Works matching IS 09574522 AND DT 2008 AND VI 19 AND IP 3
1
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 267, doi. 10.1007/s10854-007-9272-y
- Ali, Akbar;
- Majid, Abdul;
- Saleh, M. Nawaz
- Article
2
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 241, doi. 10.1007/s10854-007-9291-8
- Jiang, Q.;
- Zhang, Q.;
- Du, B.;
- Zou, R. L.;
- Liu, Y. H.;
- Zhao, Y.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 255, doi. 10.1007/s10854-007-9271-z
- Korzun, B. V.;
- Fadzeyeva, A. A.;
- Bente, K.;
- Doering, Th.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 217, doi. 10.1007/s10854-007-9225-5
- Murali, K. R.;
- Abirami, J.;
- Balasubramanian, T.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 237, doi. 10.1007/s10854-007-9261-1
- Mukherjee, S.;
- Jain, S.;
- Zhao, F.;
- Kar, J. P.;
- Li, D.;
- Shi, Z.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 233, doi. 10.1007/s10854-007-9268-7
- Ebothe, Jean;
- Imiolek, W.;
- Plucinski, K. J.;
- Hui, D.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 223, doi. 10.1007/s10854-007-9270-0
- Songzhan Li;
- Yanqin Yang;
- Liu, L.;
- Zhang, T. J.;
- Huang, W. H.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 247, doi. 10.1007/s10854-007-9279-4
- Wan, J. B.;
- Liu, Y. C.;
- Wei, C.;
- Gao, Z. M.;
- Ma, C. S.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 275, doi. 10.1007/s10854-007-9292-7
- Jun Shen;
- Shiqiang Lai;
- Yongchang Liu;
- Houxiu Gao;
- Jun Wei
- Article
10
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 271, doi. 10.1007/s10854-007-9281-x
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 261, doi. 10.1007/s10854-007-9280-y
- Kar, J. P.;
- Mukherjee, S.;
- Bose, G.;
- Tuli, S.
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 227, doi. 10.1007/s10854-007-9290-9
- Tian, Z. Q.;
- Wang, H.;
- Huang, W. J.;
- Zhang, C. Y.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 289, doi. 10.1007/s10854-007-9297-2
- Murali, K. R.;
- Elango, P.;
- Andavan, P.;
- Venkatachalam, K.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 281, doi. 10.1007/s10854-007-9312-7
- Yu Hin Chan;
- Jang-Kyo Kim;
- Deming Liu;
- Liu, Peter C. K.;
- Yiu Ming Cheung;
- Ming Wai Ng
- Article
15
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 295, doi. 10.1007/s10854-007-9316-3
- Jie Chen;
- Yan Liu;
- Wei Feng;
- Wei-Min Cai
- Article
16
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 3, p. 211, doi. 10.1007/s10854-007-9319-0
- Ming Wang;
- Chang-Hui Ye;
- Ye Zhang;
- Hui-Xin Wang;
- Xiao-Yan Zeng;
- Li-De Zhang
- Article