Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic Algorithm.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 3, p. 371, doi. 10.1007/s10836-024-06122-w
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2024 AND VI 40 AND IP 3
Results: 8
1
2
Formal Verification of Universal Numbers using Theorem Proving.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 3, p. 329, doi. 10.1007/s10836-024-06123-9
- By:
- Publication type:
- Article
3
A Novel Framework For Optimal Test Case Generation and Prioritization Using Ent-LSOA And IMTRNN Techniques.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 3, p. 347, doi. 10.1007/s10836-024-06121-x
- By:
- Publication type:
- Article
4
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 3, p. 291, doi. 10.1007/s10836-024-06119-5
- By:
- Publication type:
- Article
5
Editorial.
- Published in:
- 2024
- By:
- Publication type:
- Case Study
6
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 3, p. 405, doi. 10.1007/s10836-024-06125-7
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- Publication type:
- Article
7
Design and Verification of a SAR ADC SystemVerilog Real Number Model.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 3, p. 315, doi. 10.1007/s10836-024-06124-8
- By:
- Publication type:
- Article
8
Phase Noise Analysis Performance Improvement, Testing and Stabilization of Microwave Frequency Source.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 3, p. 387, doi. 10.1007/s10836-024-06118-6
- By:
- Publication type:
- Article