Testing Semiconductor Products Using Low-Frequency Noise Parameters.
- Published in:
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 1, p. 10, doi. 10.1134/S1061830922010028
- By:
- Publication type:
- Article
Works matching IS 10618309 AND DT 2022 AND VI 58 AND IP 1
Results: 6
1
2
Evaluating the Efficiency of Using Ultraviolet Radiation Sources in Carrying Out Fluorescent penetrant Testing.
- Published in:
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 1, p. 57, doi. 10.1134/S1061830922010041
- By:
- Publication type:
- Article
3
Algorithm for Evaluating Errors in Recognition of Materials in X-Ray Testing System Containing X-Ray Sandwich Detectors.
- Published in:
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 1, p. 46, doi. 10.1134/S1061830922010065
- By:
- Publication type:
- Article
4
Comparison of Damage Distribution and Ultrasonic Nonlinear Responses of Two Typical Plate Structures.
- Published in:
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 1, p. 36, doi. 10.1134/S1061830922010077
- By:
- Publication type:
- Article
5
On the Issue of Interpretating Echograms in the Contact Technique.
- Published in:
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 1, p. 23, doi. 10.1134/S1061830922010053
- By:
- Publication type:
- Article
6
Measuring the Acoustic Characteristics of Compact Concrete Building Structures Using the Impact Echo Method.
- Published in:
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 1, p. 1, doi. 10.1134/S106183092201003X
- By:
- Publication type:
- Article