Works matching IS 09574522 AND DT 2018 AND VI 29 AND IP 16
1
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14347, doi. 10.1007/s10854-018-9569-z
- Bogart, Lara K.;
- Morozov, Iurii G.;
- Parkin, Ivan P.;
- Kuznetcov, Maksim V.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14335, doi. 10.1007/s10854-018-9568-0
- Chen, Chuantong;
- Choe, Chanyang;
- Zhang, Zheng;
- Kim, Dongjin;
- Suganuma, Katsuaki
- Article
3
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14328, doi. 10.1007/s10854-018-9567-1
- Abidov, Amir;
- Kim, Sungjin;
- Kim, Yong Bae;
- Gomez-Solis, Christian
- Article
4
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14322, doi. 10.1007/s10854-018-9566-2
- Cruz-García, A.;
- Fernández-Gamboa, J. R.;
- Altshuler, E.;
- Jardim, R. F.;
- Vazquez-Robaina, O.;
- Muné, P.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14311, doi. 10.1007/s10854-018-9565-3
- Yang, Gui;
- Liang, Yujun;
- Li, Kai;
- Yang, Jian;
- Zhu, Yingli;
- Liu, Shiqi;
- Xu, Rui
- Article
6
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14300, doi. 10.1007/s10854-018-9564-4
- Liu, Bingkun;
- Han, Xiaole;
- Wang, Yu;
- Fan, Xin;
- Wang, Zhuoyue;
- Zhang, Jingtao;
- Shi, Hengzhen
- Article
7
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14292, doi. 10.1007/s10854-018-9563-5
- Jia, Yifan;
- Lv, Hongliang;
- Tang, Xiaoyan;
- Song, Qingwen;
- Zhang, Yimen;
- Zhang, Yuming;
- Dimitrijev, Sima;
- Han, Jisheng
- Article
8
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14285, doi. 10.1007/s10854-018-9562-6
- Xue, Fei;
- Tang, Lu;
- Guo, Peng;
- Luo, Zhe;
- Li, Wang
- Article
9
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14277, doi. 10.1007/s10854-018-9561-7
- Zhai, Zihao;
- Shen, Honglie;
- Chen, Jieyi;
- Sun, Luanhong
- Article
10
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14267, doi. 10.1007/s10854-018-9560-8
- Weng, Ling;
- Wang, HeBing;
- Zhang, Xiaorui;
- Liu, Lizhu;
- Zhang, Hexin
- Article
11
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14261, doi. 10.1007/s10854-018-9559-1
- Qiu, Zexiong;
- Hao, Hua;
- Cao, Minghe;
- Yao, Zhonghua;
- Liu, Hanxing
- Article
12
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14248, doi. 10.1007/s10854-018-9558-2
- Routray, Krutika L.;
- Behera, Dhrubananda
- Article
13
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14239, doi. 10.1007/s10854-018-9557-3
- Mansouri, M.;
- Omrani, H.;
- M’nassri, R.;
- Cheikhrouhou-Koubaa, W.;
- Cheikhrouhou, A.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14232, doi. 10.1007/s10854-018-9556-4
- Abuelwafa, A. A.;
- Choudhury, M. S. H.;
- Dongol, M.;
- El-Nahass, M. M.;
- Soga, T.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14222, doi. 10.1007/s10854-018-9555-5
- Li, Yanwei;
- Song, Yan;
- Guo, Jiangdong;
- Ma, Qianli;
- Dong, Xiangting;
- Yu, Wensheng;
- Yang, Ying;
- Wang, Tingting;
- Wang, Jinxian;
- Liu, Guixia
- Article
16
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14210, doi. 10.1007/s10854-018-9554-6
- Harun, Nur Farah Atikah;
- Mohd, Yusairie;
- Lim, Ying Pei;
- Yin, Chun-Yang;
- Lim, Ying-Chin
- Article
17
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14200, doi. 10.1007/s10854-018-9553-7
- Sathishkumar, M.;
- Rajamanickam, A. T.;
- Saroja, M.
