Works matching IS 09238174 AND DT 2024 AND VI 40 AND IP 4
Results: 12
Editorial.
- Published in:
- 2024
- By:
- Publication type:
- Editorial
Pebble Traversal-Based Fault Detection and Advanced Reconfiguration Technique for Digital Microfluidic Biochips.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 573, doi. 10.1007/s10836-024-06137-3
- By:
- Publication type:
- Article
An Automatic Software Testing Method to Discover Hard-to-Detect Faults Using Hybrid Olympiad Optimization Algorithm.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 539, doi. 10.1007/s10836-024-06136-4
- By:
- Publication type:
- Article
Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 525, doi. 10.1007/s10836-024-06135-5
- By:
- Publication type:
- Article
High-Dimensional Feature Fault Diagnosis Method Based on HEFS-LGBM.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 557, doi. 10.1007/s10836-024-06134-6
- By:
- Publication type:
- Article
Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning Models.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 435, doi. 10.1007/s10836-024-06133-7
- By:
- Publication type:
- Article
A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 419, doi. 10.1007/s10836-024-06132-8
- By:
- Publication type:
- Article
Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security Solution.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 487, doi. 10.1007/s10836-024-06130-w
- By:
- Publication type:
- Article
Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoT.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 469, doi. 10.1007/s10836-024-06129-3
- By:
- Publication type:
- Article
Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 497, doi. 10.1007/s10836-024-06128-4
- By:
- Publication type:
- Article
ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 457, doi. 10.1007/s10836-024-06127-5
- By:
- Publication type:
- Article
Formal Verification of a Dependable State Machine-Based Hardware Architecture for Safety-Critical Cyber-Physical Systems: Analysis, Design, and Implementation.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 4, p. 509, doi. 10.1007/s10836-024-06126-6
- By:
- Publication type:
- Article