Works matching IS 09574522 AND DT 2018 AND VI 29 AND IP 21
1
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18531, doi. 10.1007/s10854-018-9969-0
- Zheng, Zhi-Bo;
- Sun, Jiang-Jie;
- Fakhri, Ali;
- Surendar, A.;
- Ibatova, Aygul Z.;
- Liu, Jia-Bao
- Article
2
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18030, doi. 10.1007/s10854-018-9894-2
- Cheng, Lichun;
- Zhou, Huaiying;
- Xiong, Jilei;
- Pan, Shunkang;
- Luo, Jialiang
- Article
3
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18878, doi. 10.1007/s10854-018-0013-1
- Nasrin, S.;
- Chowdhury, F.-U.-Z.;
- Hasan, M. M.;
- Hossen, M. M.;
- Ullah, S. M.;
- Hoque, S. M.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18868, doi. 10.1007/s10854-018-0012-2
- Zheng, Haisong;
- Li, Chenghui;
- Wei, Aixiang;
- Liu, Jun;
- Zhao, Yu;
- Xiao, Zhiming
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18859, doi. 10.1007/s10854-018-0011-3
- Liu, Gang;
- Zhang, Leiyang;
- Wu, Qiankun;
- Wang, Ziyang;
- Li, Yang;
- Li, Dequan;
- Liu, Hongbo;
- Yan, Yan
- Article
6
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18852, doi. 10.1007/s10854-018-0010-4
- Zhang, Gang;
- Xing, Guoliang;
- Li, Juntong;
- Zhang, Xinyu;
- Lang, Jihui;
- Zhao, Lina;
- Wang, Jin;
- Jiang, Wenlong
- Article
7
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18840, doi. 10.1007/s10854-018-0009-x
- Hu, Xiaowu;
- Lai, Yanqing;
- Jiang, Xiongxin;
- Li, Yulong
- Article
8
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18828, doi. 10.1007/s10854-018-0008-y
- Zhao, Di;
- Zhang, Keke;
- Cui, Jianguo;
- Ma, Ning;
- Pan, Yibo;
- Yin, Chenxiang
- Article
9
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18815, doi. 10.1007/s10854-018-0007-z
- Qu, Yunpeng;
- Wang, Hanying;
- Fan, Guohua;
- Xie, Peitao;
- Liu, Yao
- Article
10
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18807, doi. 10.1007/s10854-018-0006-0
- Hou, Jingshan;
- Liu, Jinghui;
- Zou, Jun;
- Zhao, Guoying;
- Liu, Yufeng;
- Feng, Xiang-Fei;
- Fang, Yongzheng
- Article
11
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18797, doi. 10.1007/s10854-018-0005-1
- Liu, Ya;
- Zhang, Hong;
- Fu, Weiyi;
- Yang, Zefang;
- Li, Zhicheng
- Article
12
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18791, doi. 10.1007/s10854-018-0004-2
- Xia, Yan;
- Yuan, Shifeng;
- An, Shaobo;
- Jiang, Juan;
- Gan, Lin;
- Zhang, Tianjin
- Article
13
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18781, doi. 10.1007/s10854-018-0003-3
- Liu, Sha-sha;
- Zhu, Da-chuan;
- Yang, Ling-xiang;
- Zhao, Cong;
- Pu, Yong
- Article
14
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18771, doi. 10.1007/s10854-018-0002-4
- Shojaie Mehr, Saba;
- Ramazani, Abdolali;
- Almasi Kashi, Mohammad
- Article
15
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 21, p. 18760, doi. 10.1007/s10854-018-0001-5
- Vattikuti, S. V. Prabhakar;
- Reddy, Police Anil Kumar;
- Shim, Jaesool;
- Byon, Chan
- Article