Works matching IS 10618309 AND DT 2006 AND VI 42 AND IP 1
1
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 1, doi. 10.1134/S1061830906010013
- Article
2
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 12, doi. 10.1134/S1061830906010025
- Ivanov, V.;
- Bashkinova, V.
- Article
3
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 19, doi. 10.1134/S1061830906010037
- Lukhvich, A.;
- Polonevich, A.;
- Churilo, V.
- Article
4
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 28, doi. 10.1134/S1061830906010049
- Yakovlev, V.;
- Shcherbinin, V.;
- Molchanov, O.;
- Slykhanov, V.
- Article
5
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 47, doi. 10.1134/S1061830906010062
- Konovalov, S.;
- Kuz’menko, A.
- Article
6
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 51, doi. 10.1134/S1061830906010074
- Article
7
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 60, doi. 10.1134/S1061830906010086
- Barykin, N.;
- Sadykov, F.;
- Lopatin, N.;
- Fazlyakhmetov, R.
- Article
8
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 42, doi. 10.1134/S1061830906010050
- Article
10
- Russian Journal of Nondestructive Testing, 2006, v. 42, n. 1, p. 63, doi. 10.1134/S1061830906010098
- Liu, Qingkun;
- Que, Peiwen;
- Guo, Huawei;
- Song, Shoupeng
- Article