Works matching IS 09574522 AND DT 2010 AND VI 21 AND IP 9
1
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 897, doi. 10.1007/s10854-009-0013-2
- Ping Fan;
- Guang-Xing Liang;
- Zhuang-Hao Zheng;
- Xing-Min Cai;
- Dong-Ping Zhang
- Article
2
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 875, doi. 10.1007/s10854-009-0010-5
- Yaowu Shi;
- Weiping Fang;
- Zhidong Xia;
- Yongping Lei;
- Fu Guo;
- Xiaoyan Li
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 868, doi. 10.1007/s10854-009-0009-y
- Changdong Zou;
- Yulai Gao;
- Bin Yang;
- Qijie Zhai
- Article
4
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 861, doi. 10.1007/s10854-009-0008-z
- Jagtap, Shweta;
- Rane, Sunit;
- Gosavi, Suresh;
- Amalnerkar, Dinesh
- Article
5
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 932, doi. 10.1007/s10854-009-0020-3
- Koduri, Ramam;
- Lopez, Marta;
- Chandramouli, K.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 926, doi. 10.1007/s10854-009-0019-9
- Wen-Ching Shih;
- Jian-Min Jeng;
- Jyi-Tsong Lo;
- Huang-Chin Chen;
- I-Nan Lin
- Article
7
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 917, doi. 10.1007/s10854-009-0018-x
- Lang, Fengqun;
- Nakagawa, Hiroshi;
- Aoyagi, Masahiro;
- Ohashi, Hiromichi;
- Yamaguchi, Hiroshi
- Article
8
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 910, doi. 10.1007/s10854-009-0017-y
- Lili Gao;
- Songbai Xue;
- Liang Zhang;
- Zhengxiang Xiao;
- Wei Dai;
- Feng Ji;
- Huan Ye;
- Guang Zeng
- Article
9
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 889, doi. 10.1007/s10854-009-0012-3
- Abo-Mosallam, H. A.;
- Darwish, H.;
- Salman, S. M.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 906, doi. 10.1007/s10854-009-0016-z
- Kawar, S. S.;
- Pawar, B. H.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 939, doi. 10.1007/s10854-009-0021-2
- Huanfu Zhou;
- Xiuli Chen;
- Liang Fang;
- Changzheng Hu;
- Hong Wang
- Article
12
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 902, doi. 10.1007/s10854-009-0015-0
- Vikram, Satyendra V.;
- Phase, D. M.;
- Chandel, Vishal S.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 882, doi. 10.1007/s10854-009-0011-4
- Dehua Xiong;
- Hong Li;
- Jinshu Cheng
- Article
14
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 943, doi. 10.1007/s10854-009-0022-1
- Yamanaka, Kimihiro;
- Fujisaki, Teruya;
- Ichinose, Manabu;
- Ooyoshi, Takafumi
- Article
15
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 950, doi. 10.1007/s10854-009-0023-0
- Haiming Zhang;
- Xiaojie Li;
- Guofeng Hu;
- Yujie Li
- Article
16
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 954, doi. 10.1007/s10854-009-0024-z
- Yung, K. C.;
- Liem, H.;
- Choy, H. S.;
- Yue, T. M.
- Article