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Features of the formation of X-ray images in birefringent crystals.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 601, doi. 10.1134/S1027451012070154
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Layer-by-layer analysis of structures containing δ-layers by secondary ion mass spectrometry taking into account the TOF.SIMS-5 depth resolution function.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 574, doi. 10.1134/S1027451012070063
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Low-energy ion scattering by monatomic films.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 647, doi. 10.1134/S1027451012080095
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Structure of heterogeneous states and magnetic properties of CoPd nanocrystalline films.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 587, doi. 10.1134/S102745101207004X
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Reflective mask for projection lithography operating at a wavelength of 13.5 nm.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 568, doi. 10.1134/S1027451012070075
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Cold emission of negative ions from porous graphite.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 673, doi. 10.1134/S1027451012080150
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High-frequency ion sources of inert and chemically active gases.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 693, doi. 10.1134/S1027451012080034
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Multilayer structures for the water-window spectral range on the basis of scandium.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 598, doi. 10.1134/S1027451012070038
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Influence of the promotion of terms on the emission of auger electrons upon collisions of multicharged ions with a metal surface.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 678, doi. 10.1134/S1027451012080204
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Recharging dynamics of Al Nanoclusters in a GaAs matrix.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 564, doi. 10.1134/S1027451012070142
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Ion-photon emission of metal-containing organic dyes.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 664, doi. 10.1134/S1027451012080058
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Secondary ion emission under the bombardment of Si by multiply charged Si ions.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 660, doi. 10.1134/S1027451012080149
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Structure and phase transformations caused by oxygen ion implantation into titanium.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 578, doi. 10.1134/S1027451012070051
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Estimation of detection limits in electron probe X-ray microanalysis.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 616, doi. 10.1134/S1027451012070105
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Study of ion-induced crimping of carbon composite fibers.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 631, doi. 10.1134/S1027451012080071
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Crystal electric field effects in PrSrCoO.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 553, doi. 10.1134/S1027451012070087
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Investigations of the inductively coupled argon plasma sputtering of PbSnTe ternary solid solution.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 643, doi. 10.1134/S102745101208006X
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Comparative studies of the features of the formation of impurity heterogeneity in GaSb:Te crystals in the case of directed crystallization under space and ground conditions.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 604, doi. 10.1134/S1027451012070117
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Bi-SQUID arrays and parallel SQIF structures for active electrically small antennas.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 591, doi. 10.1134/S1027451012070129
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Influence of ion irradiation on the morphology, structure, and optical properties of gold nanoparticles synthesized in SiO and AlO dielectric matrices.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 681, doi. 10.1134/S1027451012080162
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Study of coatings based on titanium oxides and oxynitrides using a set of methods.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 688, doi. 10.1134/S1027451012080113
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Simulation of silicon surface-pattern formation under irradiation with 1-keV Ar ions.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 635, doi. 10.1134/S1027451012080101
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Mechanism for the formation of molecular clusters under ion sputtering.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 654, doi. 10.1134/S1027451012080083
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Interference amplification of the magneto-optic Kerr effect in multilayer structures in the X-ray range.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 559, doi. 10.1134/S1027451012070130
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Low-temperature photoluminescence of ion-implanted SiO:Sn films and glasses.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 668, doi. 10.1134/S1027451012080198
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Physical properties of silver-coated silica clusters: A computer experiment.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 623, doi. 10.1134/S1027451011120056
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Ion diagnostics of deformed regions in solids.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 699, doi. 10.1134/S1027451012080186
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Determining the structural parameters of a low-barrier diode with near-surface δ-doping from data on the temperature dependences of the current-voltage characteristics.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2012, v. 6, n. 4, p. 612, doi. 10.1134/S1027451012070099
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