- Article
18
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14192, doi. 10.1007/s10854-018-9552-8
- Xing, Xiaowei;
- Wang, Dongming;
- Chen, Zhi;
- Zheng, Bodan;
- Li, Baohong;
- Wu, Dudu
- Article
19
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14180, doi. 10.1007/s10854-018-9551-9
- Jagannadham, K.;
- Das, K.;
- Reynolds, C. L.;
- El-Masry, N.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14170, doi. 10.1007/s10854-018-9550-x
- Jiang, Zhongyi;
- Wang, Tao;
- Song, Li;
- Guo, Hu;
- Xia, Wei;
- Gong, Hao;
- Gao, Bin;
- Feng, Linfei;
- Liu, Xiao;
- He, Jianping
- Article
21
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14161, doi. 10.1007/s10854-018-9549-3
- Xiong, Xiaoying;
- Zhou, Zhou;
- Zhang, Zhao;
- Yang, Hui;
- Zhang, Qilong
- Article
22
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14151, doi. 10.1007/s10854-018-9548-4
- Moradi, Sajjad;
- Taghavi Fardood, Saeid;
- Ramazani, Ali
- Article
23
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14144, doi. 10.1007/s10854-018-9547-5
- Liang, Sin-Yong;
- Song, Jenn-Ming;
- Huang, Shang-Kun;
- Chiu, Ying-Ta;
- Tarng, David;
- Hung, Chih-Pin
- Article
24
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14132, doi. 10.1007/s10854-018-9546-6
- Stefan, Maria;
- Popa, Adriana;
- Pana, Ovidiu;
- Leostean, Cristian;
- Toloman, Dana;
- Lazar, Diana;
- Pogacean, Florina;
- Macavei, Sergiu;
- Gutoiu, Simona
- Article
25
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14122, doi. 10.1007/s10854-018-9545-7
- Mondal, Subhadip;
- Kumar, Ashavani
- Article
26
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14116, doi. 10.1007/s10854-018-9544-8
- Pujari, R. B.;
- Lokhande, A. C.;
- Ghogare, T. T.;
- Kale, S. B.;
- Lokhande, C. D.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14111, doi. 10.1007/s10854-018-9543-9
- Sbeta, M.;
- Serin, T.;
- Yildiz, A.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14105, doi. 10.1007/s10854-018-9542-x
- Chi, Caixia;
- Hao, Jian;
- Yang, Yu;
- Liu, Shikun;
- Liu, Xusong;
- Ma, Xiaoxuan;
- Liu, Xiaoxu;
- Zhao, Jiupeng;
- Li, Yao
- Article
29
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14093, doi. 10.1007/s10854-018-9541-y
- Dhanavel, S.;
- Revathy, T. A.;
- Padmanaban, A.;
- Narayanan, V.;
- Stephen, A.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14084, doi. 10.1007/s10854-018-9540-z
- Sripriya, R. C.;
- Samson, V. Anto Feradrick;
- Anand, S.;
- Madhavan, J.;
- Raj, M. Victor Antony
- Article
31
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14073, doi. 10.1007/s10854-018-9539-5
- Jeevanantham, N.;
- Balasundaram, O. N.
