Works matching IS 10637826 AND DT 2008 AND VI 42 AND IP 4
1
- Semiconductors, 2008, v. 42, n. 4, p. 495, doi. 10.1134/S1063782608040234
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2
- Semiconductors, 2008, v. 42, n. 4, p. 383, doi. 10.1134/S1063782608040039
- Kamilov, I.;
- Stepurenko, A.;
- Gummetov, A.;
- Kovalev, A.
- Article
3
- Semiconductors, 2008, v. 42, n. 4, p. 389, doi. 10.1134/S1063782608040040
- Davidyuk, G.;
- Bozhko, V.;
- Mironchuk, G.;
- Bulatetskaya, L.;
- Kevshin, A.
- Article
4
- Semiconductors, 2008, v. 42, n. 4, p. 401, doi. 10.1134/S1063782608040064
- Stepanov, N.;
- Gil’fanov, A.;
- Ivanova, L.;
- Granatkina, Yu.
- Article
5
- Semiconductors, 2008, v. 42, n. 4, p. 490, doi. 10.1134/S1063782608040210
- Article
6
- Semiconductors, 2008, v. 42, n. 4, p. 493, doi. 10.1134/S1063782608040222
- Article
7
- Semiconductors, 2008, v. 42, n. 4, p. 486, doi. 10.1134/S1063782608040209
- Serdobintsev, A.;
- Veselov, A.;
- Kiryasova, O.
- Article
8
- Semiconductors, 2008, v. 42, n. 4, p. 475, doi. 10.1134/S1063782608040180
- Galkin, K.;
- Dotsenko, S.;
- Galkin, N.;
- Kumar, M.;
- Govind;
- Shivaprasad, S.
- Article
9
- Semiconductors, 2008, v. 42, n. 4, p. 463, doi. 10.1134/S1063782608040167
- Morozov, Yu.;
- Nefedov, I.;
- Leinonen, T.;
- Morozov, M.
- Article
10
- Semiconductors, 2008, v. 42, n. 4, p. 453, doi. 10.1134/S1063782608040143
- Belyaev, A.;
- Boltovets, N.;
- Ivanov, V.;
- Kamalov, A.;
- Kapitanchuk, L.;
- Konakova, R.;
- Kudryk, Ya.;
- Lytvyn, O.;
- Milenin, V.;
- Nasyrov, M.
- Article
11
- Semiconductors, 2008, v. 42, n. 4, p. 443, doi. 10.1134/S106378260804012X
- Ayzenshtat, G.;
- Lelekov, M.;
- Tolbanov, O.
- Article
12
- Semiconductors, 2008, v. 42, n. 4, p. 406, doi. 10.1134/S1063782608040076
- Untila, G.;
- Kost, T.;
- Chebotareva, A.;
- Zaks, M.;
- Sitnikov, A.;
- Solodukha, O.
- Article
13
- Semiconductors, 2008, v. 42, n. 4, p. 394, doi. 10.1134/S1063782608040052
- Article
14
- Semiconductors, 2008, v. 42, n. 4, p. 429, doi. 10.1134/S1063782608040106
- Badgutdinov, M.;
- Yunovich, A.
- Article
15
- Semiconductors, 2008, v. 42, n. 4, p. 414, doi. 10.1134/S1063782608040088
- Drapak, S.;
- Gavrylyuk, S.;
- Kovalyuk, Z.;
- Lytvyn, O.
- Article
16
- Semiconductors, 2008, v. 42, n. 4, p. 439, doi. 10.1134/S1063782608040118
- Article
17
- Semiconductors, 2008, v. 42, n. 4, p. 422, doi. 10.1134/S106378260804009X
- Gassan-zade, S.;
- Strikha, M.;
- Shepelsky, G.
- Article
18
- Semiconductors, 2008, v. 42, n. 4, p. 448, doi. 10.1134/S1063782608040131
- Astrov, Yu.;
- Shuman, V.;
- Lodygin, A.;
- Portsel, L.;
- Makhova, A.
- Article
19
- Semiconductors, 2008, v. 42, n. 4, p. 458, doi. 10.1134/S1063782608040155
- Zhurtanov, B.;
- Il’inskaya, N.;
- Imenkov, A.;
- Mikhaĭlova, M.;
- Kalinina, K.;
- Sipovskaya, M.;
- Stoyanov, N.;
- Yakovlev, Yu.
- Article
20
- Semiconductors, 2008, v. 42, n. 4, p. 470, doi. 10.1134/S1063782608040179
- Astrova, E.;
- Nechitaĭlov, A.
- Article
21
- Semiconductors, 2008, v. 42, n. 4, p. 379, doi. 10.1134/S1063782608040027
- Article
22
- Semiconductors, 2008, v. 42, n. 4, p. 375, doi. 10.1134/S1063782608040015
- Grygorchak, I.;
- Pelekhovych, A.;
- Volynskaya, N.
- Article
23
- Semiconductors, 2008, v. 42, n. 4, p. 481, doi. 10.1134/S1063782608040192
- Ryabtsev, S.;
- Yukish, A.;
- Khango, S.;
- Yurakov, Yu.;
- Shaposhnik, A.;
- Domashevskaya, É.
- Article