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Introduction.
- Published in:
- 2011
- By:
- Publication type:
- Editorial
Screening for counterfeit electronic parts.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1511, doi. 10.1007/s10854-011-0500-0
- By:
- Publication type:
- Article
Failure localization with active and passive voltage contrast in FIB and SEM.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1523, doi. 10.1007/s10854-011-0459-x
- By:
- Publication type:
- Article
Innovative methodologies of circuit edit by focused ion beam (FIB) on wafer-level chip-scale-package (WLCSP) devices.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1536, doi. 10.1007/s10854-011-0457-z
- By:
- Publication type:
- Article
Two-photon absorption laser assisted device alteration using continuous wave 1,340 nm laser.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1542, doi. 10.1007/s10854-011-0458-y
- By:
- Publication type:
- Article
Characterization of poly-Si thin-film solar cell functions and parameters with IR optical interaction techniques.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1553, doi. 10.1007/s10854-011-0450-6
- By:
- Publication type:
- Article
Extending acoustic microscopy for comprehensive failure analysis applications.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1580, doi. 10.1007/s10854-011-0487-6
- By:
- Publication type:
- Article
LA ICP-MS in microelectronics failure analysis.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1594, doi. 10.1007/s10854-011-0451-5
- By:
- Publication type:
- Article
Conductive filament formation in printed circuit boards: effects of reflow conditions and flame retardants.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1602, doi. 10.1007/s10854-011-0449-z
- By:
- Publication type:
- Article
Disassembly methodology for conducting failure analysis on lithium-ion batteries.
- Published in:
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 10, p. 1616, doi. 10.1007/s10854-011-0452-4
- By:
- Publication type:
- Article