- Article
32
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14065, doi. 10.1007/s10854-018-9538-6
- He, Wang;
- Liu, Ying;
- Ye, Jinwen;
- Wang, Guangrui
- Article
33
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14055, doi. 10.1007/s10854-018-9537-7
- Shinde, H. M.;
- Bhosale, T. T.;
- Gavade, N. L.;
- Babar, S. B.;
- Kamble, R. J.;
- Shirke, B. S.;
- Garadkar, K. M.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14046, doi. 10.1007/s10854-018-9536-8
- Patra, Aniket;
- Sasmal, Abhishek;
- Seal, Anshuman;
- Sen, Shrabanee
- Article
35
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14031, doi. 10.1007/s10854-018-9535-9
- Rusly, Siti Nor Ain;
- Matori, Khamirul Amin;
- Ismail, Ismayadi;
- Abbas, Zulkifly;
- Awang, Zaiki;
- Zulkimi, Muhammad Misbah Muhamad;
- Idris, Fadzidah Mohd;
- Zaid, Mohd Hafiz Mohd;
- Zulfikri, Nor Dalilah
- Article
36
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14022, doi. 10.1007/s10854-018-9534-x
- SenthilKumar, Subramanian;
- Lellala, Kashinath;
- Ashok, Mahalingam;
- Priyadharsan, Arumugam;
- Sanjeeviraja, Chinnappanadar;
- Rajendran, Annamalai
- Article
37
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14008, doi. 10.1007/s10854-018-9533-y
- Zhao, Guoqing;
- Liu, Lukai;
- Li, Caifeng;
- Yu, Jingang;
- Jiao, Feipeng
- Article
38
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 14003, doi. 10.1007/s10854-018-9532-z
- Qi, Jianquan;
- Chang, Juanxiong;
- Wen, Yan;
- Chen, Zhiyan;
- Gong, Haichao;
- Cheng, Jing;
- Han, Xiumei
- Article
39
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13984, doi. 10.1007/s10854-018-9531-0
- Lal, Madan;
- Shandilya, Mamta;
- Rai, Radheshyam;
- Ranjan, Anand;
- Sharma, Seema;
- Valente, M. A.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13970, doi. 10.1007/s10854-018-9530-1
- Suganthi, Nachimuthu;
- Pushpanathan, Kuppusamy
- Article
41
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13957, doi. 10.1007/s10854-018-9529-7
- Ma, Wei;
- Wang, Na;
- Li, Songtian;
- Cao, Kesheng;
- Yan, Yongsheng
- Article
42
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13952, doi. 10.1007/s10854-018-9528-8
- Duan, Ruijie;
- Wang, Jing;
- Jiang, Shenglin;
- Lv, Yunkai;
- Li, Jiali;
- Song, Aizhen;
- Liang, Linlin;
- Liu, Yuanxin
- Article
43
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13941, doi. 10.1007/s10854-018-9527-9
- Karasyuk, P.;
- Shepelytskyi, Y.;
- Semeniuk, O.;
- Bubon, O.;
- Juska, G.;
- Blevis, I.;
- Reznik, A.
- Article
44
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13931, doi. 10.1007/s10854-018-9526-x
- Ouled Nasser, N.;
- Ezaami, A.;
- Koubaa, M.;
- Cheikhrouhou-Koubaa, W.;
- Cheikhrouhou, A.
- Article
45
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13925, doi. 10.1007/s10854-018-9525-y
- Article
46
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13914, doi. 10.1007/s10854-018-9524-z
- Li, Yulong;
- Wang, Zhiliang;
- Long, Weifeng;
- Lei, Min;
- Hu, Xiaowu
- Article
47
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13903, doi. 10.1007/s10854-018-9523-0
- Xia, Jiuyang;
- Ning, Yu;
- Luo, Yanghua;
- Chen, Wen;
- Wu, Xuehang;
- Wu, Wenwei;
- Li, Qingzhao;
- Li, Kuntao
- Article
48
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13897, doi. 10.1007/s10854-018-9522-1
- Xu, T. T.;
- Liu, Y. Y.;
- Jiang, Z. M.;
- Pei, Y. Y.;
- Zhang, S.;
- Xu, J. M.;
- Zhang, X. L.;
- Li, X. J.
- Article
49
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13889, doi. 10.1007/s10854-018-9521-2
- Al-Hashimi, Mohammed;
- Kadem, Burak;
- Rahaq, Yaqub;
- Kadhim, Raheem G.;
- Hassan, Aseel
- Article
50
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 16, p. 13878, doi. 10.1007/s10854-018-9520-3
- Yang, C. A.;
- Wu, J.;
- Lee, C. C.;
- Kao, C. R.
- Article