Works matching IS 09359648 AND DT 2005 AND VI 17 AND IP 4
1
- Advanced Materials, 2005, v. 17, n. 4, p. 446, doi. 10.1002/adma.200400978
- Choi, W. C.;
- Woo, S. I.;
- Jeon, M. K.;
- Sohn, J. M.;
- Kim, M. R.;
- Jeon, H. J.
- Article
2
- Advanced Materials, 2005, v. 17, n. 4, p. 495, doi. 10.1002/adma.200590021
- Article
3
- Advanced Materials, 2005, v. 17, n. 4, p. 383, doi. 10.1002/adma.200590015
- Article
4
- Advanced Materials, 2005, v. 17, n. 4, p. 497, doi. 10.1002/adma.200590018
- Article
5
- Advanced Materials, 2005, v. 17, n. 4, p. 392, doi. 10.1002/adma.200590020
- Singh, A.;
- Lee, Y.;
- Dressick, W. J.
- Article
6
- Advanced Materials, 2005, v. 17, n. 4, p. 468, doi. 10.1002/adma.200401031
- Shchukin, D. G.;
- Ustinovich, E. A.;
- Sukhorukov, G. B.;
- Möhwald, H.;
- Sviridov, D. V.
- Article
7
- Advanced Materials, 2005, v. 17, n. 4, p. 412, doi. 10.1002/adma.200401086
- Métraux, G. S.;
- Mirkin, C. A.
- Article
8
- Advanced Materials, 2005, v. 17, n. 4, p. 438, doi. 10.1002/adma.200400020
- Kamp, U.;
- Kitaev, V.;
- von Freymann, G.;
- Ozin, G. A.;
- Mabury, S. A.
- Article
9
- Advanced Materials, 2005, v. 17, n. 4, p. 451, doi. 10.1002/adma.200400266
- de Jonge, N.;
- Doytcheva, M.;
- Allioux, M.;
- Kaiser, M.;
- Mentink, S. A. M.;
- Teo, K. B. K.;
- Lacerda, R. G.;
- Milne, W. I.
- Article
10
- Advanced Materials, 2005, v. 17, n. 4, p. 491, doi. 10.1002/adma.200400957
- Irie, H.;
- Saito, H.;
- Ohkoshi, S.;
- Hashimoto, K.
- Article
11
- Advanced Materials, 2005, v. 17, n. 4, p. 422, doi. 10.1002/adma.200401353
- Argun, A. A.;
- Berard, M.;
- Aubert, P.-H.;
- Reynolds, J. R.
- Article
12
- Advanced Materials, 2005, v. 17, n. 4, p. 473, doi. 10.1002/adma.200401416
- Article
13
- Advanced Materials, 2005, v. 17, n. 4, p. 404, doi. 10.1002/adma.200400966
- Chen, C.-C.;
- Liu, Y.-C.;
- Wu, C.-H.;
- Yeh, C.-C.;
- Su, M.-T.;
- Wu, Y.-C.
- Article
14
- Advanced Materials, 2005, v. 17, n. 4, p. 484, doi. 10.1002/adma.200400897
- Brothers, A. H.;
- Dunand, D. C.
- Article
15
- Advanced Materials, 2005, v. 17, n. 4, p. 455, doi. 10.1002/adma.200401048
- Ling, Q.;
- Song, Y.;
- Ding, S. J.;
- Zhu, C.;
- Chan, D. S. H.;
- Kwong, D.-L.;
- Kang, E.-T.;
- Neoh, K.-G.
- Article
16
- Advanced Materials, 2005, v. 17, n. 4, p. 415, doi. 10.1002/adma.200400867
- Pacifico, J.;
- Gómez, D.;
- Mulvaney, P.
- Article
17
- Advanced Materials, 2005, v. 17, n. 4, p. 495, doi. 10.1002/adma.200590017
- Article
18
- Advanced Materials, 2005, v. 17, n. 4, p. 426, doi. 10.1002/adma.200400898
- Gao, X.;
- Yu, L.;
- MacCuspie, R.;
- Matsui, H.
- Article
19
- Advanced Materials, 2005, v. 17, n. 4, p. 459, doi. 10.1002/adma.200401148
- Peng, H. L.;
- Ran, C. B.;
- Yu, X. C.;
- Zhang, R.;
- Liu, Z. F.
- Article
20
- Advanced Materials, 2005, v. 17, n. 4, p. 392, doi. 10.1002/adma.200590016
- El-Safty, S. A.;
- Hanaoka, T.;
- Mizukami, F.
- Article
21
- Advanced Materials, 2005, v. 17, n. 4, p. 477, doi. 10.1002/adma.200400944
- Article
22
- Advanced Materials, 2005, v. 17, n. 4, p. 399, doi. 10.1002/adma.200400507
- Stachowiak, A. N.;
- Bershteyn, A.;
- Tzatzalos, E.;
- Irvine, D. J.
- Article
23
- Advanced Materials, 2005, v. 17, n. 4, p. 443, doi. 10.1002/adma.200401076
- Article
24
- Advanced Materials, 2005, v. 17, n. 4, p. n/a, doi. 10.1002/adma.200590019
- Kamp, U.;
- Kitaev, V.;
- von Freymann, G.;
- Ozin, G. A.;
- Mabury, S. A.
- Article
25
- Advanced Materials, 2005, v. 17, n. 4, p. 407, doi. 10.1002/adma.200401251
- Miao, Q.;
- Lefenfeld, M.;
- Nguyen, T.-Q.;
- Siegrist, T.;
- Kloc, C.;
- Nuckolls, C.
- Article
26
- Advanced Materials, 2005, v. 17, n. 4, p. 419, doi. 10.1002/adma.200400939
- Wang, C.-H.;
- Chang, Y.-H.;
- Yen, M.-Y.;
- Peng, C.-W.;
- Lee, C.-Y.;
- Chiu, H.-T.
- Article
27
- Advanced Materials, 2005, v. 17, n. 4, p. 464, doi. 10.1002/adma.200400977
- Kim, K.;
- Kim, B. H.;
- Joo, S.-H.;
- Park, J.-S.;
- Joo, J.;
- Jin, J.-I.
- Article
28
- Advanced Materials, 2005, v. 17, n. 4, p. 487, doi. 10.1002/adma.200400466
- Zhang, Y.;
- Zha, S.;
- Liu, M.
- Article
29
- Advanced Materials, 2005, v. 17, n. 4, p. 435, doi. 10.1002/adma.200401002
- Yang, S.;
- Chen, G.;
- Megens, M.;
- Ullal, C. K.;
- Han, Y.-J.;
- Rapaport, R.;
- Thomas, E. L.;
- Aizenberg, J.
- Article
30
- Advanced Materials, 2005, v. 17, n. 4, p. 429, doi. 10.1002/adma.200400611
- Park, J.;
- Kang, E.;
- Son, S. U.;
- Park, H. M.;
- Lee, M. K.;
- Kim, J.;
- Kim, K. W.;
- Noh, H.-J.;
- Park, J.-H.;
- Bae, C. J.;
- Park, J.-G.;
- Hyeon, T.
- Article
31
- Advanced Materials, 2005, v. 17, n. 4, p. 395, doi. 10.1002/adma.200400481
- Therriault, D.;
- Shepherd, R. F.;
- White, S. R.;
- Lewis, J. A.
- Article