Works matching IS 10637826 AND DT 1997 AND VI 31 AND IP 9


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    Radiation hardness of porous silicon.

    Published in:
    Semiconductors, 1997, v. 31, n. 9, p. 966, doi. 10.1134/1.1187143
    By:
    • Ushakov, V. V.;
    • Dravin, V. A.;
    • Mel’nik, N. N.;
    • Karavanskiı, V. A.;
    • Konstantinova, E. A.;
    • Timoshenko, V. Yu.
    Publication type:
    Article
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