Works matching IS 09574522 AND DT 2010 AND VI 21 AND IP 10
1
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 980, doi. 10.1007/s10854-010-0144-5
- Yew Hoong Wong;
- Kuan Yew Cheong
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1014, doi. 10.1007/s10854-010-0118-7
- Article
4
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1066, doi. 10.1007/s10854-010-0099-6
- Baated, Alongheng;
- Keun-Soo Kim;
- Suganuma, Katsuaki;
- Huang, Sharon;
- Jurcik, Benjamin;
- Nozawa, Shigeyoshi;
- Ueshima, Minoru
- Article
5
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1099, doi. 10.1007/s10854-010-0092-0
- Kiełbasiński, Konrad;
- Jakubowska, Małgorzata;
- Młożniak, Anna;
- Hrovat, Marko;
- Holc, Janez;
- Belavič, Darko
- Article
6
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1000, doi. 10.1007/s10854-010-0083-1
- Zhang Lan;
- Jihuai Wu;
- Jianming Lin;
- Miaoliang Huang
- Article
7
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1046, doi. 10.1007/s10854-009-0025-y
- Xiaoying Liu;
- Mingliang Huang;
- Wu, C. M. L.;
- Lai Wang
- Article
8
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1055, doi. 10.1007/s10854-009-0036-8
- Yanqiu Huang;
- Yixiong Liu;
- Lanfang Gao;
- Tiantian Liu;
- Guoxi Zhang
- Article
9
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1083, doi. 10.1007/s10854-009-0032-z
- Article
10
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1042, doi. 10.1007/s10854-009-0039-5
- Niziol, J.;
- Gondek, E.;
- Pluciñski, K. J.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1005, doi. 10.1007/s10854-009-0028-8
- Shi, J. H.;
- Huang, S. M.;
- Chu, J. B.;
- Zhu, H. B.;
- Wang, Z. A.;
- Li, X. D.;
- Zhang, D. W.;
- Z. Sun;
- Cheng, W. J.;
- Huang, F. Q.;
- Yin, X. J.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1036, doi. 10.1007/s10854-010-0055-5
- Rai, Prabhakar;
- Tripathy, Suraj Kumar;
- Nam-Hee Park;
- In-Hwan Lee;
- Yeon-Tae Yu
- Article
13
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1020, doi. 10.1007/s10854-010-0056-4
- Niziol, J.;
- Węgłowski, R.;
- Kłosowicz, S. J.;
- Majchrowski, A.;
- Rakus, P.;
- Wojciechowski, A.;
- Kityk, I. V.;
- Tkaczyk, S.;
- Gondek, E.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 994, doi. 10.1007/s10854-010-0062-6
- Brazil, Ian;
- Green, Martin A.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1060, doi. 10.1007/s10854-009-9998-9
- Article
16
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1090, doi. 10.1007/s10854-009-9992-2
- X. Gu;
- Yung, K. C.;
- Chan, Y. C.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1076, doi. 10.1007/s10854-010-0093-z
- Ning Zhang;
- Yaowu Shi;
- Fu Guo;
- Yongpei Lei;
- Zhidong Xia;
- Li Tian
- Article
18
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 10, p. 1024, doi. 10.1007/s10854-010-0104-0
- Kang Min Kim;
- Krishnamurthy, Daivasigamani;
- Yuji Sakai;
- Jong-Uk Seo;
- Hasegawa, Shigehiko;
- Asahi, Hajime
- Article