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Reentrant kinetic phase transitions during dendritic growth of crystals in a two-dimensional medium with phase separation.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 495, doi. 10.1134/1.1261736
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X-ray monitoring of the filling of cluster lattices in synthetic opals.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 498, doi. 10.1134/1.1261725
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Determination of the average size and concentration of air bubbles in water by nuclear magnetic resonance.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 513, doi. 10.1134/1.1261776
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Integrated-optics detectors with recording of the reflection coefficient in a prism excitation system.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 515, doi. 10.1134/1.1261891
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Investigation of implanted layers in silicon carbide by a modulation photoreflection method.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 500, doi. 10.1134/1.1261726
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Normal zone propagation velocity in a superconducting wire with a copper-aluminum stabilizing matrix.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 518, doi. 10.1134/1.1261731
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Influence of the ionizing and displacing components of proton irradiation on structural changes in boron nitride.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 511, doi. 10.1134/1.1261730
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Amorphous silicon and germanium films for uncooled microbolometers.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 504, doi. 10.1134/1.1261727
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Structural and noise characterization of VO[sub 2] films on SiO[sub 2]/Si substrates.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 520, doi. 10.1134/1.1261815
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Low-temperature radiation-stimulated gettering of impurities and defects in silicon by layers of porous silicon.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 507, doi. 10.1134/1.1261728
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Intensity and phase of reflected radiation in a vanadium dioxide structure with surface plasmons.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 509, doi. 10.1134/1.1261729
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Physical model of the transition from a hexagonal to a cubic structure during growth of boron nitride under nitrogen and argon ion irradiation.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 523, doi. 10.1134/1.1261732
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- Article
Thermal and isothermal slip in a new Liu model transport equation.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 540, doi. 10.1134/1.1261856
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Fractal structure and some physical properties of carbon deposits obtained by sputtering of graphite in an electric arc.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 525, doi. 10.1134/1.1261733
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Nonequilibrium structural transitions as a mechanism of turbulence.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 529, doi. 10.1134/1.1261735
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Transition to chaotization and loss of self-averaging in two-dimensional two-phase media at the flow threshold.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 532, doi. 10.1134/1.1261852
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- Article
Use of a two-wire microwave line at the boundary of the investigated zone to measure the electron density in a low-temperature plasma.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 535, doi. 10.1134/1.1261737
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Local metallic conductivity of thin polyimide films as a result of “soft” electrical breakdown.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 538, doi. 10.1134/1.1261738
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Method of determining dynamic adiabatic compression curves of powders.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 527, doi. 10.1134/1.1261734
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- Article
Integrated ionizing-radiation detector utilizing a cadmium sulfide-cadmium telluride heterojunction.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 542, doi. 10.1134/1.1261739
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Modification of the Kirchhoff scalar diffraction integral.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 544, doi. 10.1134/1.1261740
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Plasticity of diamond at room temperature and determination of its hardness using an atomic force microscope with an ultrahard C[sub 60] fullerite tip.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 546, doi. 10.1134/1.1261819
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Influence of heat treatment conditions on the phase composition and superconducting properties of Bi[sub 1.6]Pb[sub 0.4]Sr[sub 1.98]K[sub 0.02]Ca[sub 2]Cu[sub 3]F[sub 0.8]O[sub y] ceramic.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 548, doi. 10.1134/1.1261741
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Influence of ionic conductivity on the elastic characteristics of four-component copper and silver chalcogenides.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 550, doi. 10.1134/1.1261873
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Influence of spheroidal deformation on the stability of a drop charged below the Rayleigh limit.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 553, doi. 10.1134/1.1261892
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Anomalously high rate of grain boundary displacement under fast shear loading.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 555
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Characteristics of an electric circulation module for pulse-periodic ArF[sup *], KrF[sup *], and XeF[sup *] molecular lasers.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 557, doi. 10.1134/1.1261743
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White-light interferometry with depolarization of the radiation.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 560, doi. 10.1134/1.1261744
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Onset of spatial instability in parametric four-wave in a medium with a diagonally bipolar response.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 562, doi. 10.1134/1.1261745
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Excitation of a potentially self-oscillating state in an oscillator with delay and inertia exposed to the simultaneous action of regular and chaotic signals.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 564, doi. 10.1134/1.1261746
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Pair production in counterpropagating electron and laser beams.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 566, doi. 10.1134/1.1261747
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Enhancement of the precision of fiber-optic interferometers by using couplers with high spectral power or antisymmetric supermode cutoff.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 568, doi. 10.1134/1.1261748
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Equation of state for a weakly ionized gas-discharge plasma.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 570, doi. 10.1134/1.1261749
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Physical model of the formation of a periodic structure on the surface of pyrolytic graphite under high-energy ion bombardment.
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- Technical Physics Letters, 1997, v. 23, n. 7, p. 573, doi. 10.1134/1.1261750
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