Works matching IS 10400397 AND DT 2000 AND VI 12 AND IP 16
1
- Electroanalysis, 2000, v. 12, n. 16, p. 1282, doi. 10.1002/1521-4109(200011)12:16<1282::AID-ELAN1282>3.0.CO;2-D
- Katsu, Takashi;
- Ido, Kazuyuki;
- Moriya, Aki;
- Nakae, Yoshinori;
- Sakata, Isao
- Article
2
- Electroanalysis, 2000, v. 12, n. 16, p. 1327, doi. 10.1002/1521-4109(200011)12:16<1327::AID-ELAN1327>3.0.CO;2-Q
- Suzuki, Hiroaki;
- Arakawa, Hiroaki;
- Karube, Isao
- Article
3
- Electroanalysis, 2000, v. 12, n. 16, p. 1293, doi. 10.1002/1521-4109(200011)12:16<1293::AID-ELAN1293>3.0.CO;2-5
- Laschi, Serena;
- Fránek, Milan;
- Mascini, Marco
- Article
4
- Electroanalysis, 2000, v. 12, n. 16, p. 1286, doi. 10.1002/1521-4109(200011)12:16<1286::AID-ELAN1286>3.0.CO;2-Q
- Fibbioli, Monia;
- Morf, Werner E.;
- Badertscher, Martin;
- de Rooij, Nicolaas F.;
- Pretsch, Ernö
- Article
5
- Electroanalysis, 2000, v. 12, n. 16, p. 1322, doi. 10.1002/1521-4109(200011)12:16<1322::AID-ELAN1322>3.0.CO;2-J
- Kugimiya, Akimitsu;
- Yoneyama, Hidenobu;
- Takeuchi, Toshifumi
- Article
6
- Electroanalysis, 2000, v. 12, n. 16, p. 1304, doi. 10.1002/1521-4109(200011)12:16<1304::AID-ELAN1304>3.0.CO;2-B
- Marzouk, Sayed A. M.;
- Sayour, Hossam E. M.;
- Ragab, Ahmed M.;
- Cascio, Wayne E.;
- Hassan, Saad S. M.
- Article
7
- Electroanalysis, 2000, v. 12, n. 16, p. 1263, doi. 10.1002/1521-4109(200011)12:16<1263::AID-ELAN1263>3.0.CO;2-B
- Henn, Dagmar;
- Cammann, Karl
- Article
8
- Electroanalysis, 2000, v. 12, n. 16, p. 1249, doi. 10.1002/1521-4109(200011)12:16<1249::AID-ELAN1249>3.0.CO;2-G
- Article
9
- Electroanalysis, 2000, v. 12, n. 16, p. 1251, doi. 10.1002/1521-4109(200011)12:16<1251::AID-ELAN1251>3.0.CO;2-P
- Jadhav, Smita;
- Meir, Amnon J.;
- Bakker, Eric
- Article
10
- Electroanalysis, 2000, v. 12, n. 16, p. 1318, doi. 10.1002/1521-4109(200011)12:16<1318::AID-ELAN1318>3.0.CO;2-M
- Benkert, Alexander;
- Scheller, Frieder W.;
- Schoessler, Werner;
- Micheel, Burkhard;
- Warsinke, Axel
- Article
11
- Electroanalysis, 2000, v. 12, n. 16, p. 1277, doi. 10.1002/1521-4109(200011)12:16<1277::AID-ELAN1277>3.0.CO;2-M
- Wang, Joseph;
- Zhang, Xueji;
- Chen, Liang
- Article
12
- Electroanalysis, 2000, v. 12, n. 16, p. 1299, doi. 10.1002/1521-4109(200011)12:16<1299::AID-ELAN1299>3.0.CO;2-6
- Kuramitz, Hideki;
- Sugawara, Kazuharu;
- Tanaka, Shunitz
- Article
13
- Electroanalysis, 2000, v. 12, n. 16, p. 1272, doi. 10.1002/1521-4109(200011)12:16<1272::AID-ELAN1272>3.0.CO;2-F
- Aoki, Hiroshi;
- Bühlmann, Philippe;
- Umezawa, Yoshio
- Article
14
- Electroanalysis, 2000, v. 12, n. 16, p. 1339, doi. 10.1002/1521-4109(200011)12:16<1339::AID-ELAN1339>3.0.CO;2-C
- Article
15
- Electroanalysis, 2000, v. 12, n. 16, p. 1258, doi. 10.1002/1521-4109(200011)12:16<1258::AID-ELAN1258>3.0.CO;2-K
- Kim, J. S.;
- Pike, J. D.;
- Coucouvanis, D.;
- Meyerhoff, M. E.
- Article
16
- Electroanalysis, 2000, v. 12, n. 16, p. 1312, doi. 10.1002/1521-4109(200011)12:16<1312::AID-ELAN1312>3.0.CO;2-L
- Hassan, Saad S. M.;
- Marei, Sayed A.;
- Badr, I. H.;
- Arida, H. A.
- Article
17
- Electroanalysis, 2000, v. 12, n. 16, p. 1334, doi. 10.1002/1521-4109(200011)12:16<1334::AID-ELAN1334>3.0.CO;2-5
- Lee, Kyong-Hoon;
- Kim, Yoon-Chang;
- Suzuki, Hiroaki;
- Ikebukuro, Kazunori;
- Hashimoto, Kazuto;
- Karube, Isao
- Article