Works matching IS 09574522 AND DT 2018 AND VI 29 AND IP 3
1
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1759, doi. 10.1007/s10854-017-8084-y
- Hussain, Shahid;
- Wan, Piaopiao;
- Aslam, Nimra;
- Qiao, Guanjun;
- Liu, Guiwu;
- Wang, Mingsong
- Article
2
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1766, doi. 10.1007/s10854-017-8085-x
- Etminan, Majid;
- Nabiyouni, Gholamreza;
- Ghanbari, Davood
- Article
3
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1777, doi. 10.1007/s10854-017-8086-9
- Rajasekar, P.;
- Thamizharasan, K.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1785, doi. 10.1007/s10854-017-8087-8
- Chen, Chuantong;
- Suganuma, Katsuaki;
- Iwashige, Tomohito;
- Sugiura, Kazuhiko;
- Tsuruta, Kazuhiro
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1798, doi. 10.1007/s10854-017-8088-7
- Assadi, Zahra;
- Emtiazi, Giti;
- Zarrabi, Ali
- Article
6
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1808, doi. 10.1007/s10854-017-8089-6
- Li, Di;
- Chen, Qingming;
- Li, Zhiyu;
- Zhang, Hui;
- Zhang, Yalin
- Article
7
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1817, doi. 10.1007/s10854-017-8090-0
- Wang, Zixing;
- Yuan, Changlai;
- Zhu, Baohua;
- Feng, Qin;
- Liu, Fei;
- Miao, Lei;
- Zhou, Changrong;
- Chen, Guohua
- Article
8
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1823, doi. 10.1007/s10854-017-8091-z
- Gürbüz, Elif;
- Aydin, Raşit;
- Şahin, Bünyamin
- Article
9
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1832, doi. 10.1007/s10854-017-8092-y
- Zhao, Mingxia;
- Zhao, Zhiju;
- Yu, Lixia;
- Yang, Liqin;
- Jiang, Junbing;
- Li, Xuan;
- Li, Guanghua
- Article
10
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1837, doi. 10.1007/s10854-017-8093-x
- Si, Pengxiang;
- Trinidad, Josh;
- Chen, Li;
- Lee, Brenda;
- Chen, Alex;
- Persic, John;
- Lyn, Robert;
- Leonenko, Zoya;
- Zhao, Boxin
- Article
11
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1847, doi. 10.1007/s10854-017-8094-9
- Weber, Stefan;
- Rath, Thomas;
- Mangalam, Jimmy;
- Kunert, Birgit;
- Coclite, Anna Maria;
- Bauch, Martin;
- Dimopoulos, Theodoros;
- Trimmel, Gregor
- Article
12
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1856, doi. 10.1007/s10854-017-8095-8
- Zhu, L.;
- Xia, G. T.;
- Cao, C. C.;
- Meng, Y.;
- Dai, Y. D.;
- Chen, J. K.;
- Wang, Y. G.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1861, doi. 10.1007/s10854-017-8096-7
- Wang, Dongfan;
- Ling, Huiqin;
- Sun, Menglong;
- Miao, Xiaoying;
- Hu, Anmin;
- Li, Ming;
- Dai, Fengwei;
- Zhang, Wenqi;
- Cao, Liqiang
- Article
14
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1868, doi. 10.1007/s10854-017-8097-6
- Bisauriya, Ramanand;
- Verma, D.;
- Goswami, Y. C.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1877, doi. 10.1007/s10854-017-8098-5
- Bavarsiha, Fatemeh;
- Rajabi, Masoud;
- Montazeri-Pour, Mehdi
- Article
16
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1888, doi. 10.1007/s10854-017-8099-4
- Kraini, M.;
- Bouguila, N.;
- Moutia, N.;
- El Ghoul, J.;
- Khirouni, K.;
- Vázquez-Vázquez, C.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1907, doi. 10.1007/s10854-017-8100-2
- Li, Chunchun;
- Wen, Wangxi;
- Xiang, Huaicheng;
- Fang, Liang;
- Sun, Yihua
- Article
18
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1914, doi. 10.1007/s10854-017-8101-1
- Jeyakanthan, M.;
- Subramanian, Uma;
- Tangsali, R. B.
