Works matching IS 09238174 AND DT 2023 AND VI 39 AND IP 3
Results: 10
Editorial.
- Published in:
- 2023
- By:
- Publication type:
- Correction Notice
Test Technology Newsletter.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 265, doi. 10.1007/s10836-023-06073-8
- Publication type:
- Article
Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 371, doi. 10.1007/s10836-023-06071-w
- By:
- Publication type:
- Article
A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 347, doi. 10.1007/s10836-023-06070-x
- By:
- Publication type:
- Article
Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 275, doi. 10.1007/s10836-023-06068-5
- By:
- Publication type:
- Article
Incomplete Testing of SOC.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 387, doi. 10.1007/s10836-023-06067-6
- By:
- Publication type:
- Article
A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 323, doi. 10.1007/s10836-023-06066-7
- By:
- Publication type:
- Article
Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 289, doi. 10.1007/s10836-023-06064-9
- By:
- Publication type:
- Article
Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 267, doi. 10.1007/s10836-023-06063-w
- By:
- Publication type:
- Article
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems.
- Published in:
- Journal of Electronic Testing, 2023, v. 39, n. 3, p. 303, doi. 10.1007/s10836-023-06062-x
- By:
- Publication type:
- Article