Works matching IS 09359648 AND DT 2000 AND VI 12 AND IP 11
1
- Advanced Materials, 2000, v. 12, n. 11, p. 839, doi. 10.1002/(SICI)1521-4095(200006)12:11<839::AID-ADMA839>3.0.CO;2-9
- Article
2
- Advanced Materials, 2000, v. 12, n. 11, p. 787, doi. 10.1002/(SICI)1521-4095(200006)12:11<787::AID-ADMA787>3.0.CO;2-1
- Thurn-Albrecht, T.;
- Steiner, R.;
- DeRouchey, J.;
- Stafford, C. M.;
- Huang, E.;
- Bal, M.;
- Tuominen, M.;
- Hawker, C. J.;
- Russell, T. P.
- Article
3
- Advanced Materials, 2000, v. 12, n. 11, p. 801, doi. 10.1002/(SICI)1521-4095(200006)12:11<801::AID-ADMA801>3.0.CO;2-G
- Article
4
- Advanced Materials, 2000, v. 12, n. 11, p. 812, doi. 10.1002/(SICI)1521-4095(200006)12:11<812::AID-ADMA812>3.0.CO;2-8
- Urbas, A.;
- Sharp, R.;
- Fink, Y.;
- Thomas, E. L.;
- Xenidou, M.;
- Fetters, L. J.
- Article
5
- Advanced Materials, 2000, v. 12, n. 11, p. 805, doi. 10.1002/(SICI)1521-4095(200006)12:11<805::AID-ADMA805>3.0.CO;2-0
- Eck, W.;
- Stadler, V.;
- Geyer, W.;
- Zharnikov, M.;
- Gölzhäuser, A.;
- Grunze, M.
- Article
6
- Advanced Materials, 2000, v. 12, n. 11, p. 833, doi. 10.1002/(SICI)1521-4095(200006)12:11<833::AID-ADMA833>3.0.CO;2-X
- Kulinowski, K. M.;
- Jiang, P.;
- Vaswani, H.;
- Colvin, V. L.
- Article
7
- Advanced Materials, 2000, v. 12, n. 11, p. 808, doi. 10.1002/(SICI)1521-4095(200006)12:11<808::AID-ADMA808>3.0.CO;2-P
- Huang, J.;
- Xie, Y.;
- Li, B.;
- Liu, Y.;
- Qian, Y.;
- Zhang, S.
- Article
8
- Advanced Materials, 2000, v. 12, n. 11, p. 796, doi. 10.1002/(SICI)1521-4095(200006)12:11<796::AID-ADMA796>3.0.CO;2-1
- Uppuluri, S.;
- Swanson, D. R.;
- Piehler, L. T.;
- Li, J.;
- Hagnauer, G. L.;
- Tomalia, D. A.
- Article
9
- Advanced Materials, 2000, v. 12, n. 11, p. 821, doi. 10.1002/(SICI)1521-4095(200006)12:11<821::AID-ADMA821>3.0.CO;2-8
- Peng, B.;
- Rühe, J.;
- Johannsmann, D.
- Article
10
- Advanced Materials, 2000, v. 12, n. 11, p. 843, doi. 10.1002/(SICI)1521-4095(200006)12:11<843::AID-ADMA843>3.0.CO;2-T
- Chen, C. Z.;
- Cooper, S. L.
- Article
11
- Advanced Materials, 2000, v. 12, n. 11, p. 814, doi. 10.1002/(SICI)1521-4095(200006)12:11<814::AID-ADMA814>3.0.CO;2-0
- Remškar, M.;
- Škraba, Z.;
- Stadelmann, P.;
- Lévy, F.
- Article
12
- Advanced Materials, 2000, v. 12, n. 11, p. 825, doi. 10.1002/(SICI)1521-4095(200006)12:11<825::AID-ADMA825>3.0.CO;2-T
- Moderegger, E.;
- Wenzl, F. P.;
- Tasch, S.;
- Leising, G.;
- Scherf, U.;
- Annan, K. O.
- Article
13
- Advanced Materials, 2000, v. 12, n. 11, p. 791, doi. 10.1002/(SICI)1521-4095(200006)12:11<791::AID-ADMA791>3.0.CO;2-L
- Article
14
- Advanced Materials, 2000, v. 12, n. 11, p. 818, doi. 10.1002/(SICI)1521-4095(200006)12:11<818::AID-ADMA818>3.0.CO;2-L
- Li, Y.;
- Sui, M.;
- Ding, Y.;
- Zhang, G.;
- Zhuang, J.;
- Wang, C.
- Article
15
- Advanced Materials, 2000, v. 12, n. 11, p. 828, doi. 10.1002/(SICI)1521-4095(200006)12:11<828::AID-ADMA828>3.0.CO;2-H
- Yu, W.-L.;
- Pei, J.;
- Huang, W.;
- Heeger, A. J.
- Article