Works matching IS 09574522 AND DT 2013 AND VI 24 AND IP 2
2
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 483, doi. 10.1007/s10854-012-0821-7
- Murugan, S.;
- Dhanapandian, S.;
- Manoharan, C.;
- Murali, K.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 457, doi. 10.1007/s10854-012-0736-3
- Zhao, Xiang;
- Wei, Ai;
- Zhao, Yu;
- Liu, Jun
- Article
4
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 827, doi. 10.1007/s10854-012-0828-0
- Watt, Charles;
- Liu, Qi;
- Ivey, Douglas
- Article
5
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 463, doi. 10.1007/s10854-012-0756-z
- Jiang, Jing;
- Li, Shibin;
- Jiang, Yadong;
- Wu, Zhiming;
- Xiao, Zhanfei;
- Su, Yuanjie
- Article
6
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 793, doi. 10.1007/s10854-012-0811-9
- Article
7
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 704, doi. 10.1007/s10854-012-0798-2
- Shen, Zong-Yang;
- Li, Yue-Ming;
- Luo, Wen-Qin;
- Wang, Zhu-Mei;
- Gu, Xing-Yong;
- Liao, Run-Hua
- Article
8
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 807, doi. 10.1007/s10854-012-0818-2
- Hadi, Walid;
- Cheekoori, Reddiprasad;
- Shur, Michael;
- O'Leary, Stephen
- Article
9
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 542, doi. 10.1007/s10854-012-0999-8
- Liu, Jun;
- Wei, Aixiang;
- Ge, Zengxian;
- Zhao, Wang
- Article
10
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 674, doi. 10.1007/s10854-012-0790-x
- Bahari, Ali;
- Gholipur, Reza
- Article
11
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 776, doi. 10.1007/s10854-012-0809-3
- Dogruer, M.;
- Zalaoglu, Y.;
- Gorur, O.;
- Ozturk, O.;
- Yildirim, G.;
- Varilci, A.;
- Yucel, E.;
- Terzioglu, C.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 764, doi. 10.1007/s10854-012-0807-5
- Azim-Araghi, Mohammad;
- Riyazi, Sobhenaz
- Article
13
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 770, doi. 10.1007/s10854-012-0808-4
- Wang, Yiliang;
- Chen, Xiuli;
- Zhou, Huanfu;
- Fang, Liang;
- Liu, Laijun;
- Zhang, Hui
- Article
14
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 467, doi. 10.1007/s10854-012-0768-8
- Gulen, M.;
- Yildirim, G.;
- Bal, S.;
- Varilci, A.;
- Belenli, I.;
- Oz, M.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 613, doi. 10.1007/s10854-012-0844-0
- Gondek, E.;
- Nosidlak, N.;
- Kulig, E.;
- Danel, A.;
- AlZayed, N.;
- Kityk, I.;
- Karasinki, P.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 448, doi. 10.1007/s10854-012-0721-x
- Mahmoud, F.;
- Boshta, M.;
- Sayed, M.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 507, doi. 10.1007/s10854-012-0930-3
- Article
18
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 758, doi. 10.1007/s10854-012-0806-6
- Article
19
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 576, doi. 10.1007/s10854-012-0800-z
- Dhibar, Saptarshi;
- Sahoo, Sumanta;
- Das, C.;
- Singh, R.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 572, doi. 10.1007/s10854-012-0813-7
- He, Xiancong;
- Shen, Honglie;
- Wang, Wei;
- Zhang, Baosen;
- Dai, Yuming;
- Lu, Yubao
- Article
21
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 819, doi. 10.1007/s10854-012-0826-2
- Chen, Yih-Chien;
- Chen, Kuei-Chien;
- Wu, Chung-Yen
- Article
22
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 720, doi. 10.1007/s10854-012-0801-y
- Manikam, Vemal;
- Razak, Khairunisak;
- Cheong, Kuan
- Article
23
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 536, doi. 10.1007/s10854-012-0984-2
- Hou, Qiong;
- Hong, Wenbiao;
- Zhang, Yong;
- Liu, Jungen;
- Chen, Yiquan;
- Shi, Guang
- Article
24
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 799, doi. 10.1007/s10854-012-0812-8
- Padhee, R.;
- Das, P.;
- Parida, B.;
- Choudhary, R.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 687, doi. 10.1007/s10854-012-0794-6
- Zhai, Xia;
- Wang, Hua;
- Xu, Ji-wen;
- Yuan, Chang-lai;
- Zhang, Xiao-wen;
- Zhou, Chang-rong;
- Liu, Xin-yu
- Article
26
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 553, doi. 10.1007/s10854-012-0831-5
- Ranjitha, A.;
- Muthukumarasamy, N.;
- Thambidurai, M.;
- Agilan, S.;
- Balasundaraprabhu, R.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 697, doi. 10.1007/s10854-012-0797-3
- Article
28
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 475, doi. 10.1007/s10854-012-0817-3
- Xie, Hai-Bing;
- Liu, Wei-Feng;
- Li, Xin-Yi;
- Yan, Fei;
- Jiang, Guo-Shun;
- Zhu, Chang-Fei
- Article
29
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 618, doi. 10.1007/s10854-012-0877-4
- Article
30
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 567, doi. 10.1007/s10854-012-0975-3
- Rajendra, B.;
- Fuchs, Benjamin;
- Dhananjaya, Kekuda
- Article
31
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 635, doi. 10.1007/s10854-012-0781-y
- Lacerda Silva, N.;
- Gonçalves, L.;
- Carvalho, H.
