Works matching IS 09574522 AND DT 2025 AND VI 36 AND IP 17


Results: 54
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    X-ray diffraction pattern of CuFe<sub>2</sub>O<sub>4</sub>.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2025, v. 36, n. 17, p. 1, doi. 10.1007/s10854-025-15093-3
    By:
    • Rani, B. Jansi;
    • Saravanakumar, B.;
    • Ravi, G.;
    • Ganesh, V.;
    • Ravichandran, S.;
    • Yuvakkumar, R.
    Publication type:
    Article
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    Growth of molecular films on a cooled substrate.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2025, v. 36, n. 17, p. 1, doi. 10.1007/s10854-025-15073-7
    By:
    • Koptyaev, A. I.;
    • Travkin, V. V.;
    • Yunin, P. A.;
    • Gordeev, K. M.;
    • Pakhomov, G. L.
    Publication type:
    Article
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