Works matching IS 09359648 AND DT 2011 AND VI 23 AND IP 3

Results: 13

Molecular Characterization of Organic Electronic Films.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 319, doi. 10.1002/adma.201001760

By:

DeLongchamp, Dean M.;
Kline, R. Joseph;
Fischer, Daniel A.;
Richter, Lee J.;
Toney, Michael F.

Publication type:

Article

Thermodynamic Underpinnings of Cell Alignment on Controlled Topographies.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 421, doi. 10.1002/adma.201001757

By:

Ding, Yifu;
Sun, Jirun;
Ro, Hyun Wook;
Wang, Zhen;
Zhou, Jing;
Lin, Nancy J.;
Cicerone, Marcus T.;
Soles, Christopher L.;
Lin-Gibson, Sheng

Publication type:

Article

Advancing Technology Through Measurement Science in the NIST Polymers Division.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 317, doi. 10.1002/adma.201004238

By:

Lin, Eric K.;
Cicerone, Marcus

Publication type:

Article

Materials Science at NIST (Adv. Mater. 3/2011).

Published in:: Advanced Materials, 2011, v. 23, n. 3, p. 311, doi. 10.1002/adma.201190000
Publication type:: Article

Combinatorial and High-Throughput Screening of Biomaterials.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 369, doi. 10.1002/adma.201001763

By:

Simon, Carl G.;
Lin-Gibson, Sheng

Publication type:

Article

Carbon Nanotubes: Measuring Dispersion and Length.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 338, doi. 10.1002/adma.201001756

By:

Fagan, Jeffrey A.;
Bauer, Barry J.;
Hobbie, Erik K.;
Becker, Matthew L.;
Hight Walker, Angela R.;
Simpson, Jeffrey R.;
Chun, Jaehun;
Obrzut, Jan;
Bajpai, Vardhan;
Phelan, Fred R.;
Simien, Daneesh;
Huh, Ji Yeon;
Migler, Kalman B.

Publication type:

Article

Photoresist Latent and Developer Images as Probed by Neutron Reflectivity Methods.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 388, doi. 10.1002/adma.201001762

By:

Prabhu, Vivek M.;
Kang, Shuhui;
VanderHart, David L.;
Satija, Sushil K.;
Lin, Eric K.;
Wu, Wen-li

Publication type:

Article

Controlled In Situ Nanocavitation in Polymeric Materials.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 409, doi. 10.1002/adma.201001755

By:

Cheng, Ya-Jun;
Antonucci, Joseph M.;
Hudson, Steven D.;
Lin, Nancy J.;
Zhang, Xinran;
Lin-Gibson, Sheng

Publication type:

Article

Surface Wrinkling: A Versatile Platform for Measuring Thin-Film Properties.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 349, doi. 10.1002/adma.201001759

By:

Chung, Jun Young;
Nolte, Adam J.;
Stafford, Christopher M.

Publication type:

Article

Contents: (Adv. Mater. 3/2011).

Published in:: Advanced Materials, 2011, v. 23, n. 3, p. 313, doi. 10.1002/adma.201190002
Publication type:: Article

Cubic Silsesquioxanes as a Green, High-Performance Mold Material for Nanoimprint Lithography.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 414, doi. 10.1002/adma.201001761

By:

Ro, Hyun Wook;
Popova, Vera;
Chen, Lei;
Forster, Aaron M.;
Ding, Yifu;
Alvine, Kyle J.;
Krug, Dave J.;
Laine, Richard M.;
Soles, Christopher L.

Publication type:

Article

Interfacial Rheology Through Microfluidics.

Published in:

Advanced Materials, 2011, v. 23, n. 3, p. 426, doi. 10.1002/adma.201001758

By:

Martin, Jeffrey D.;
Marhefka, Joie N.;
Migler, Kalman B.;
Hudson, Steven D.

Publication type:

Article

Materials Science at NIST (Adv. Mater. 3/2011).

Published in:: Advanced Materials, 2011, v. 23, n. 3, p. 312, doi. 10.1002/adma.201190001
Publication type:: Article