Works matching IS 09238174 AND DT 2022 AND VI 38 AND IP 5
2
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 465, doi. 10.1007/s10836-022-06031-w
- Article
3
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 469, doi. 10.1007/s10836-022-06030-x
- Article
4
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 567, doi. 10.1007/s10836-022-06029-4
- Rao, E. Jagadeeswara;
- Rao, K. Tarakeswara;
- Ramya, K. Sudha;
- Ajaykumar, D.;
- Trinadh, R.
- Article
5
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 527, doi. 10.1007/s10836-022-06028-5
- Zhong, Yadi;
- Jain, Ayush;
- Rahman, M. Tanjidur;
- Asadizanjani, Navid;
- Xie, Jiafeng;
- Guin, Ujjwal
- Article
6
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 547, doi. 10.1007/s10836-022-06027-6
- Deepanjali, S;
- Sk, Noor Mahammad
- Article
7
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 481, doi. 10.1007/s10836-022-06026-7
- Sankar, V. Udaya;
- Lakshmi, Gayathri;
- Sankar, Y. Siva
- Article
8
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 511, doi. 10.1007/s10836-022-06025-8
- Lai, Zhi-Wei;
- Huang, Po-Hua;
- Lee, Kuen-Jong
- Article
9
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 471, doi. 10.1007/s10836-022-06024-9
- Varun, Janani;
- Karthika, R. A.
- Article
10
- Journal of Electronic Testing, 2022, v. 38, n. 5, p. 493, doi. 10.1007/s10836-022-06022-x
- Doranga, Sushil;
- Zhou, Jenny;
- Poudel, Ram
- Article