Works matching IS 09359648 AND DT 2005 AND VI 17 AND IP 23
1
- Advanced Materials, 2005, v. 17, n. 23, p. NA, doi. 10.1002/adma.200590122
- R. R. Bhat;
- B. N. Chaney;
- J. Rowley;
- A. Liebmann-Vinson;
- J. Genzer
- Article
2
- Advanced Materials, 2005, v. 17, n. 23, p. NA, doi. 10.1002/adma.200590121
- A. A. Zinchenko;
- K. Yoshikawa;
- D. Baigl
- Article
3
- Advanced Materials, 2005, v. 17, n. 23, p. 2895, doi. 10.1002/adma.200590120
- Article
4
- Advanced Materials, 2005, v. 17, n. 23, p. 2894, doi. 10.1002/adma.200590119
- Article
5
- Advanced Materials, 2005, v. 17, n. 23, p. 2893, doi. 10.1002/adma.200590118
- Article
6
- Advanced Materials, 2005, v. 17, n. 23, p. 2777, doi. 10.1002/adma.200590117
- Article
7
- Advanced Materials, 2005, v. 17, n. 23, p. 2820, doi. 10.1002/adma.200501549
- A. A. Zinchenko;
- K. Yoshikawa;
- D. Baigl
- Article
8
- Advanced Materials, 2005, v. 17, n. 23, p. 2824, doi. 10.1002/adma.200501505
- W. H. Binder;
- S. Bernstorff;
- C. Kluger;
- L. Petraru;
- M. J. Kunz
- Article
9
- Advanced Materials, 2005, v. 17, n. 23, p. 2877, doi. 10.1002/adma.200501489
- K. Roy Choudhury;
- Y. Sahoo;
- P. N. Prasad
- Article
10
- Advanced Materials, 2005, v. 17, n. 23, p. 2860, doi. 10.1002/adma.200501353
- M. Huang;
- C. Boone;
- M. Roberts;
- D. E. Savage;
- M. G. Lagally;
- N. Shaji;
- H. Qin;
- R. Blick;
- J. A. Nairn;
- F. Liu
- Article
11
- Advanced Materials, 2005, v. 17, n. 23, p. 2799, doi. 10.1002/adma.200501343
- W. Yao;
- S. H. Yu;
- X. Y. Huang;
- J. Jiang;
- L. Q. Zhao;
- L. Pan;
- J. Li
- Article
12
- Advanced Materials, 2005, v. 17, n. 23, p. 2841, doi. 10.1002/adma.200501297
- Article
13
- Advanced Materials, 2005, v. 17, n. 23, p. 2807, doi. 10.1002/adma.200501291
- R. Jakubiak;
- V. P. Tondiglia;
- L. V. Natarajan;
- R. L. Sutherland;
- P. Lloyd;
- T. J. Bunning;
- R. A. Vaia
- Article
14
- Advanced Materials, 2005, v. 17, n. 23, p. 2869, doi. 10.1002/adma.200501240
- D. Ruzmetov;
- Y. Seo;
- L. J. Belenky;
- D.-M. Kim;
- X. Ke;
- H. Sun;
- V. Chandrasekhar;
- C.-B. Eom;
- M. S. Rzchowski;
- X. Pan
- Article
15
- Advanced Materials, 2005, v. 17, n. 23, p. 2815, doi. 10.1002/adma.200501215
- Y.-G. Guo;
- J.-S. Lee;
- J. Maier
- Article
16
- Advanced Materials, 2005, v. 17, n. 23, p. 2811, doi. 10.1002/adma.200501173
- X. He;
- H. Liu;
- Y. Li;
- S. Wang;
- N. Wang;
- J. Xiao;
- X. Xu;
- D. Zhu
- Article
17
- Advanced Materials, 2005, v. 17, n. 23, p. 2854, doi. 10.1002/adma.200501114
