Works matching IS 09238174 AND DT 2024 AND VI 40 AND IP 4

Results: 12

Editorial.

Published in:

2024

By:

Agrawal, Vishwani D.

Publication type:

Editorial

A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 419, doi. 10.1007/s10836-024-06132-8

By:

Hou, Xingna;
Qin, Guanxiang;
Lu, Ying;
Yi, Mulan;
Chen, Shouhong

Publication type:

Article

An Automatic Software Testing Method to Discover Hard-to-Detect Faults Using Hybrid Olympiad Optimization Algorithm.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 539, doi. 10.1007/s10836-024-06136-4

By:

Zheng, Leiqing;
Arasteh, Bahman;
Mehrabani, Mahsa Nazeri;
Abania, Amir Vahide

Publication type:

Article

Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 525, doi. 10.1007/s10836-024-06135-5

By:

A, Ahilan;
Gorantla, Anusha;
Kiruba, Gladys;
Hamad, Asmaa A.;
Hassan, Mohamed M.;
N., Venkatram;
T. V., Sindhu

Publication type:

Article

High-Dimensional Feature Fault Diagnosis Method Based on HEFS-LGBM.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 557, doi. 10.1007/s10836-024-06134-6

By:

Li, Gen;
Li, Wenhai;
Wen, Tianzhu;
Sun, Weichao;
Tang, Xi

Publication type:

Article

Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning Models.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 435, doi. 10.1007/s10836-024-06133-7

By:

Dhar, Manali;
Mukherjee, Chiradeep;
Banerjee, Ananya;
Manna, Debasmita;
Panda, Saradindu;
Maji, Bansibadan

Publication type:

Article

Pebble Traversal-Based Fault Detection and Advanced Reconfiguration Technique for Digital Microfluidic Biochips.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 573, doi. 10.1007/s10836-024-06137-3

By:

Saha, Basudev;
Das, Bidyut;
Shukla, Vineeta;
Majumder, Mukta

Publication type:

Article

Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security Solution.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 487, doi. 10.1007/s10836-024-06130-w

By:

Panchore, Meena;
Rajan, Chithraja;
Singh, Jawar

Publication type:

Article

Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoT.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 469, doi. 10.1007/s10836-024-06129-3

By:

Mouleeswaran, S. K.;
Ramesh, K.;
Manikandan, K.;
Anbalagan, VivekYoganand

Publication type:

Article

Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 497, doi. 10.1007/s10836-024-06128-4

By:

Iwata, Hiroshi;
Yamasaki, Kokoro;
Yamaguchi, Ken'ichi

Publication type:

Article

ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 457, doi. 10.1007/s10836-024-06127-5

By:

Yuan, Jun;
Zhang, Yuyang;
Zhang, Liangrui;
Hou, Shuaiqi;
Han, Yukun

Publication type:

Article

Formal Verification of a Dependable State Machine-Based Hardware Architecture for Safety-Critical Cyber-Physical Systems: Analysis, Design, and Implementation.

Published in:

Journal of Electronic Testing, 2024, v. 40, n. 4, p. 509, doi. 10.1007/s10836-024-06126-6

By:

Khairullah, Shawkat Sabah

Publication type:

Article