Works in Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, Vol 3, Issue 5

Results: 29

Wave packet splitting and zitterbewegung in two-dimensional semiconductor structures with spin-orbit coupling.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 678, doi. 10.1134/S1027451009050048

By:

Demikhovskii, V.;
Maksimova, G.;
Frolova, E.

Publication type:

Article

Comparative analysis of morphology and optical properties of GaN layers on sapphire.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 718, doi. 10.1134/S1027451009050097

By:

Vopilkin, E.;
Shashkin, V.;
Khrykin, O.;
Drozdov, Yu.;
Gusev, S.;
Vostokov, N.;
Luk’yanov, A.

Publication type:

Article

Spatial structures formed during high-temperature vacuum annealing of diamond-like film deposited on a silicon substrate.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 752, doi. 10.1134/S1027451009050152

By:

Tsetlin, M.;
Zakharov, A.;
Maslakov, K.;
Mikheeva, M.;
Lindau, I.

Publication type:

Article

Dislocation generation in heat-treated nitrogen-doped silicon wafers when applying external loads.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 747, doi. 10.1134/S1027451009050140

By:

Mezhennyi, M.;
Mil’vidskii, M.;
Reznik, V.

Publication type:

Article

Determination of the coefficient of electron transmission using temperature measurements.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 826, doi. 10.1134/S1027451009050279

By:

Antonov, A.;
Egorov, N.;
Chao, L.

Publication type:

Article

Fabrication of PDLC films based on acrylic monomers and study of the electric field effect on the alignment structure of liquid crystal droplets in PDLC films.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 686, doi. 10.1134/S102745100905005X

By:

Siprova, S.;
Mashin, A.;
Chidichimo, G.;
Filpo, G.;
Korobkov, A.;
Nezhdanov, A.

Publication type:

Article

The influence of a probe on topographical images in atomic force microscopy.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 730, doi. 10.1134/S1027451009050127

By:

Tsirkunova, N.;
Borisenko, V.;
Kukharenko, L.;
Gol’tsev, M.;
Chizhik, S.

Publication type:

Article

Multiple small-angle neutron scattering in media with a high concentration of inhomogeneities.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 665, doi. 10.1134/S1027451009050024

By:

Dzheparov, F.;
Zabelin, K.;
Lvov, D.

Publication type:

Article

Determination of limiting parameters of multiple-beam electron-optical systems for diagnostics of semiconductor structures.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 781, doi. 10.1134/S1027451009050206

By:

Kaz’miruk, V.;
Savitskaya, T.

Publication type:

Article

Formation of an encapsulated Fe2O3 nanostructure during mechanochemical interaction of iron oxide and excess alumina.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 786, doi. 10.1134/S1027451009050218

By:

Potapkin, V.;
Zabolotskii, A.;
Novakova, A.

Publication type:

Article

Dynamics of bulk destruction of transparent dielectric polymeric materials under a pulsed high-energy electron beam.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 673, doi. 10.1134/S1027451009050036

By:

Demidov, B.;
Efremov, V.;
Petrov, V.;
Mescheryakov, A.

Publication type:

Article

Computer simulation of the theoretical contrast of various types of structure defects with noise factors.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 797, doi. 10.1134/S1027451009050231

By:

Tkal’, V.;
Dzyuba, I.;
Danil’chuk, L.

Publication type:

Article

A study of the microstructure of La1 − x Ca x MnO3 ( x = 0.5, 0.8) solid solutions.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 756, doi. 10.1134/S1027451009050164

By:

Gerasimov, E.;
Zaikovskii, V.;
Tsybulya, S.;
Isupova, L.

Publication type:

Article

AFM study of the microwave effect on hydrogen-containing ferroelectric triglycine sulfate.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 769, doi. 10.1134/S1027451009050188

By:

Ovchinnikova, G.;
Soloshenko, A.;
Belugina, N.;
Gainutdinov, R.;
Tolstikhina, A.

Publication type:

Article

Combined STM/AFM visualization of the local density of states in the InAs/GaAs quantum dots.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 721, doi. 10.1134/S1027451009050103

By:

Borodin, P.;
Bukharaev, A.;
Filatov, D.;
Vorontsov, D.;
Lapshina, M.

Publication type:

Article

On applicability of confluence analysis in cathodoluminescence microscopy for interval estimation of diffusion lengths of minority carriers and depths of subsurface regions with depletion of majority carriers.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 820, doi. 10.1134/S1027451009050267

By:

Mikheev, N.;
Polyakov, A.;
Stepovich, M.

Publication type:

Article

Surface reconstruction of a field electron emitter.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 833, doi. 10.1134/S1027451009050280

By:

Nikiforov, K.;
Egorov, N.;
Shen, Che-Chou

Publication type:

Article

Atomic force microscopy of cobalt nanoparticles with electro-catalytic properties.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 725, doi. 10.1134/S1027451009050115

By:

Ziganshina, S.;
Bukharaev, A.;
Shamsetdinova, L.;
Chuklanov, A.;
Bizyaev, D.

Publication type:

Article

Synthesis of nanostructured SiC films during pulsed photon treatment of Si in a carbon-containing atmosphere.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 791, doi. 10.1134/S102745100905022X

By:

Ievlev, V.;
Ilyin, V.;
Kushev, S.;
Soldatenko, S.;
Lukin, A.;
Belonogov, E.

Publication type:

Article

On the possibilities of implementing a stochastic model for the distribution of nonequilibrium minority charge carriers in a semiconductor material.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 809, doi. 10.1134/S1027451009050255

By:

Seregina, E.;
Makarenkov, A.;
Stepovich, M.

