Works matching IS 10637826 AND DT 1999 AND VI 33 AND IP 3
Results: 24
Dopant impurity diffusion from polymer diffusants and its applications in semiconductor device technology. A review.
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- Semiconductors, 1999, v. 33, n. 3, p. 265, doi. 10.1134/1.1187676
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Dielectric properties of the semiconducting compounds Cd[sub 1-x]Fe[sub x]Te.
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- Semiconductors, 1999, v. 33, n. 3, p. 276
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Current-illumination characteristics of CdHgTe crystals with photoactive inclusions.
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- Semiconductors, 1999, v. 33, n. 3, p. 278, doi. 10.1134/1.1187677
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Temperature dependences of the photoconducitivty of CdHgTe crystals with photoactive inclusions.
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- Semiconductors, 1999, v. 33, n. 3, p. 282, doi. 10.1134/1.1187678
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Raman scattering spectroscopy of Zn[sub 1-x]Cd[sub x]Se films grown on GaAs substrates by molecular-beam epitaxy.
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- Semiconductors, 1999, v. 33, n. 3, p. 286, doi. 10.1134/1.1187679
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Optical and photoelectric properties of Zn[sub 1-x]Fe[sub x]Te crystals.
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- Semiconductors, 1999, v. 33, n. 3, p. 289, doi. 10.1134/1.1187680
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Calculating the band structure of InSb[sub 1-x]Bi[sub x] solid solutions.
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- Semiconductors, 1999, v. 33, n. 3, p. 293
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Effective charge carrier lifetime in CdHgTe variable-gap structures.
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- Semiconductors, 1999, v. 33, n. 3, p. 297
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Polarization photosensitivity of GaN/Si heterojunctions.
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- Semiconductors, 1999, v. 33, n. 3, p. 301, doi. 10.1134/1.1187683
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Mechanism for heavy Fe doping of epitaxial GaAs/AlGaAs heterostructures.
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- Semiconductors, 1999, v. 33, n. 3, p. 305, doi. 10.1134/1.1187684
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Ion neutralization effects at a semiconductor-insulator interface produced as a result of space-charge thermal depolarization of MOS structures.
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- Semiconductors, 1999, v. 33, n. 3, p. 308, doi. 10.1134/1.1187685
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Selective doping in hydride epitaxy and the electrical properties of quantum-well Ge/GeSi:B heterostructures.
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- Semiconductors, 1999, v. 33, n. 3, p. 313, doi. 10.1134/1.1187686
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Photoluminescence and transport properties of multilayer InAs/GaAs structures with quantum dots.
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- Semiconductors, 1999, v. 33, n. 3, p. 318
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Comparative study of the optical properties of porous silicon and the oxides SiO and SiO[sub 2].
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- Semiconductors, 1999, v. 33, n. 3, p. 323, doi. 10.1134/1.1187688
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Photosensitive structures based on porous silicon.
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- Semiconductors, 1999, v. 33, n. 3, p. 327, doi. 10.1134/1.1187689
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Photoconductivity of amorphous hydrated silicon doped by ion implantation.
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- Semiconductors, 1999, v. 33, n. 3, p. 332
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Electronic properties and structure of a-Si : H films with higher photosensitivity.
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- Semiconductors, 1999, v. 33, n. 3, p. 335, doi. 10.1134/1.1187892
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Electrical and photoelectric characteristics of n-Si/porous silicon/Pd diode structures and the effect of gaseous hydrogen on them.
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- Semiconductors, 1999, v. 33, n. 3, p. 339, doi. 10.1134/1.1187893
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Temperature dependence of the quantum efficiency of silicon p-n photodiodes.
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- Semiconductors, 1999, v. 33, n. 3, p. 343, doi. 10.1134/1.1187691
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Planar-doped gallium-arsenide structures for bulk potential barrier microwave diodes.
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- Semiconductors, 1999, v. 33, n. 3, p. 345, doi. 10.1134/1.1187692
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Suppression of Auger recombination in diode lasers utilizing InAsSb/InAsSbP and InAs/GaInAsSb type-II heterojunctions.
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- Semiconductors, 1999, v. 33, n. 3, p. 350, doi. 10.1134/1.1187693
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Bistability of electroluminescence in a type-II AlGaAsSb/InGaAsSb double heterostructure.
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- Semiconductors, 1999, v. 33, n. 3, p. 355, doi. 10.1134/1.1187694
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Effect of heat treatment on the photoelectric properties of Si(Zn) photodetectors.
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- Semiconductors, 1999, v. 33, n. 3, p. 359, doi. 10.1134/1.1187695
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Vertical double-collector, strain-sensitive transistor with accelerating electric fields in the base and in the emitter.
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- Semiconductors, 1999, v. 33, n. 3, p. 366, doi. 10.1134/1.1187696
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