Works in Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, Vol 3, Issue 5
Results: 29
Comparative analysis of morphology and optical properties of GaN layers on sapphire.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 718, doi. 10.1134/S1027451009050097
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Wave packet splitting and zitterbewegung in two-dimensional semiconductor structures with spin-orbit coupling.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 678, doi. 10.1134/S1027451009050048
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Spatial structures formed during high-temperature vacuum annealing of diamond-like film deposited on a silicon substrate.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 752, doi. 10.1134/S1027451009050152
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Dislocation generation in heat-treated nitrogen-doped silicon wafers when applying external loads.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 747, doi. 10.1134/S1027451009050140
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Determination of limiting parameters of multiple-beam electron-optical systems for diagnostics of semiconductor structures.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 781, doi. 10.1134/S1027451009050206
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Formation of an encapsulated Fe<sub>2</sub>O<sub>3</sub> nanostructure during mechanochemical interaction of iron oxide and excess alumina.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 786, doi. 10.1134/S1027451009050218
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Computer simulation of the theoretical contrast of various types of structure defects with noise factors.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 797, doi. 10.1134/S1027451009050231
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Dynamics of bulk destruction of transparent dielectric polymeric materials under a pulsed high-energy electron beam.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 673, doi. 10.1134/S1027451009050036
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AFM study of the microwave effect on hydrogen-containing ferroelectric triglycine sulfate.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 769, doi. 10.1134/S1027451009050188
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A study of the microstructure of La<sub>1 − x </sub>Ca<sub> x </sub>MnO<sub>3</sub> ( x = 0.5, 0.8) solid solutions.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 756, doi. 10.1134/S1027451009050164
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Determination of the coefficient of electron transmission using temperature measurements.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 826, doi. 10.1134/S1027451009050279
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Fabrication of PDLC films based on acrylic monomers and study of the electric field effect on the alignment structure of liquid crystal droplets in PDLC films.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 686, doi. 10.1134/S102745100905005X
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The influence of a probe on topographical images in atomic force microscopy.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 730, doi. 10.1134/S1027451009050127
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Multiple small-angle neutron scattering in media with a high concentration of inhomogeneities.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 665, doi. 10.1134/S1027451009050024
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Combined STM/AFM visualization of the local density of states in the InAs/GaAs quantum dots.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 721, doi. 10.1134/S1027451009050103
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On applicability of confluence analysis in cathodoluminescence microscopy for interval estimation of diffusion lengths of minority carriers and depths of subsurface regions with depletion of majority carriers.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 820, doi. 10.1134/S1027451009050267
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Analysis of structural features of tin dioxide-based fractal nanocomposites by atomic-force microscopy and x-ray diffraction.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 761, doi. 10.1134/S1027451009050176
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X-ray computer tomography of natural fibrous diamonds and ballas.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 659, doi. 10.1134/S1027451009050012
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Optimization of a data storage system based on the array of ferromagnetic particles and magnetic force microscope.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 840, doi. 10.1134/S1027451009050292
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Atomic force microscopy in studying regeneration of tissues in sclera plasty in ophthalmology.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 804, doi. 10.1134/S1027451009050243
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Scanning-probe-induced local decomposition of solid germanium monoxide films: The nano-pattering of germanium.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 773, doi. 10.1134/S102745100905019X
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Surface reconstruction of a field electron emitter.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 833, doi. 10.1134/S1027451009050280
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Atomic force microscopy of cobalt nanoparticles with electro-catalytic properties.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 725, doi. 10.1134/S1027451009050115
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Synthesis of nanostructured SiC films during pulsed photon treatment of Si in a carbon-containing atmosphere.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 791, doi. 10.1134/S102745100905022X
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Formation, electronic structure, and stability of film nanophases of transition metals on silicon.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 734, doi. 10.1134/S1027451009050139
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On the possibilities of implementing a stochastic model for the distribution of nonequilibrium minority charge carriers in a semiconductor material.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 809, doi. 10.1134/S1027451009050255
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Photoelectric properties of the GeSi/Si heterostructures with self-assembled nanoclusters grown by sublimation molecular beam epitaxy in a GeH<sub>4</sub> medium.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 709, doi. 10.1134/S1027451009050085
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Luminescence and structure of nanosized inclusions formed in SiO<sub>2</sub> layers under double implantation of silicon and carbon ions.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 702, doi. 10.1134/S1027451009050073
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Development of copper meshes for frequency and spatial selection of the terahertz radiation of the Novosibirsk free electron laser.
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- Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques, 2009, v. 3, n. 5, p. 691, doi. 10.1134/S1027451009050061
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