Editorial.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 137, doi. 10.1007/s10836-024-06120-y
- By:
- Publication type:
- Article
Works matching IS 09238174 AND DT 2024 AND VI 40 AND IP 2
Results: 11
1
2
A Survey and Recent Advances: Machine Intelligence in Electronic Testing.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 139, doi. 10.1007/s10836-024-06117-7
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- Publication type:
- Article
3
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means Algorithm.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 229, doi. 10.1007/s10836-024-06116-8
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- Publication type:
- Article
4
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 199, doi. 10.1007/s10836-024-06115-9
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- Publication type:
- Article
5
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 185, doi. 10.1007/s10836-024-06114-w
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- Publication type:
- Article
6
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 171, doi. 10.1007/s10836-024-06113-x
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- Publication type:
- Article
7
Instant Test and Repair for TSVs using Differential Signaling.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 275, doi. 10.1007/s10836-024-06112-y
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- Publication type:
- Article
8
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 159, doi. 10.1007/s10836-024-06109-7
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- Publication type:
- Article
9
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 215, doi. 10.1007/s10836-024-06107-9
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- Publication type:
- Article
10
Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network Performance.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 259, doi. 10.1007/s10836-024-06106-w
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- Publication type:
- Article
11
A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing.
- Published in:
- Journal of Electronic Testing, 2024, v. 40, n. 2, p. 245, doi. 10.1007/s10836-024-06108-8
- By:
- Publication type:
- Article