Works matching IS 09238174 AND DT 2022 AND VI 38 AND IP 6
2
- Journal of Electronic Testing, 2022, v. 38, n. 6, p. 577, doi. 10.1007/s10836-022-06040-9
- Article
3
- Journal of Electronic Testing, 2022, v. 38, n. 6, p. 637, doi. 10.1007/s10836-022-06039-2
- Farayola, Praise O.;
- Bruce, Isaac;
- Chaganti, Shravan K.;
- Sheikh, Abalhassan;
- Ravi, Srivaths;
- Chen, Degang
- Article
4
- Journal of Electronic Testing, 2022, v. 38, n. 6, p. 603, doi. 10.1007/s10836-022-06038-3
- Lylina, Natalia;
- Wang, Chih-Hao;
- Wunderlich, Hans-Joachim
- Article
5
- Journal of Electronic Testing, 2022, v. 38, n. 6, p. 589, doi. 10.1007/s10836-022-06037-4
- Nguimfack-Ndongmo, Jean de Dieu;
- Kentsa Zana, Kevin;
- Asoh, Derek Ajesam;
- Kengnou Telem, Nicole Adélaïde;
- Kuate-Fochie, René;
- Kenné, Godpromesse
- Article
6
- Journal of Electronic Testing, 2022, v. 38, n. 6, p. 579, doi. 10.1007/s10836-022-06036-5
- Pannu, Neha;
- Prakash, Neelam Rup;
- Kaur, Jasbir
- Article
7
- Journal of Electronic Testing, 2022, v. 38, n. 6, p. 667, doi. 10.1007/s10836-022-06035-6
- Sharma, Richa;
- Sharma, G. K.;
- Pattanaik, Manisha
- Article
8
- Journal of Electronic Testing, 2022, v. 38, n. 6, p. 653, doi. 10.1007/s10836-022-06034-7
- Naveenkumar, R.;
- Sivamangai, N. M.;
- Napolean, A.;
- Priya, S. Sridevi Sathya
- Article
9
- Journal of Electronic Testing, 2022, v. 38, n. 6, p. 623, doi. 10.1007/s10836-022-06033-8
- Chandra, S. S. Vinod;
- Sankar, S. Saju;
- Anand, H. S.
- Article