- Z. Zhang;
- J. Sui;
- L. Zhang;
- M. Wan;
- Y. Wei;
- L. Yu
- Article
18
- Advanced Materials, 2005, v. 17, n. 23, p. 2849, doi. 10.1002/adma.200501065
- Q. Yan;
- A. Chen;
- S. J. Chua;
- X. S. Zhao
- Article
19
- Advanced Materials, 2005, v. 17, n. 23, p. 2881, doi. 10.1002/adma.200501024
- X. Chen;
- M. Hirtz;
- H. Fuchs;
- L. Chi
- Article
20
- Advanced Materials, 2005, v. 17, n. 23, p. 2885, doi. 10.1002/adma.200500977
- Z. Y. Li;
- J. Yuan;
- Y. Chen;
- R. E. Palmer;
- J. P. Wilcoxon
- Article
21
- Advanced Materials, 2005, v. 17, n. 23, p. 2872, doi. 10.1002/adma.200500936
- F. Sun;
- W. Cai;
- Y. Li;
- L. Jia;
- F. Lu
- Article
22
- Advanced Materials, 2005, v. 17, n. 23, p. 2802, doi. 10.1002/adma.200500858
- R. R. Bhat;
- B. N. Chaney;
- J. Rowley;
- A. Liebmann-Vinson;
- J. Genzer
- Article
23
- Advanced Materials, 2005, v. 17, n. 23, p. 2837, doi. 10.1002/adma.200500856
- C. L. Stender;
- E. C. Greyson;
- Y. Babayan;
- T. W. Odom
- Article
24
- Advanced Materials, 2005, v. 17, n. 23, p. 2791, doi. 10.1002/adma.200500798
- Z. X. Yang;
- Y. D. Xia;
- R. Mokaya
- Article
25
- Advanced Materials, 2005, v. 17, n. 23, p. 2828, doi. 10.1002/adma.200500793
- D. Lee;
- J. Lee;
- J. Kim;
- H. B. Na;
- B. Kim;
- C.-H. Shin;
- J. H. Kwak;
- A. Dohnalkova;
- J. W. Grate;
- T. Hyeon;
- H.-S. Kim
- Article
26
- Advanced Materials, 2005, v. 17, n. 23, p. 2845, doi. 10.1002/adma.200500717
- A. Cuenat;
- H. B. George;
- K.-C. Chang;
- J. M. Blakely;
- M. J. Aziz
- Article
27
- Advanced Materials, 2005, v. 17, n. 23, p. 2864, doi. 10.1002/adma.200500709
- P. Werner;
- R. Verdejo;
- F. Wöllecke;
- V. Altstädt;
- J. K. W. Sandler;
- M. S. P. Shaffer
- Article
28
- Advanced Materials, 2005, v. 17, n. 23, p. 2888, doi. 10.1002/adma.200500685
- C. Cannizzo;
- C. R. Mayer;
- F. Sécheresse;
- C. Larpent
- Article
29
- Advanced Materials, 2005, v. 17, n. 23, p. 2834, doi. 10.1002/adma.200500638
- D. H. Park;
- S. T. Lim;
- S.-J. Hwang;
- C.-S. Yoon;
- Y.-K. Sun;
- J.-H. Choy
- Article
30
- Advanced Materials, 2005, v. 17, n. 23, p. 2793, doi. 10.1002/adma.200500477
- D. A. Heller;
- S. Baik;
- T. E. Eurell;
- M. S. Strano
- Article
31
- Advanced Materials, 2005, v. 17, n. 23, p. 2857, doi. 10.1002/adma.200500320
- H. Wang;
- T. Abe;
- S. Maruyama;
- Y. Iriyama;
- Z. Ogumi;
- K. Yoshikawa
- Article
32
- Advanced Materials, 2005, v. 17, n. 23, p. 2789, doi. 10.1002/adma.200401275
- Y. Tao;
- H. Kanoh;
- K. Kaneko
- Article