Works matching IS 09574522 AND DT 2008 AND VI 19 AND IP 12
1
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1160, doi. 10.1007/s10854-007-9505-0
- Jing Bo Wan;
- Yong Chang Liu;
- Chen Wei;
- Peng Jiang;
- Zhi Gao
- Article
2
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1153, doi. 10.1007/s10854-007-9503-2
- Rejini, R.;
- Subodh, G.;
- Sebastian, M. T.
- Article
3
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1169, doi. 10.1007/s10854-007-9517-9
- Ponce, M. A.;
- Bueno, P.;
- Varela, J.;
- Castro, M.;
- Aldao, C.
- Article
4
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1191, doi. 10.1007/s10854-007-9524-x
- Longhai Wang;
- Jun Yu;
- Yunbo Wang;
- Junxiong Gao
- Article
5
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1209, doi. 10.1007/s10854-007-9535-7
- Liang Cheng;
- Mingwang Shao;
- Chen, Dayan;
- Xianwen Wei;
- Fengxia Wang;
- Jun Hua
- Article
6
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1184, doi. 10.1007/s10854-007-9523-y
- Jun Wang;
- Tianjin Zhang;
- Neng Wan;
- Junhuai Xiang
- Article
7
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1252, doi. 10.1007/s10854-008-9585-5
- Hankare, P. P.;
- Asabe, M. R.;
- Chate, P. A.;
- Rathod, K. C.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1197, doi. 10.1007/s10854-007-9527-7
- Wencheng Hu;
- Chuanren Yang;
- Wanli Zhang
- Article
9
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1176, doi. 10.1007/s10854-007-9522-z
- Wenming Tang;
- Anqiang He;
- Qi Liu;
- Ivey, Douglas
- Article
10
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1206, doi. 10.1007/s10854-007-9529-5
- Saravanan, Nagalingam;
- Geok Bee Teh;
- Samuel Yong Peen Yap;
- Kar Mum Cheong
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1202, doi. 10.1007/s10854-007-9528-6
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1214, doi. 10.1007/s10854-007-9545-5
- Li, L.;
- Yu, J. S.;
- Lou, S. L.;
- Li, W. Z.;
- Jiang, Y. D.
- Article
13
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1222, doi. 10.1007/s10854-007-9546-4
- Fink, D.;
- Kiv, A.;
- Golovanov, V.;
- Chen, J.;
- Chandra, A.;
- Ivanovskaya, M.;
- Khirunenko, L.;
- Fuks, D.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1228, doi. 10.1007/s10854-007-9547-3
- Feng Gao;
- Li-Hong Cheng;
- Rong-Zi Hong;
- Jia-Ji Liu;
- Yong-Hong Yao;
- Chang-Sheng Tian
- Article
15
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1247, doi. 10.1007/s10854-008-9580-x
- Aw, K. C.;
- Salim, N. Tjitra;
- Lohani, Anup;
- Gao, W.
- Article
16
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1240, doi. 10.1007/s10854-008-9578-4
- Patri, S. K.;
- Choudhary, R. N. P.
- Article
17
- 2008
- Machác˘, Petr;
- Perina, Vratislav
- Correction Notice
18
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1233, doi. 10.1007/s10854-008-9566-8
- Isaka, Nobuyuki;
- Ohkawa, Kensuke;
- Kiyono, Hajime;
- Itoh, Hidenobu;
- Takahashi, Junichi
- Article
19
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1147, doi. 10.1007/s10854-007-9502-3
- Article
20
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 12, p. 1156, doi. 10.1007/s10854-007-9504-1
- Bergaoui, M. S.;
- Boufaden, T.;
- Guermazi, S.;
- Agnel, S.;
- Toureille, A.;
- El Jani, B.
- Article