Works matching IS 09574522 AND DT 2018 AND VI 29 AND IP 4
1
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3502, doi. 10.1007/s10854-017-8285-4
- Gurusiddesh, M.;
- Madhu, B. J.;
- Shankaramurthy, G. J.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3492, doi. 10.1007/s10854-017-8283-6
- Ma, Xiaoxuan;
- Liu, Shikun;
- Zhang, Kun;
- Liu, Xusong;
- Hao, Jian;
- Chi, Caixia;
- Zhao, Jiupeng;
- Liu, Xiaoxu;
- Li, Yao
- Article
3
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3482, doi. 10.1007/s10854-017-8282-7
- Zhang, LinRui;
- Li, Tong;
- Chen, YiChuan;
- Pang, Wei;
- Qu, MingHao;
- Song, XueMei;
- Zhang, YongZhe;
- Yan, Hui
- Article
4
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3467, doi. 10.1007/s10854-017-8281-8
- Humbe, Ashok V.;
- Kharat, Prashant B.;
- Nawle, Anant C.;
- Jadhav, K. M.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3458, doi. 10.1007/s10854-017-8280-9
- Riahi, R.;
- Derbali, L.;
- Amri, C.;
- Hassen, M.;
- Ezzaouia, H.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3449, doi. 10.1007/s10854-017-8279-2
- Joshi, Himani;
- Gowreesan, Subramani;
- Kumar, A. Ruban
- Article
7
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3437, doi. 10.1007/s10854-017-8278-3
- Areerob, Yonrapach;
- Cho, Kwang-Youn;
- Oh, Won-Chun
- Article
8
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3423, doi. 10.1007/s10854-017-8277-4
- Koukharenko, E.;
- Boden, S. A.;
- Sessions, N. P.;
- Frety, N.;
- Nandhakumar, I.;
- White, N. M.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3411, doi. 10.1007/s10854-017-8276-5
- Souri, Dariush;
- Sarfehjou, Marziyeh;
- Khezripour, Ali Reza
- Article
10
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3401, doi. 10.1007/s10854-017-8275-6
- Zhang, Kaichuang;
- Gao, Xinbao;
- Zhang, Qian;
- Chen, Xuefang
- Article
11
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3391, doi. 10.1007/s10854-017-8274-7
- Rashad, M. M.;
- Khalifa, A.;
- Rayan, D. A.;
- Fayed, M. G.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3381, doi. 10.1007/s10854-017-8273-8
- Wang, Lei;
- Bai, Xiaoyu;
- Wang, Min
- Article
13
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3370, doi. 10.1007/s10854-017-8272-9
- Patro, Bharati;
- Vijaylakshmi, S.;
- Sharma, Pratibha
- Article
14
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3358, doi. 10.1007/s10854-017-8271-x
- Mehraj, Owais;
- Sofi, Feroz Ahmad;
- Moosvi, Syed Kazim;
- Naqash, Waseem;
- Majid, Kowsar
- Article
15
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3348, doi. 10.1007/s10854-017-8270-y
- Zhang, Bin;
- Wang, Jun;
- Tan, Haoyuan;
- Su, Xiaogang;
- Huo, Siqi;
- Yang, Shuang;
- Chen, Wei;
- Wang, Junpeng
- Article
16
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3340, doi. 10.1007/s10854-017-8269-4
- Kang, Weiwei;
- Lin, Baoping;
- Huang, Guangxu;
- Zhang, Chuanxiang;
- Hou, Wentao;
- Yao, Youheng;
- Xu, Bing;
- Xing, Baolin
- Article
17
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3326, doi. 10.1007/s10854-017-8268-5
- Saranya, P. E.;
- Selladurai, S.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3317, doi. 10.1007/s10854-017-8267-6
- Liu, Guoqing;
- Zhou, Yong;
- Zou, Cheng;
- Zhu, Xiangyi;
- Guo, Yongcai
- Article
19
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3304, doi. 10.1007/s10854-017-8266-7
- Morozov, Iurii G.;
- Sathasivam, Sanjayan;
- Belousova, Olga V.;
- Shishkovsky, Igor V.;
- Kuznetcov, Maxim V.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3296, doi. 10.1007/s10854-017-8265-8
- Kolesov, Egor A.;
- Tivanov, Mikhail S.;
- Korolik, Olga V.;
- Yu Apel, Pavel;
- A. Skuratov, Vladimir;
- Saad, Anis;
- V. Komissarov, Ivan
- Article
21
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3286, doi. 10.1007/s10854-017-8264-9
- Li, Quan-Fang;
- Du, Xueyan;
- Chen, Suli;
- Zhang, Sidi
- Article
22
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3281, doi. 10.1007/s10854-017-8263-x
- Gui, Chengmei;
- Yao, Chenguang;
- Yang, Guisheng
- Article
23
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3270, doi. 10.1007/s10854-017-8262-y
- Nabavi, Seyed Mohammad Javad;
- Hosseinzadeh, Behzad;
- Tajbakhsh, Mahmood;
- Alinezhad, Heshmatollah
- Article
24
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3259, doi. 10.1007/s10854-017-8261-z
- Article
25
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3250, doi. 10.1007/s10854-017-8260-0