- Article
19
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1925, doi. 10.1007/s10854-017-8102-0
- Rathore, Deepshikha;
- Mitra, Supratim;
- Kurchania, Rajnish;
- Pandey, R. K.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1933, doi. 10.1007/s10854-017-8103-z
- Jiang, Xishun;
- Zheng, Shaokang;
- Lin, Qibin;
- Shi, Yonghua;
- Dong, Kexiu;
- Zhang, Yangyi;
- Zhang, Yongchun;
- Li, Xinyi;
- Sun, Zhaoqi
- Article
21
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1939, doi. 10.1007/s10854-017-8104-y
- Sertel, T.;
- Ozen, Y.;
- Cetin, S. S.;
- Ozturk, M. K.;
- Ozcelik, S.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1947, doi. 10.1007/s10854-017-8105-x
- Kumar, Rahul;
- Soam, Ankur;
- Dusane, Rajiv O.;
- Bhargava, Parag
- Article
23
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1955, doi. 10.1007/s10854-017-8106-9
- Nayak, Nimai C.;
- Dash, Bikash K.;
- Parida, B. N.;
- Padhee, R.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1964, doi. 10.1007/s10854-017-8107-8
- Zhang, Boya;
- Gao, Wenqiang;
- Chu, Pengfei;
- Zhang, Zhong;
- Zhang, Guixin
- Article
25
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1975, doi. 10.1007/s10854-017-8108-7
- Rani, B. Jansi;
- Saravanakumar, B.;
- Ravi, G.;
- Ganesh, V.;
- Ravichandran, S.;
- Yuvakkumar, R.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1985, doi. 10.1007/s10854-017-8109-6
- Samizo, Hayata;
- Kato, Takumi;
- Kawano, Naoki;
- Okada, Go;
- Kawaguchi, Noriaki;
- Yanagida, Takayuki
- Article
27
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 1992, doi. 10.1007/s10854-017-8110-0
- Ramesan, M. T.;
- Jayakrishnan, P.;
- Anilkumar, T.;
- Mathew, G.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2001, doi. 10.1007/s10854-017-8111-z
- Wang, Kangguo;
- Zhou, Huanfu;
- Sun, Wendong;
- Chen, Xiuli;
- Ruan, Hong
- Article
29
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2007, doi. 10.1007/s10854-017-8112-y
- Pang, Lingyun;
- Ni, Xiuyuan
- Article
30
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2016, doi. 10.1007/s10854-017-8113-x
- Barón-Miranda, J. A.;
- Calzadilla, O.;
- San-Juan-Hernández, S.;
- Diez-Pérez, I.;
- Díaz, J.;
- Sanz, F.;
- Chále-Lara, F. F.;
- Espinosa-Faller, F. J.;
- Caballero-Briones, F.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2026, doi. 10.1007/s10854-017-8114-9
- Kaur, Harsimranjot;
- Bhatti, H. S.;
- Singh, Karamjit
- Article
32
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2035, doi. 10.1007/s10854-017-8115-8
- Li, Yang;
- Hu, Lili;
- Yang, Bobo;
- Shi, Mingming;
- Zou, Jun
- Article
33
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2040, doi. 10.1007/s10854-017-8116-7
- Zeybek, O.;
- Ayaz, A.;
- Öztürk, M. K.;
- Davarpanah, A. M.;
- Barrett, S. D.;
- Bayırlı, M.;
- Özçelik, S.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2045, doi. 10.1007/s10854-017-8117-6
- Shen, Lizhen;
- Zhang, Hezhong;
- Liu, Guoqing;
- Fang, Heming
- Article
35
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2051, doi. 10.1007/s10854-017-8118-5
- Durai, G.;
- Kuppusami, P.;
- Viswanathan, K.
