Editorial.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 689, doi. 10.1007/s10836-024-06156-0
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2024 AND VI 40 AND IP 6
Results: 8
1
2
Multi-modal Pre-silicon Evaluation of Hardware Masking Styles.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 723, doi. 10.1007/s10836-024-06155-1
- By:
- Publication type:
- Article
3
Modeling and Parasitic Extraction of the MM9 Transistor for GHz/THz CMOS RF Circuit Design.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 795, doi. 10.1007/s10836-024-06154-2
- By:
- Publication type:
- Article
4
Advancing Low Power BIST Architecture with GAN-Driven Test Pattern Optimization.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 691, doi. 10.1007/s10836-024-06153-3
- By:
- Publication type:
- Article
5
A SLvT Adaptive Test Method for Integrated Circuit Test Parameter Sets without Yield Loss.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 777, doi. 10.1007/s10836-024-06152-4
- By:
- Publication type:
- Article
6
Fatigue Life Based Study of Electronic Package Mounting Locations on Printed Circuit Boards Subjected to Random Vibration Loads.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 761, doi. 10.1007/s10836-024-06151-5
- By:
- Publication type:
- Article
7
A Feature-Adaptive and Scalable Hardware Trojan Detection Framework For Third-party IPs Utilizing Multilevel Feature Analysis and Random Forest.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 741, doi. 10.1007/s10836-024-06150-6
- By:
- Publication type:
- Article
8
A Novel Two-Stage Model Based SCA against secAES.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 6, p. 707, doi. 10.1007/s10836-024-06149-z
- By:
- Publication type:
- Article