Works matching IS 09574522 AND DT 2012 AND VI 23 AND IP 10
1
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1788, doi. 10.1007/s10854-012-0663-3
- Article
2
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1809, doi. 10.1007/s10854-012-0667-z
- Xu, Bei;
- Gao, Feng;
- Cao, Xiao;
- Liu, Liangliang;
- Hu, Guoxin
- Article
3
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1823, doi. 10.1007/s10854-012-0669-x
- Jing, Hongjun;
- Jiang, Yadong;
- Du, Xiaosong
- Article
4
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1830, doi. 10.1007/s10854-012-0670-4
- Lin, Yen-Sheng;
- Kuo, Ho-Hung;
- Feng, Shih-Wei
- Article
5
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1817, doi. 10.1007/s10854-012-0668-y
- Duan, Bo;
- Zhai, Pengcheng;
- Liu, Lisheng;
- Zhang, Qingjie;
- Ruan, Xuefeng
- Article
6
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1793, doi. 10.1007/s10854-012-0664-2
- Kumar, Suresh;
- Vohra, Anil;
- Chakarvarti, S.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1799, doi. 10.1007/s10854-012-0665-1
- Riordan, Nathaniel;
- Gogineni, Chaturvedi;
- Johnson, Shane;
- Lu, Xianfeng;
- Tiedje, Tom;
- Ding, Ding;
- Zhang, Yong-Hang;
- Fritz, Rafael;
- Kolata, Kolja;
- Chatterjee, Sangam;
- Volz, Kerstin;
- Koch, Stephan
- Article
8
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1835, doi. 10.1007/s10854-012-0671-3
- Pal, Dharmendra;
- Abdi, S.;
- Triapathi, G.;
- Sachan, Kapil;
- Sharma, Shripal
- Article
9
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1855, doi. 10.1007/s10854-012-0674-0
- Raza, M.;
- Westwood, A.;
- Brown, A.;
- Stirling, C.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1783, doi. 10.1007/s10854-012-0662-4
- Patri, S.;
- Pradhan, Dillip;
- Choudhary, R.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1775, doi. 10.1007/s10854-012-0661-5
- Hu, Mingzhe;
- Fu, Yang;
- Zhou, Di;
- Gu, Haoshuang;
- Wang, Yu
- Article
12
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1869, doi. 10.1007/s10854-012-0676-y
- Wei, Jie;
- Li, Haiyang;
- Mao, Shengchun;
- Zhang, Chao;
- Xu, Zhuo;
- Dkhil, Brahim
- Article
13
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1851, doi. 10.1007/s10854-012-0673-1
- Xia, Ailin;
- Chen, Lu;
- Jin, Chuangui;
- Su, Shubing;
- Liu, Shunkai;
- Lv, Yaohui
- Article
14
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1864, doi. 10.1007/s10854-012-0675-z
- Zhang, Hongyan;
- Cheng, Ling;
- Jiang, Bo;
- Sun, Wen;
- Liu, Jingjing;
- Hu, Guangda
- Article
15
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1887, doi. 10.1007/s10854-012-0679-8
- Miao, Lingling;
- Zhang, Haiming;
- Zhu, Yanjun;
- Yang, Yan;
- Li, Qin;
- Li, Jing
- Article
16
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1875, doi. 10.1007/s10854-012-0677-x
- Wang, Shuang;
- He, Hao;
- Su, Hao
- Article
17
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1881, doi. 10.1007/s10854-012-0678-9
- Deo, Nirmalendu;
- Bain, Michael;
- Montgomery, John;
- Gamble, Harold
- Article
18
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1805, doi. 10.1007/s10854-012-0666-0
- Rajendra, B.;
- Kekuda, Dhananjaya
- Article
19
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1891, doi. 10.1007/s10854-012-0680-2
- Kohli, P.;
- Devi, Pooja;
- Reddy, Pramod;
- Raina, K.;
- Singla, M.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1844, doi. 10.1007/s10854-012-0672-2
- Achimovičová, Marcela;
- Gotor, Francisco;
- Real, Concepcion;
- Daneu, Nina
- Article
21
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1898, doi. 10.1007/s10854-012-0681-1
- Ananthakumar, R.;
- Subramanian, B.;
- Yugeswaran, S.;
- Jayachandran, M.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1905, doi. 10.1007/s10854-012-0682-0
- Lu, Hongbing;
- Dong, Binghai;
- Zhao, Li;
- Wang, Shimin;
- Xu, Zuxun;
- Li, Jinchai
- Article
23
- 2012
- Kumar, Suresh;
- Vohra, Anil;
- Chakarvarti, S.
- Correction Notice
24
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1910, doi. 10.1007/s10854-012-0879-2
- Gong, Yueqiu;
- Yang, Ge;
- Li, Xujun;
- Gong, Lunjun;
- Li, Lu;
- Peng, Jinfeng;
- Zheng, Xuejun
- Article
25
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1916, doi. 10.1007/s10854-012-0880-9
- Cervantes, Thiago;
- Bento, Danielly;
- Maia, Elaine;
- Zaia, Dimas;
- Laureto, Edson;
- Silva, Marco;
- Moore, Gregory;
- Santana, Henrique
- Article
26
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 10, p. 1922, doi. 10.1007/s10854-012-0890-7
- Reshak, Ali;
- Lakshminarayana, G.;
- Kamarudin, H.;
- Kityk, I.;
- Auluck, S.;
- Berdowski, J.;
- Tylczynski, Z.
- Article