Works matching IS 09574522 AND DT 2010 AND VI 21 AND IP 5
1
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 481, doi. 10.1007/s10854-009-9942-z
- Terrazas, J. M.;
- Nedev, N.;
- Manolov, E.;
- Valdez, B.;
- Nesheva, D.;
- Curiel, M. A.;
- Haasch, R.;
- Petrov, I.
- Article
2
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 456, doi. 10.1007/s10854-009-9938-8
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 475, doi. 10.1007/s10854-009-9941-0
- Ta-Chang Tien;
- Li-Chuan Lin;
- Lurng-Shehng Lee;
- Chi-Jen Hwang;
- Maikap, Siddheswar;
- Yuri Shulga
- Article
4
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 491, doi. 10.1007/s10854-009-9944-x
- Article
5
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 514, doi. 10.1007/s10854-009-9948-6
- Feng Chen;
- Jinrong Cheng;
- Shenwen Yu;
- Zhongyan Meng
- Article
6
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 519, doi. 10.1007/s10854-009-9949-5
- Ruzhong Zuo;
- Jian Fu;
- Xiaohui Wang;
- Longtu Li
- Article
7
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 441, doi. 10.1007/s10854-009-9932-1
- Shenghao Wang;
- Jingquan Zhang;
- Bo Wang;
- Lianghuan Feng;
- Yaping Cai;
- Lili Wu;
- Wei Li;
- Zhi Lei;
- Bing Li
- Article
8
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 445, doi. 10.1007/s10854-009-9936-x
- Young Chae Yoo;
- Kim, Lee-Hyun;
- Il Ki Han
- Article
9
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 450, doi. 10.1007/s10854-009-9937-9
- Wu, S. Y.;
- Zhang, W.;
- Chen, X. M.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 468, doi. 10.1007/s10854-009-9940-1
- Çadırlı, E.;
- Böyük, U.;
- Engin, S.;
- Kaya, H.;
- Maraşlı, N.;
- Arı, M.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 486, doi. 10.1007/s10854-009-9943-y
- Dapeng Chen;
- Xueliang Qiao;
- Xiaolin Qiu;
- Fatang Tan;
- Jianguo Chen;
- Renzhi Jiang
- Article
12
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 461, doi. 10.1007/s10854-009-9939-7
- Wen Xue Chen;
- Song Bai Xue;
- Hui Wang;
- Jian Xin Wang;
- Zong Jie Han;
- Li Li Gao
- Article
13
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 496, doi. 10.1007/s10854-009-9945-9
- Wenxue Chen;
- Songbai Xue;
- Hui Wang;
- Jianxin Wang;
- Zongjie Han
- Article
14
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 509, doi. 10.1007/s10854-009-9947-7
- Jayatissa, Ahalapitiya H.;
- Kun Guo
- Article
15
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 503, doi. 10.1007/s10854-009-9946-8
- Jadhav, Rupali;
- Kulkarni, Deepti;
- Puri, Vijaya
- Article
16
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 529, doi. 10.1007/s10854-009-9952-x
- Jia Li;
- Jin-Hua Huang;
- Wei-Jie Song;
- Rui-Qin Tan;
- Ye Yang;
- Xiao-Min Li
- Article
17
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 421, doi. 10.1007/s10854-010-0086-y
- Guang Zeng;
- Songbai Xue;
- Liang Zhang;
- Lili Gao;
- Wei Dai;
- Jiadong Luo
- Article
18
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 523, doi. 10.1007/s10854-009-9950-z
- Zhizheng Wang;
- Yajun Qi;
- Hongyan Qi;
- Chaojing Lu;
- Shimin Wang
- Article