Works matching IS 09574522 AND DT 2008 AND VI 19 AND IP 4
1
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 319, doi. 10.1007/s10854-007-9320-7
- Zhouyun Ren;
- Chunyan Tao;
- Hua Yang
- Article
2
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 339, doi. 10.1007/s10854-007-9325-2
- Zhanchao Wu;
- Jianxin Shi;
- Jing Wang;
- Menglian Gong;
- Qiang Su
- Article
3
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 343, doi. 10.1007/s10854-007-9326-1
- Ying Yuan;
- Shuren Zhang;
- Xiaohua Zhou;
- Longcheng Xiang
- Article
4
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 389, doi. 10.1007/s10854-007-9350-1
- Sankir, Nurdan D.;
- Sankir, Mehmet;
- Claus, Richard O.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 373, doi. 10.1007/s10854-007-9346-x
- Koduri, Ramam;
- Orellana, Jose Rodrigo Anfossi
- Article
6
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 383, doi. 10.1007/s10854-007-9349-7
- Zimprich, P.;
- Betzwar-Kotas, A.;
- Khatibi, G.;
- Weiss, B.;
- Ipser, H.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 369, doi. 10.1007/s10854-007-9345-y
- Article
8
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 357, doi. 10.1007/s10854-007-9343-0
- Park, K.;
- Ha, J.-G.;
- Kim, C.-W.;
- Kim, Jun-Gyu
- Article
9
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 311, doi. 10.1007/s10854-007-9335-0
- Kakemoto, Hirofumi;
- Higuchi, Tohru;
- Shibata, Hajime;
- Wada, Satoshi;
- Tsurumi, Takaaki
- Article
10
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 393, doi. 10.1007/s10854-007-9351-0
- Zhang, X. P.;
- Yin, L. M.;
- Yu, C. B.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 305, doi. 10.1007/s10854-007-9339-9
- O'Reilly, L.;
- Bennett, N. S.;
- McNally, P. J.;
- Sealy, B. J.;
- Cowern, N. E. B.;
- Lankinen, A.;
- Tuomi, T. O.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 327, doi. 10.1007/s10854-007-9322-5
- Liying Chen;
- Shunhua Wu;
- Shuang Wang;
- Guoqing Wang
- Article
13
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 333, doi. 10.1007/s10854-007-9323-4
- Reddy, K. Jagadeswara;
- Reddy, Varra Rajagopal;
- Reddy, P. Narasimha
- Article
14
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 349, doi. 10.1007/s10854-007-9327-0
- Yaowu Shi;
- Jianping Liu;
- Zhidong Xia;
- Yongping Lei;
- Fu Guo;
- Xiaoyan Li
- Article
15
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 363, doi. 10.1007/s10854-007-9344-z
- Švorčík, V.;
- Lyutakov, O.;
- Huttel, I.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 301, doi. 10.1007/s10854-007-9334-1
- Yoshino, K.;
- Nomoto, K.;
- Kinoshita, A.;
- Ikari, T.;
- Akaki, Y.;
- Yoshitake, T.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 315, doi. 10.1007/s10854-007-9338-x
- Article
18
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 379, doi. 10.1007/s10854-007-9348-8
- Hongwei Chen;
- Chuanren Yang;
- Chunlin Fu;
- Jun Shi;
- Jihua Zhang;
- Wenjian Leng
- Article
19
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 323, doi. 10.1007/s10854-007-9321-6
- Hasanuzzaman, Mohammad;
- Haddara, Yaser M.
- Article