- Kaur, Gurmeet;
- Bahel, Shalini;
- Narang, Sukhleen Bindra
- Article
26
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3239, doi. 10.1007/s10854-017-8259-6
- Zalaoglu, Yusuf;
- Terzioglu, Cabir;
- Turgay, Tahsin;
- Yildirim, Gurcan
- Article
27
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3231, doi. 10.1007/s10854-017-8258-7
- Dongale, T. D.;
- Bagade, A. A.;
- Mohite, S. V.;
- Rananavare, A. D.;
- Orlowski, M. K.;
- Kamat, R. K.;
- Rajpure, K. Y.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3219, doi. 10.1007/s10854-017-8257-8
- Perveen, Sadia;
- Farrukh, Muhammad Akhyar
- Article
29
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3210, doi. 10.1007/s10854-017-8256-9
- Bose, Sukanta;
- Rayarfrancis, Arokiyadoss;
- Bhargav, P. Balaji;
- Ahmad, Gufran;
- Mukhopadhyay, Sumita;
- Mandal, Sourav;
- Barua, A. K.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3201, doi. 10.1007/s10854-017-8255-x
- Daneshmand, N.;
- Shokrollahi, H.;
- Lavasani, S. A. N. H.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3194, doi. 10.1007/s10854-017-8254-y
- Article
32
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3189, doi. 10.1007/s10854-017-8253-z
- Bai, Yanhong;
- Bai, Chunyan;
- Mo, Guoli;
- Guo, Yajuan;
- Jia, Mengmeng;
- Huo, Xinwei
- Article
33
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3182, doi. 10.1007/s10854-017-8252-0
- Bashir, M. Nasir;
- Haseeb, A. S. M. A.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3178, doi. 10.1007/s10854-017-8251-1
- Han, Xingrong;
- Liao, Fan;
- Zhang, Yanfei;
- Xu, Chunju;
- Chen, Huiyu
- Article
35
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3170, doi. 10.1007/s10854-017-8250-2
- Arasi, S. Ezhil;
- Raj, M. Victor Antony;
- Madhavan, J.
- Article
36
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3160, doi. 10.1007/s10854-017-8249-8
- Ghaleb, Z. A.;
- Mariatti, M.;
- Ariff, Z. M.;
- Ervina, J.
- Article
37
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3153, doi. 10.1007/s10854-017-8248-9
- Yuan, Meng;
- Zhou, Ning;
- Li, Dongsheng;
- Yang, Deren
- Article
38
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3146, doi. 10.1007/s10854-017-8247-x
- Tu, Tianzhe;
- Jiang, Guojian
- Article
39
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3135, doi. 10.1007/s10854-017-8246-y
- Kannapiran, Nagarajan;
- Muthusamy, Athianna;
- Renganathan, B.;
- Ganesan, A. R.;
- Jayaprakash, Rajan
- Article
40
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3127, doi. 10.1007/s10854-017-8245-z
- Mao, Hua;
- You, Yong;
- Tong, Lifen;
- Tang, Xiaohe;
- Wei, Renbo;
- Liu, Xiaobo
- Article
41
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3120, doi. 10.1007/s10854-017-8244-0
- Zhang, Yuqian;
- Zhang, Jia;
- Li, Xiaowei;
- Jiang, Xiumin;
- Shi, Jin;
- Wen, Yan
- Article
42
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3110, doi. 10.1007/s10854-017-8243-1
- Wang, Lihua;
- Li, Jian;
- Zhou, Hongming;
- Huang, Zuqiong;
- Zhai, Bingkun;
- Liu, Liangqin;
- Hu, Leshan
- Article
43
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3104, doi. 10.1007/s10854-017-8242-2
- Yang, Shuaijun;
- Zhu, Dachuan
- Article
44
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3095, doi. 10.1007/s10854-017-8241-3
- Messaadi, Charfeddine;
- Ghrib, Mondher;
- Chenaina, Habib;
- Manso-Silván, Miguel;
- Ezzaouia, Hatem
- Article
45
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3087, doi. 10.1007/s10854-017-8240-4
- Pazhanivelu, V.;
- Selvadurai, A. Paul Blessington;
- Murugaraj, R.
- Article
46
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3074, doi. 10.1007/s10854-017-8239-x
- Jayachandiran, J.;
- Raja, A.;
- Arivanandhan, M.;
- Jayavel, R.;
- Nedumaran, D.
- Article
47
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3066, doi. 10.1007/s10854-017-8238-y
- Rathinam, A.;
- Balaji, G.;
- Vadivel, S.
- Article
48
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3056, doi. 10.1007/s10854-017-8237-z
- Abdel-wahab, M. Sh.;
- Jilani, Asim;
- Alshahrie, A.;
- Hammad, Ahmed H.
- Article
49
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3050, doi. 10.1007/s10854-017-8236-0
- Article
50
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 4, p. 3045, doi. 10.1007/s10854-017-8235-1
- Qiang, Hua;
- Chen, Yi;
- Jiang, Xianquan;
- Xu, Zunping
- Article