261411013X
- By:
- Publication type:
- Article
Phase formation upon the interaction of thin films in the system YbSmTe-AsTe.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1525, doi. 10.1134/S1063782614110116
- By:
- Publication type:
- Article
Structure and optical properties of thin AlO films deposited by the reactive ion-plasma sputtering method on GaAs (100) substrates.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1527, doi. 10.1134/S1063782614110256
- By:
- Publication type:
- Article
Dependence of the AlN-Layer growth rate on source-substrate clearance for the sublimation growth method.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1532, doi. 10.1134/S1063782614110281
- By:
- Publication type:
- Article
Specific features of the hydride vapor-phase epitaxy of nitride materials on a silicon substrate.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1535, doi. 10.1134/S1063782614110189
- By:
- Publication type:
- Article
Effect of local structural defects on the precipitation of as in the vicinity of InAs quantum dots in a GaAs matrix.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1539, doi. 10.1134/S1063782614110207
- By:
- Publication type:
- Article
Microdeformations of the crystal lattice of PbTeBr solid solutions.
- Published in:
- Semiconductors, 2014, v. 48, n. 11, p. 1405, doi. 10.1134/S1063782614110268
- By:
- Publication type:
- Article