- Article
32
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 520, doi. 10.1007/s10854-012-0939-7
- Gu, Xiuquan;
- Wang, Bo;
- Zhang, Qi;
- Zhao, Yulong;
- Qiang, Yinghuai
- Article
33
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 594, doi. 10.1007/s10854-012-0949-5
- Liu, Shimin;
- Jiang, Weiwei;
- Liu, Chaoqian;
- Ding, Wanyu;
- Chai, Weiping
- Article
34
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 529, doi. 10.1007/s10854-012-0970-8
- Liu, Ying;
- Kong, De-Yi;
- You, Hui;
- Chen, Chi-lai;
- Lin, Xin-hua;
- Brugger, Jürgen
- Article
35
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 622, doi. 10.1007/s10854-012-0776-8
- Wang, Junhua;
- Yao, Jincheng;
- Chen, Zhaoyang;
- Fan, Yanwei;
- Chang, Aimin;
- Jia, Dianzeng
- Article
36
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 514, doi. 10.1007/s10854-012-0935-y
- Article
37
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 548, doi. 10.1007/s10854-012-0824-4
- Sheng, Xia;
- Wang, Lei;
- Tian, Ye;
- Luo, Yeping;
- Chang, Lantao;
- Yang, Deren
- Article
38
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 607, doi. 10.1007/s10854-012-0871-x
- Shen, Zong-Yang;
- Luo, Wen-Qin;
- Li, Yue-Ming;
- Hu, Qi-Guo;
- Wang, Zhu-Mei;
- Gu, Xing-Yong
- Article
39
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 711, doi. 10.1007/s10854-012-0799-1
- Kumar, Suresh;
- Vohra, Anil;
- Chakarvarti, S.
- Article
40
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 654, doi. 10.1007/s10854-012-0785-7
- Cui, Yerang;
- Yuan, Changlai;
- Liu, Xinyu;
- Zhao, Xiayan;
- Shan, Xu
- Article
41
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 692, doi. 10.1007/s10854-012-0796-4
- Senthilkumar, K.;
- Kalaivani, T.;
- Kanagesan, S.;
- Balasubramanian, V.;
- Balakrishnan, J.
- Article
42
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 745, doi. 10.1007/s10854-012-0804-8
- Pathan, M.;
- Siddiquee, K.;
- Alam, S.;
- Islam, O.;
- Gafur, M.
- Article
43
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 443, doi. 10.1007/s10854-012-0717-6
- Wang, Ke;
- Yang, Di;
- Wang, Wen-zhong
- Article
44
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 438, doi. 10.1007/s10854-012-0705-x
- Sathe, D.;
- Chate, P.;
- Hankare, P.;
- Manikshete, A.;
- Aswar, A.
- Article
45
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 628, doi. 10.1007/s10854-012-0777-7
- Yang, Wendong;
- Liu, Chunyan;
- Zhang, Zhiying;
- Liu, Yun;
- Nie, Shidong
- Article
46
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 559, doi. 10.1007/s10854-012-0858-7
- Ikhlasul Amal, M.;
- Kim, Kyoo
- Article
47
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 524, doi. 10.1007/s10854-012-0941-0
- Che, Quande;
- Yang, Hongxing;
- Lu, Lin;
- Wang, Yuanhao
- Article
48
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 734, doi. 10.1007/s10854-012-0802-x
- Lin, Qin;
- Jiang, Meng;
- Lin, Dunmin;
- Zheng, Qiaoji;
- Wu, Xiaochun;
- Fan, Ximing
- Article
49
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 814, doi. 10.1007/s10854-012-0822-6
- Jiang, Hongtao;
- Wang, Xiufeng;
- Hao, Gang;
- Wang, Lili
- Article
50
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 452, doi. 10.1007/s10854-012-0728-3
- Zhang, L.;
- Yan, L.;
- Ai, X.;
- Li, T.;
- Dai, C.
- Article