Works matching IS 09359648 AND DT 1998 AND VI 10 AND IP 2
1
- Advanced Materials, 1998, v. 10, n. 2, p. 173, doi. 10.1002/(SICI)1521-4095(199801)10:2<173::AID-ADMA173>3.0.CO;2-E
- Blumstein, Alexandre;
- Samuelson, Lynne
- Article
2
- Advanced Materials, 1998, v. 10, n. 2, p. 144, doi. 10.1002/(SICI)1521-4095(199801)10:2<144::AID-ADMA144>3.0.CO;2-M
- MacLachlan, Mark J.;
- Aroca, Patricia;
- Coombs, Neil;
- Manners, Ian;
- Ozin, Geoffrey A.
- Article
3
- Advanced Materials, 1998, v. 10, n. 2, p. 126, doi. 10.1002/(SICI)1521-4095(199801)10:2<126::AID-ADMA126>3.0.CO;2-M
- Franke, Rainer;
- Rothe, Jörg;
- Becker, Ralf;
- Pollmann, Jörg;
- Hormes, Josef;
- Bönnemann, Helmut;
- Brijoux, Werner;
- Köppler, Rainer
- Article
4
- Advanced Materials, 1998, v. 10, n. 2, p. 121, doi. 10.1002/(SICI)1521-4095(199801)10:2<121::AID-ADMA121>3.0.CO;2-5
- Guo, Shouwu;
- Popovitz-Biro, Ronit;
- Weissbuch, Isabelle;
- Cohen, Hagai;
- Hodes, Gary;
- Lahav, Meir
- Article
5
- Advanced Materials, 1998, v. 10, n. 2, p. 161, doi. 10.1002/(SICI)1521-4095(199801)10:2<161::AID-ADMA161>3.0.CO;2-Q
- Liu, Jun;
- Feng, Xiangdong;
- Fryxell, Glen E.;
- Wang, Li-Qiong;
- Kim, Anthony Y.;
- Gong, Meiling
- Article
6
- Advanced Materials, 1998, v. 10, n. 2, p. 132, doi. 10.1002/(SICI)1521-4095(199801)10:2<132::AID-ADMA132>3.0.CO;2-Y
- Selvan, Tamil;
- Spatz, Joachim P.;
- Klok, Harm-Anton;
- Möller, Martin
- Article
7
- Advanced Materials, 1998, v. 10, n. 2, p. 154, doi. 10.1002/(SICI)1521-4095(199801)10:2<154::AID-ADMA154>3.0.CO;2-I
- Antonietti, Markus;
- Berton, Beate;
- Göltner, Christine;
- Hentze, Hans-Peter
- Article
8
- Advanced Materials, 1998, v. 10, n. 2, p. 135, doi. 10.1002/(SICI)1521-4095(199801)10:2<135::AID-ADMA135>3.0.CO;2-M
- Wang, Rong;
- Hashimoto, Kazuhito;
- Fujishima, Akira;
- Chikuni, Makoto;
- Kojima, Eiichi;
- Kitamura, Atsushi;
- Shimohigoshi, Mitsuhide;
- Watanabe, Toshiya
- Article
9
- Advanced Materials, 1998, v. 10, n. 2, p. 117, doi. 10.1002/(SICI)1521-4095(199801)10:2<117::AID-ADMA117>3.0.CO;2-M
- Weissbuch, Isabelle;
- Guo, Shouwa;
- Edgar, Ron;
- Cohen, Sidney;
- Howes, Paul;
- Kjaer, Kristian;
- Als-Nielsen, Jens;
- Lahav, Meir;
- Leiserowitz, Leslie
- Article
10
- Advanced Materials, 1998, v. 10, n. 2, p. 93, doi. 10.1002/(SICI)1521-4095(199801)10:2<93::AID-ADMA93>3.0.CO;2-F
- Article
11
- Advanced Materials, 1998, v. 10, n. 2, p. 167, doi. 10.1002/(SICI)1521-4095(199801)10:2<167::AID-ADMA167>3.0.CO;2-2
- Dirr, Siegfried;
- Wiese, Stefan;
- Johannes, Hans-Hermann;
- Kowalsky, Wolfgang
- Article
12
- Advanced Materials, 1998, v. 10, n. 2, p. 138, doi. 10.1002/(SICI)1521-4095(199801)10:2<138::AID-ADMA138>3.0.CO;2-A
- Valcárcel, Víctor;
- Souto, Alejandro;
- Guitián, Francisco
- Article
13
- Advanced Materials, 1998, v. 10, n. 2, p. 149, doi. 10.1002/(SICI)1521-4095(199801)10:2<149::AID-ADMA149>3.0.CO;2-2
- Dickert, Franz L.;
- Besenböck, Helga;
- Tortschanoff, Matthias
- Article
14
- Advanced Materials, 1998, v. 10, n. 2, p. 140, doi. 10.1002/(SICI)1521-4095(199801)10:2<140::AID-ADMA140>3.0.CO;2-1
- Rajagopal, Aparna;
- Kahn, Antoine
- Article
15
- Advanced Materials, 1998, v. 10, n. 2, p. 151, doi. 10.1002/(SICI)1521-4095(199801)10:2<151::AID-ADMA151>3.0.CO;2-U
- Sims, Stephen D.;
- Walsh, Dominic;
- Mann, Stephen
- Article
