Works matching IS 10637826 AND DT 2009 AND VI 43 AND IP 6
Results: 27
Thin-film polycrystalline n-ZnO/ p-CuO heterojunction.
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- Semiconductors, 2009, v. 43, n. 6, p. 765, doi. 10.1134/S1063782609060153
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Ways and peculiarities of submillimeter wavelength detection with short-channel field-effect transistors.
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- Semiconductors, 2009, v. 43, n. 6, p. 787, doi. 10.1134/S1063782609060190
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Specific features of electronic and vibrational properties of I-V-V<sub>2</sub> crystals.
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- Semiconductors, 2009, v. 43, n. 6, p. 735, doi. 10.1134/S1063782609060098
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Application of the theory of transient processes in high-resistivity semiconductors to the determination of properties of the cold Universe.
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- Semiconductors, 2009, v. 43, n. 6, p. 740, doi. 10.1134/S1063782609060104
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Relaxation of optically stimulated resistance of thin SnO<sub>2</sub> films.
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- Semiconductors, 2009, v. 43, n. 6, p. 782, doi. 10.1134/S1063782609060189
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Study of the 3 C-SiC layers grown on the 15 R-SiC substrates.
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- Semiconductors, 2009, v. 43, n. 6, p. 756, doi. 10.1134/S106378260906013X
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The quantum solution of the accumulation layer problem of n-InN.
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- Semiconductors, 2009, v. 43, n. 6, p. 760, doi. 10.1134/S1063782609060141
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Structure of cadmium selen-telluride alloy films grown by the thermal-screen method under highly nonequilibrium conditions.
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- Semiconductors, 2009, v. 43, n. 6, p. 706, doi. 10.1134/S1063782609060037
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Distribution of electric fields in ZnS:Mn single crystals during electroluminescence.
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- Semiconductors, 2009, v. 43, n. 6, p. 716, doi. 10.1134/S1063782609060050
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Spontaneous detachment of a sublimation-Grown AlN layer from a SiC-6 H substrate.
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- Semiconductors, 2009, v. 43, n. 6, p. 818, doi. 10.1134/S1063782609060244
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Heat- and radiation-resistant contacts to SiC made on the basis of quasi-amorphous ZrB<sub>2</sub> films.
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- Semiconductors, 2009, v. 43, n. 6, p. 726, doi. 10.1134/S1063782609060074
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Density of displacement cascades for cluster ions: An algorithm of calculation and the influence on damage formation in ZnO and GaN.
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- Semiconductors, 2009, v. 43, n. 6, p. 691, doi. 10.1134/S1063782609060013
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Effect of conjugation with biomolecules on photoluminescence and structural characteristics of CdSe/ZnS quantum dots.
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- Semiconductors, 2009, v. 43, n. 6, p. 775, doi. 10.1134/S1063782609060177
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Effective photoelectric converters of ultraviolet radiation with graded-gap ZnS-based layers.
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- Semiconductors, 2009, v. 43, n. 6, p. 801, doi. 10.1134/S1063782609060219
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Effect of carbon monoxide on the capacitance-voltage characteristics of Pd-SiO<sub>2</sub>-Si MOS diodes.
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- Semiconductors, 2009, v. 43, n. 6, p. 751, doi. 10.1134/S1063782609060128
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Phase transformations in II–V semiconductors under high pressure.
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- Semiconductors, 2009, v. 43, n. 6, p. 701, doi. 10.1134/S1063782609060025
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The influence of the energy of photoexcitation in the course of electron irradiation on defect formation in n-Si crystals.
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- Semiconductors, 2009, v. 43, n. 6, p. 721, doi. 10.1134/S1063782609060062
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Intersegment resistance in silicon p— n-Junction position-sensitive detectors.
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- Semiconductors, 2009, v. 43, n. 6, p. 796, doi. 10.1134/S1063782609060207
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Low-temperature plasma pulsed deposition of thin films with nanoscale periodicity of properties.
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- Semiconductors, 2009, v. 43, n. 6, p. 828, doi. 10.1134/S106378260906027X
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Effect of strain relaxation on active-region formation in InGaN/(Al)GaN heterostructures for green LEDs.
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- Semiconductors, 2009, v. 43, n. 6, p. 812, doi. 10.1134/S1063782609060232
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Phase separation and nonradiative carrier recombination in active regions of light-emitting devices based on InGaN quantum dots in a GaN or AlGaN matrix.
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- Semiconductors, 2009, v. 43, n. 6, p. 807, doi. 10.1134/S1063782609060220
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Redistribution of deep selenium and sulfur impurities in silicon upon surface doping with phosphorus.
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- Semiconductors, 2009, v. 43, n. 6, p. 710, doi. 10.1134/S1063782609060049
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Scanning tunneling microscopy of the Si-SiO<sub>2</sub> structure: the use of feedback fault conditions in surface studies.
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- Semiconductors, 2009, v. 43, n. 6, p. 820, doi. 10.1134/S1063782609060256
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Effect of chlorine impurities on the long-wavelength absorption edge of CdTe single crystals.
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- Semiconductors, 2009, v. 43, n. 6, p. 730, doi. 10.1134/S1063782609060086
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Relation between currents and charges measured in samples during diagnostics of inhomogeneous insulating films.
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- Semiconductors, 2009, v. 43, n. 6, p. 823, doi. 10.1134/S1063782609060268
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Nonradiative recombination in GaN quantum dots formed in the AlN matrix.
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- Semiconductors, 2009, v. 43, n. 6, p. 768, doi. 10.1134/S1063782609060165
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The variation in activity of recombination centers in silicon p- n structures under the conditions of acoustic loading.
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- Semiconductors, 2009, v. 43, n. 6, p. 745, doi. 10.1134/S1063782609060116
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