Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 539, doi. 10.1007/s10836-023-06096-1
- Publication type:
- Article
Works matching IS 09238174 AND DT 2023 AND VI 39 AND IP 5/6
Results: 12
1
2
2022 JETTA-TTTC Best Paper Award: Zhi-Wei Lai, Po-Hua Huang, and Kuen-Jong Lee, "Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function," Journal of Electronic Testing: Theory and Applications, Volume 38, Number 5, pp. 511–525, October 2022
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 537, doi. 10.1007/s10836-023-06094-3
- Publication type:
- Article
3
Editorial.
- Published in:
- 2023
- By:
- Publication type:
- Editorial
4
Performance Efficient and Fault Tolerant Approximate Adder.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 571, doi. 10.1007/s10836-023-06092-5
- By:
- Publication type:
- Article
5
A Survey of PCB Defect Detection Algorithms.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 541, doi. 10.1007/s10836-023-06091-6
- By:
- Publication type:
- Article
6
Detection Method of Hardware Trojan Based on Attention Mechanism and Residual-Dense-Block under the Markov Transition Field.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 621, doi. 10.1007/s10836-023-06090-7
- By:
- Publication type:
- Article
7
Effective Software Mutation-Test Using Program Instructions Classification.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 631, doi. 10.1007/s10836-023-06089-0
- By:
- Publication type:
- Article
8
MATLAB-Open Source Tool Based Framework for Test Generation for Digital Circuits Using Evolutionary Algorithms.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 555, doi. 10.1007/s10836-023-06088-1
- By:
- Publication type:
- Article
9
Trade-off Mechanism Between Reliability and Performance for Data-flow Soft Error Detection.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 583, doi. 10.1007/s10836-023-06087-2
- By:
- Publication type:
- Article
10
Efficient Fault Detection by Test Case Prioritization via Test Case Selection.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 659, doi. 10.1007/s10836-023-06086-3
- By:
- Publication type:
- Article
11
A Low Bit Instability CMOS PUF Based on Current Mirrors and WTA Cells.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 611, doi. 10.1007/s10836-023-06085-4
- By:
- Publication type:
- Article
12
Identification of Unknown Electromagnetic Interference Sources Based on Siamese-CNN.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 5/6, p. 597, doi. 10.1007/s10836-023-06082-7
- By:
- Publication type:
- Article