Publication type:

Article

Analysis of structural features of tin dioxide-based fractal nanocomposites by atomic-force microscopy and x-ray diffraction.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 761, doi. 10.1134/S1027451009050176

By:

Grachova, I.;
Maksimov, A.;
Moshnikov, V.

Publication type:

Article

Formation, electronic structure, and stability of film nanophases of transition metals on silicon.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 734, doi. 10.1134/S1027451009050139

By:

Plyusnin, N.;
Il’yashchenko, V.;
Kitan’, S.;
Krylov, S.

Publication type:

Article

X-ray computer tomography of natural fibrous diamonds and ballas.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 659, doi. 10.1134/S1027451009050012

By:

Zolotov, D.;
Buzmakov, A.;
Shiryaev, A.;
Asadchikov, V.

Publication type:

Article

Optimization of a data storage system based on the array of ferromagnetic particles and magnetic force microscope.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 840, doi. 10.1134/S1027451009050292

By:

Mironov, V.;
Ermolaeva, O.

Publication type:

Article

Atomic force microscopy in studying regeneration of tissues in sclera plasty in ophthalmology.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 804, doi. 10.1134/S1027451009050243

By:

Zharov, V.;
Lyalin, A.;
Karban’, O.;
Perevozchikov, P.;
Samartseva, N.;
Konygin, G.;
Leesment, S.

Publication type:

Article

Scanning-probe-induced local decomposition of solid germanium monoxide films: The nano-pattering of germanium.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 773, doi. 10.1134/S102745100905019X

By:

Astankova, K.;
Sheglov, D.;
Gorokhov, E.;
Volodin, V.;
Cherkov, A.;
Latyshev, A.;
Vergnat, M.

Publication type:

Article

Photoelectric properties of the GeSi/Si heterostructures with self-assembled nanoclusters grown by sublimation molecular beam epitaxy in a GeH4 medium.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 709, doi. 10.1134/S1027451009050085

By:

Filatov, D.;
Kruglova, M.;
Isakov, M.;
Gorshkov, A.;
Shengurov, V.;
Chalkov, V.;
Denisov, S.

Publication type:

Article

Luminescence and structure of nanosized inclusions formed in SiO2 layers under double implantation of silicon and carbon ions.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 702, doi. 10.1134/S1027451009050073

By:

Tetelbaum, D.;
Mikhaylov, A.;
Belov, A.;
Vasiliev, V.;
Kovalev, A.;
Wainshtein, D.;
Golan, Y.;
Osherov, A.

Publication type:

Article

Development of copper meshes for frequency and spatial selection of the terahertz radiation of the Novosibirsk free electron laser.

Published in:

Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 691, doi. 10.1134/S1027451009050061

By:

Kuznetsov, S.;
Gol’denberg, B.;
Kalinin, P.;
Eliseev, V.;
Petrova, E.

Publication type:

Article

Works in Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, Vol 3, Issue 5

Wave packet splitting and zitterbewegung in two-dimensional semiconductor structures with spin-orbit coupling.

Comparative analysis of morphology and optical properties of GaN layers on sapphire.

Spatial structures formed during high-temperature vacuum annealing of diamond-like film deposited on a silicon substrate.

Dislocation generation in heat-treated nitrogen-doped silicon wafers when applying external loads.

Determination of the coefficient of electron transmission using temperature measurements.

Fabrication of PDLC films based on acrylic monomers and study of the electric field effect on the alignment structure of liquid crystal droplets in PDLC films.

The influence of a probe on topographical images in atomic force microscopy.

Multiple small-angle neutron scattering in media with a high concentration of inhomogeneities.

Determination of limiting parameters of multiple-beam electron-optical systems for diagnostics of semiconductor structures.

Formation of an encapsulated Fe<sub>2</sub>O<sub>3</sub> nanostructure during mechanochemical interaction of iron oxide and excess alumina.

Dynamics of bulk destruction of transparent dielectric polymeric materials under a pulsed high-energy electron beam.

Computer simulation of the theoretical contrast of various types of structure defects with noise factors.

A study of the microstructure of La<sub>1 − x </sub>Ca<sub> x </sub>MnO<sub>3</sub> ( x = 0.5, 0.8) solid solutions.

AFM study of the microwave effect on hydrogen-containing ferroelectric triglycine sulfate.

Combined STM/AFM visualization of the local density of states in the InAs/GaAs quantum dots.

On applicability of confluence analysis in cathodoluminescence microscopy for interval estimation of diffusion lengths of minority carriers and depths of subsurface regions with depletion of majority carriers.

Surface reconstruction of a field electron emitter.

Atomic force microscopy of cobalt nanoparticles with electro-catalytic properties.

Synthesis of nanostructured SiC films during pulsed photon treatment of Si in a carbon-containing atmosphere.

On the possibilities of implementing a stochastic model for the distribution of nonequilibrium minority charge carriers in a semiconductor material.

Analysis of structural features of tin dioxide-based fractal nanocomposites by atomic-force microscopy and x-ray diffraction.

Formation, electronic structure, and stability of film nanophases of transition metals on silicon.

X-ray computer tomography of natural fibrous diamonds and ballas.

Optimization of a data storage system based on the array of ferromagnetic particles and magnetic force microscope.

Atomic force microscopy in studying regeneration of tissues in sclera plasty in ophthalmology.

Scanning-probe-induced local decomposition of solid germanium monoxide films: The nano-pattering of germanium.

Photoelectric properties of the GeSi/Si heterostructures with self-assembled nanoclusters grown by sublimation molecular beam epitaxy in a GeH<sub>4</sub> medium.

Luminescence and structure of nanosized inclusions formed in SiO<sub>2</sub> layers under double implantation of silicon and carbon ions.

Development of copper meshes for frequency and spatial selection of the terahertz radiation of the Novosibirsk free electron laser.