Works matching IS 09359648 AND DT 2000 AND VI 12 AND IP 9
1
- Advanced Materials, 2000, v. 12, n. 9, p. 649, doi. 10.1002/(SICI)1521-4095(200005)12:9<649::AID-ADMA649>3.0.CO;2-K
- Article
2
- Advanced Materials, 2000, v. 12, n. 9, p. 664, doi. 10.1002/(SICI)1521-4095(200005)12:9<664::AID-ADMA664>3.0.CO;2-W
- Beketov, K.;
- Weber, E.;
- Ibragimov, B. T.;
- Seidel, J.;
- Köhnke, K.
- Article
3
- Advanced Materials, 2000, v. 12, n. 9, p. 646, doi. 10.1002/(SICI)1521-4095(200005)12:9<646::AID-ADMA646>3.0.CO;2-W
- Dong, D.;
- Jiang, S.;
- Men, Y.;
- Ji, X.;
- Jiang, B.
- Article
4
- Advanced Materials, 2000, v. 12, n. 9, p. 653, doi. 10.1002/(SICI)1521-4095(200005)12:9<653::AID-ADMA653>3.0.CO;2-3
- Gates, B.;
- Park, S. H.;
- Xia, Y.
- Article
5
- Advanced Materials, 2000, v. 12, n. 9, p. 671, doi. 10.1002/(SICI)1521-4095(200005)12:9<671::AID-ADMA671>3.0.CO;2-3
- Article
6
- Advanced Materials, 2000, v. 12, n. 9, p. 656, doi. 10.1002/(SICI)1521-4095(200005)12:9<656::AID-ADMA656>3.0.CO;2-S
- Zambov, L. M.;
- Popov, C.;
- Abedinov, N.;
- Plass, M. F.;
- Kulisch, W.;
- Gotszalk, T.;
- Grabiec, P.;
- Rangelow, I. W.;
- Kassing, R.
- Article
7
- Advanced Materials, 2000, v. 12, n. 9, p. 675, doi. 10.1002/(SICI)1521-095(200005)12:9<675::AID-DMA675>3.0.CO;2-
- MacLachlan, M. J.;
- Manners, I.;
- Ozin, G. A.
- Article
8
- Advanced Materials, 2000, v. 12, n. 9, p. 633, doi. 10.1002/(SICI)1521-4095(200005)12:9<633::AID-ADMA633>3.0.CO;2-B
- Taleb, A.;
- Silly, F.;
- Gusev, A. O.;
- Charra, F.;
- Pileni, M.-P.
- Article
9
- Advanced Materials, 2000, v. 12, n. 9, p. 640, doi. 10.1002/(SICI)1521-4095(200005)12:9<640::AID-ADMA640>3.0.CO;2-J
- Kiely, C. J.;
- Fink, J.;
- Zheng, J. G.;
- Brust, M.;
- Bethell, D.;
- Schiffrin, D. J.
- Article
10
- Advanced Materials, 2000, v. 12, n. 9, p. 617, doi. 10.1002/(SICI)1521-4095(200005)12:9<617::AID-ADMA617>3.0.CO;2-3
- Evans, K. E.;
- Alderson, A.
- Article
11
- Advanced Materials, 2000, v. 12, n. 9, p. 668, doi. 10.1002/(SICI)1521-4095(200005)12:9<668::AID-ADMA668>3.0.CO;2-G
- Wu, I.-Y.;
- Lin, J. T.;
- Tao, Y.-T.;
- Balasubramaniam, E.
- Article
12
- Advanced Materials, 2000, v. 12, n. 9, p. 661, doi. 10.1002/(SICI)1521-4095(200005)12:9<661::AID-ADMA661>3.0.CO;2-7
- Tanaka, K.;
- Yoshida, K.;
- Ishida, T.;
- Kobayashi, A.;
- Nogami, T.
- Article
13
- Advanced Materials, 2000, v. 12, n. 9, p. 637, doi. 10.1002/(SICI)1521-4095(200005)12:9<637::AID-ADMA637>3.0.CO;2-W
- Bognitzki, M.;
- Hou, H.;
- Ishaque, M.;
- Frese, T.;
- Hellwig, M.;
- Schwarte, C.;
- Schaper, A.;
- Wendorff, J. H.;
- Greiner, A.
- Article
14
- Advanced Materials, 2000, v. 12, n. 9, p. 643, doi. 10.1002/(SICI)1521-4095(200005)12:9<643::AID-ADMA643>3.0.CO;2-7
- Tatsuma, T.;
- Ikezawa, A.;
- Ohko, Y.;
- Miwa, T.;
- Matsue, T.;
- Fujishima, A.
- Article
15
- Advanced Materials, 2000, v. 12, n. 9, p. 629, doi. 10.1002/(SICI)1521-4095(200005)12:9<629::AID-ADMA629>3.0.CO;2-S
- Andreev, A.;
- Matt, G.;
- Brabec, C. J.;
- Sitter, H.;
- Badt, D.;
- Seyringer, H.;
- Sariciftci, N. S.
- Article
