Works matching IS 09238174 AND DT 2022 AND VI 38 AND IP 5


Results: 10
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    Test Technology Newsletter.

    Published in:
    Journal of Electronic Testing, 2022, v. 38, n. 5, p. 469, doi. 10.1007/s10836-022-06030-x
    Publication type:
    Article
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    A Review of Various Defects in PCB.

    Published in:
    Journal of Electronic Testing, 2022, v. 38, n. 5, p. 481, doi. 10.1007/s10836-022-06026-7
    By:
    • Sankar, V. Udaya;
    • Lakshmi, Gayathri;
    • Sankar, Y. Siva
    Publication type:
    Article
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