- Article
36
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2060, doi. 10.1007/s10854-017-8119-4
- Qin, Honglei;
- Chen, Li;
- Yu, Xiwen;
- Wu, Mingyue;
- Yan, Zongcheng
- Article
37
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2072, doi. 10.1007/s10854-017-8120-y
- Xue, Dandan;
- Liu, Yunyi;
- Shi, Meng;
- Wang, Pei;
- Zhang, Leiyang;
- Liu, Gang;
- Chen, Zhiqian;
- Chen, Yi
- Article
38
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2080, doi. 10.1007/s10854-017-8121-x
- Wang, Ran;
- Sui, Yanwei;
- Yang, Fei;
- Qi, Jiqiu;
- Wei, Fuxiang;
- He, Yezeng;
- Meng, Qingkun;
- Sun, Zhi
- Article
39
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2091, doi. 10.1007/s10854-017-8122-9
- Vediyappan, Sivasubramani;
- Vijayan, Mohankumar;
- Muthu, Senthil Pandian;
- Perumal, Ramasamy;
- Sathyadhass Ambalapushpam, Martin Britto Dhas
- Article
40
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2110, doi. 10.1007/s10854-017-8123-8
- Murtaza, Tahir;
- Ali, Javid;
- Khan, Mohd Shahid;
- Asokan, K.
- Article
41
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2120, doi. 10.1007/s10854-017-8124-7
- Wang, Wei;
- Chen, Lingjie;
- Qi, Jiqiu;
- Sui, Yanwei;
- He, Yezeng;
- Meng, Qingkun;
- Wei, Fuxiang;
- Sun, Zhi
- Article
42
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2131, doi. 10.1007/s10854-017-8125-6
- Dias, Sandra;
- Chirakkara, Saraswathi;
- Patel, Nagabhushan;
- Krupanidhi, S. B.
- Article
43
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2140, doi. 10.1007/s10854-017-8126-5
- Article
44
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2151, doi. 10.1007/s10854-017-8127-4
- Sagayaraj, R.;
- Aravazhi, S.;
- Praveen, P.;
- Chandrasekaran, G.
- Article
45
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2159, doi. 10.1007/s10854-017-8128-3
- da Fonseca, Bruna Teixeira;
- D’Elia, Eliane;
- Júnior, José Márcio Siqueira;
- de Oliveira, Sanair Massafra;
- dos Santos Castro, Kelly Leite;
- Ribeiro, Emerson Schwingel
- Article
46
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2170, doi. 10.1007/s10854-017-8129-2
- Xie, Wentao;
- Jiang, Qinxian;
- Cao, Qinglin;
- Zhou, Hongqing;
- Ren, Luchao;
- Luo, Xianfu
- Article
47
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2175, doi. 10.1007/s10854-017-8130-9
- Chahar, Sangeeta;
- Dalal, Mandeep;
- Singh, Sonika;
- Devi, Rekha;
- Taxak, V. B.;
- Khatkar, S. P.
- Article
48
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2184, doi. 10.1007/s10854-017-8131-8
- Modwi, A.;
- Khezami, L.;
- Taha, Kamal K.;
- Houas, Ammar
- Article
49
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2193, doi. 10.1007/s10854-017-8132-7
- Zhang, Yamei;
- Xu, Hongxiang;
- Dong, Songtao;
- Han, Ruqu;
- Liu, Xiaomei;
- Wang, Yuanxiang;
- Li, Shuzhen;
- Bu, Qinghua;
- Li, Xiaoxi;
- Xiang, Jun
- Article
50
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 3, p. 2201, doi. 10.1007/s10854-017-8133-6
- Zou, Hao;
- Song, Mianxin;
- Yi, Facheng;
- Wang, Xiaoqiang;
- Bian, Liang;
- Li, Weimin;
- Zhang, Jili;
- Pan, Ning;
- Zeng, Pan
- Article