Works matching IS 09359648 AND DT 2011 AND VI 23 AND IP 3

Results: 13

Molecular Characterization of Organic Electronic Films.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 319, doi. 10.1002/adma.201001760
By:
- DeLongchamp, Dean M.;
- Kline, R. Joseph;
- Fischer, Daniel A.;
- Richter, Lee J.;
- Toney, Michael F.
Publication type:
Article
Thermodynamic Underpinnings of Cell Alignment on Controlled Topographies.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 421, doi. 10.1002/adma.201001757
By:
- Ding, Yifu;
- Sun, Jirun;
- Ro, Hyun Wook;
- Wang, Zhen;
- Zhou, Jing;
- Lin, Nancy J.;
- Cicerone, Marcus T.;
- Soles, Christopher L.;
- Lin-Gibson, Sheng
Publication type:
Article
Advancing Technology Through Measurement Science in the NIST Polymers Division.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 317, doi. 10.1002/adma.201004238
By:
- Lin, Eric K.;
- Cicerone, Marcus
Publication type:
Article
Materials Science at NIST (Adv. Mater. 3/2011).
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 311, doi. 10.1002/adma.201190000
Publication type:
Article
Combinatorial and High-Throughput Screening of Biomaterials.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 369, doi. 10.1002/adma.201001763
By:
- Simon, Carl G.;
- Lin-Gibson, Sheng
Publication type:
Article
Carbon Nanotubes: Measuring Dispersion and Length.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 338, doi. 10.1002/adma.201001756
By:
- Fagan, Jeffrey A.;
- Bauer, Barry J.;
- Hobbie, Erik K.;
- Becker, Matthew L.;
- Hight Walker, Angela R.;
- Simpson, Jeffrey R.;
- Chun, Jaehun;
- Obrzut, Jan;
- Bajpai, Vardhan;
- Phelan, Fred R.;
- Simien, Daneesh;
- Huh, Ji Yeon;
- Migler, Kalman B.
Publication type:
Article
Photoresist Latent and Developer Images as Probed by Neutron Reflectivity Methods.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 388, doi. 10.1002/adma.201001762
By:
- Prabhu, Vivek M.;
- Kang, Shuhui;
- VanderHart, David L.;
- Satija, Sushil K.;
- Lin, Eric K.;
- Wu, Wen-li
Publication type:
Article
Controlled In Situ Nanocavitation in Polymeric Materials.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 409, doi. 10.1002/adma.201001755
By:
- Cheng, Ya-Jun;
- Antonucci, Joseph M.;
- Hudson, Steven D.;
- Lin, Nancy J.;
- Zhang, Xinran;
- Lin-Gibson, Sheng
Publication type:
Article
Surface Wrinkling: A Versatile Platform for Measuring Thin-Film Properties.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 349, doi. 10.1002/adma.201001759
By:
- Chung, Jun Young;
- Nolte, Adam J.;
- Stafford, Christopher M.
Publication type:
Article
Contents: (Adv. Mater. 3/2011).
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 313, doi. 10.1002/adma.201190002
Publication type:
Article
Cubic Silsesquioxanes as a Green, High-Performance Mold Material for Nanoimprint Lithography.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 414, doi. 10.1002/adma.201001761
By:
- Ro, Hyun Wook;
- Popova, Vera;
- Chen, Lei;
- Forster, Aaron M.;
- Ding, Yifu;
- Alvine, Kyle J.;
- Krug, Dave J.;
- Laine, Richard M.;
- Soles, Christopher L.
Publication type:
Article
Interfacial Rheology Through Microfluidics.
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 426, doi. 10.1002/adma.201001758
By:
- Martin, Jeffrey D.;
- Marhefka, Joie N.;
- Migler, Kalman B.;
- Hudson, Steven D.
Publication type:
Article
Materials Science at NIST (Adv. Mater. 3/2011).
Published in:
Advanced Materials, 2011, v. 23, n. 3, p. 312, doi. 10.1002/adma.201190001
Publication type:
Article