Works matching IS 09574522 AND DT 2010 AND VI 21 AND IP 8
1
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 838, doi. 10.1007/s10854-009-0004-3
- Yan Ma;
- Yong Jun Wu;
- Yi Qi Lin;
- Xiang Ming Chen
- Article
2
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 822, doi. 10.1007/s10854-009-0001-6
- Sánchez, M. E.;
- Rivera, M.;
- Ortíz-Rebollo, A.;
- Moreno, A.;
- Álvarez-Bada, J. R.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 804, doi. 10.1007/s10854-009-9996-y
- Reddy, M. Bhaskar;
- Janardhanam, V.;
- Kumar, A. Ashok;
- Reddy, V. Rajagopal;
- Reddy, P. Narasimha;
- Chel-Jong Choi;
- Ranju Jung;
- Sung Hur
- Article
4
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 811, doi. 10.1007/s10854-009-9997-x
- Jian Wang;
- Hong Zhang;
- Yiyu Li;
- Zhicheng Li
- Article
5
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 787, doi. 10.1007/s10854-009-9994-0
- Chang-Chun Lee;
- Chien-Chen Lee;
- Ya-Wen Yang
- Article
6
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 779, doi. 10.1007/s10854-009-9993-1
- Wen-Xue Chen;
- Song-Bai Xue;
- Hui Wang;
- Yu-Hua Hu
- Article
7
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 817, doi. 10.1007/s10854-009-9999-8
- Jyh Sheen;
- Chueh-Yu Li;
- Liang-Wen Ji;
- Wei-Lung Mao;
- Weihsing Liu;
- Chin-An Chen
- Article
8
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 827, doi. 10.1007/s10854-009-0002-5
- Valanarasu, S.;
- Chandramohan, R.;
- Thirumalai, J.;
- Vijayan, T. A.;
- Srikumar, S. R.;
- Mahalingam, T.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 833, doi. 10.1007/s10854-009-0003-4
- Zhang Lan;
- Jihuai Wu;
- Jianming Lin;
- Miaoliang Huang
- Article
10
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 849, doi. 10.1007/s10854-009-0006-1
- Huanfu Zhou;
- Xiuli Chen;
- Liang Fang;
- Changzheng Hu;
- Hong Wang
- Article
11
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 854, doi. 10.1007/s10854-009-0007-0
- Abbasov, M. E.;
- Ghosh, S.;
- Quach, A.;
- Carlisle, G. O.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 758, doi. 10.1007/s10854-009-9989-x
- Tripathy, Suraj Kumar;
- Jin-Nyoung Jo;
- Kwang-Joong O;
- Sang-Do Han;
- In-Hwan Lee;
- Yeon-Tae Yu
- Article
13
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 765, doi. 10.1007/s10854-009-9990-4
- Gupta, Atul;
- Kumar, Sunil;
- Bhatti, H. S.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 751, doi. 10.1007/s10854-009-9988-y
- Manjunatha, M. G.;
- Adhikari, A. V.;
- Hegde, P. K.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 796, doi. 10.1007/s10854-009-9995-z
- Wei Cai;
- Chunlin Fu;
- Jiacheng Gao;
- Xiaoling Deng
- Article
16
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 772, doi. 10.1007/s10854-009-9991-3
- Chan, K. L.;
- Mariatti, M.;
- Lockman, Z.;
- Sim, L. C.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 844, doi. 10.1007/s10854-009-0005-2
- Wen-Ching Shih;
- Ming-Han Chiang
- Article