Found: 26
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Crystalline quality improvement in silicon films on sapphire using recrystallization from the silicon-sapphire interface.
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- Semiconductors, 2010, v. 44, n. 10, p. 1386, doi. 10.1134/S1063782610100258
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- Article
Spontaneous emission of holes excited by an electric field in germanium.
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- Semiconductors, 2010, v. 44, n. 10, p. 1289, doi. 10.1134/S1063782610100088
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- Article
Mixing of hole states in GaAs/AlAs(110) heterostructures.
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- Semiconductors, 2010, v. 44, n. 10, p. 1301, doi. 10.1134/S1063782610100118
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Repetition of the shape of the ultrafast self-modulation of the optical absorption spectrum upon varying the energy of pulse of GaAs pumping.
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- Semiconductors, 2010, v. 44, n. 10, p. 1285, doi. 10.1134/S1063782610100076
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Electrical characteristics of multigraphene films grown on high-resistivity silicon carbide substrates.
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- Semiconductors, 2010, v. 44, n. 10, p. 1389, doi. 10.1134/S106378261010026X
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- Article
Dependence of the growth rate of an AlN layer on nitrogen pressure in a reactor for sublimation growth of AlN crystals.
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- Semiconductors, 2010, v. 44, n. 10, p. 1383, doi. 10.1134/S1063782610100246
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Recombination of charge carriers in the GaAs-based p- i- n diode.
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- Semiconductors, 2010, v. 44, n. 10, p. 1362, doi. 10.1134/S1063782610100209
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Temperature dependence of the threshold current density and external differential quantum efficiency of semiconductor lasers (λ = 900-920 nm).
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- Semiconductors, 2010, v. 44, n. 10, p. 1370, doi. 10.1134/S1063782610100222
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Quantum spin Hall effect in nanostructures based on cadmium fluoride.
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- Semiconductors, 2010, v. 44, n. 10, p. 1328, doi. 10.1134/S1063782610100155
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The structure and optical properties of nanocrytalline lead sulfide films.
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- Semiconductors, 2010, v. 44, n. 10, p. 1349, doi. 10.1134/S1063782610100180
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Quantum wells on 3 C-SiC/ NH-SiC heterojunctions. Calculation of spontaneous polarization and electric field strength in experiments.
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- Semiconductors, 2010, v. 44, n. 10, p. 1313, doi. 10.1134/S1063782610100131
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- Article
Analysis of mechanisms of carrier emission in the p-i-n structures with In(Ga)As quantum dots.
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- Semiconductors, 2010, v. 44, n. 10, p. 1308, doi. 10.1134/S106378261010012X
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The temperature dependence of internal optical losses in semiconductor lasers (λ = 900-920 nm).
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- Semiconductors, 2010, v. 44, n. 10, p. 1365, doi. 10.1134/S1063782610100210
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- Article
Numerical simulation of evolution of electron-hole avalanches and streamers in silicon in a uniform electric field.
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- Semiconductors, 2010, v. 44, n. 10, p. 1266, doi. 10.1134/S1063782610100040
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- Article
The effect of the dynamic adsorption mode on impedance of composite structures with porous silicon.
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- Semiconductors, 2010, v. 44, n. 10, p. 1342, doi. 10.1134/S1063782610100179
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Open-circuit voltage, fill factor, and efficiency of a CdS/CdTe solar cell.
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- Semiconductors, 2010, v. 44, n. 10, p. 1375, doi. 10.1134/S1063782610100234
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- Article
A single-spatial-mode semiconductor laser based on InAs/InGaAs quantum dots with a diffraction filter of optical modes.
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- Semiconductors, 2010, v. 44, n. 10, p. 1357, doi. 10.1134/S1063782610100192
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Formation of composite InGaN/GaN/InAlN quantum dots.
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- Semiconductors, 2010, v. 44, n. 10, p. 1338, doi. 10.1134/S1063782610100167
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- Article
Heat-transfer phenomena in alloys.
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- Semiconductors, 2010, v. 44, n. 10, p. 1275, doi. 10.1134/S1063782610100052
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Simulation of relaxation times and energy spectra of the CdTe/HgCdTe/CdTe quantum well for variable valence band offset, well width, and composition x.
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- Semiconductors, 2010, v. 44, n. 10, p. 1321, doi. 10.1134/S1063782610100143
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On the nature of charge carrier scattering in AgSe at low temperatures.
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- Semiconductors, 2010, v. 44, n. 10, p. 1280, doi. 10.1134/S1063782610100064
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Oxygen in Ge:Sn.
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- Semiconductors, 2010, v. 44, n. 10, p. 1253, doi. 10.1134/S1063782610100015
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Specific features of intervalley scattering of charge carriers in n-Si at high temperatures.
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- Semiconductors, 2010, v. 44, n. 10, p. 1263, doi. 10.1134/S1063782610100039
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Quantum model of electron accumulation at charged boundaries of heavily doped semiconductor films.
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- Semiconductors, 2010, v. 44, n. 10, p. 1297, doi. 10.1134/S1063782610100106
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Differential capacitance of a semiconductor film.
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- Semiconductors, 2010, v. 44, n. 10, p. 1292, doi. 10.1134/S106378261010009X
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Mesoscopic variance of dislocation displacements in semiconductor crystals.
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- Semiconductors, 2010, v. 44, n. 10, p. 1258, doi. 10.1134/S1063782610100027
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- Article