Works matching IS 09567925 AND DT 2001 AND VI 12 AND IP 2

Results: 2
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    Models of void electromigration.

    Published in:
    European Journal of Applied Mathematics, 2001, v. 12, n. 2, p. 97, doi. 10.1017/S0956792501004326
    By:
    • CUMMINGS, L. J.;
    • RICHARDSON, G.;
    • BEN AMAR, M.
    Publication type:
    Article