Works matching IS 09238174 AND DT 2022 AND VI 38 AND IP 4

Results: 10

Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 339, doi. 10.1007/s10836-022-06016-9

By:

Sun, Yang;
Millican, Spencer K.

Publication type:

Article

Efficient Design of Rounding Based Static Segment Imprecise Multipliers for Error Tolerance Application.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 371, doi. 10.1007/s10836-022-06011-0

By:

Raju, D. Tilak;
Rao, Y. Srinivasa

Publication type:

Article

Editorial.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 335, doi. 10.1007/s10836-022-06023-w

By:

Agrawal, Vishwani D.

Publication type:

Article

CMOS Implementation and Performance Analysis of Known Approximate 4:2 Compressors.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 353, doi. 10.1007/s10836-022-06010-1

By:

Anguraj, Parthibaraj;
Krishnan, Thiruvenkadam;
Subramanian, Saravanan

Publication type:

Article

The Newsletter of the Test Technology Technical Council of the IEEE Computer Society.

Published in:: Journal of Electronic Testing, 2022, v. 38, n. 4, p. 337, doi. 10.1007/s10836-022-06021-y
Publication type:: Article

Automated Design Error Debugging of Digital VLSI Circuits.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 395, doi. 10.1007/s10836-022-06020-z

By:

Moness, Mohammed;
Gaber, Lamya;
Hussein, Aziza I.;
Ali, Hanafy M.

Publication type:

Article

A New Approximate 4-2 Compressor using Merged Sum and Carry.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 381, doi. 10.1007/s10836-022-06019-6

By:

Jyothi, Chinthalgiri;
Saranya, K.;
Jammu, Bhaskara Rao;
Veeramachaneni, Sreehari;
Mahammad, SK Noor

Publication type:

Article

Novel Fault-Tolerant Processing in Memory Cell in Ternary Quantum-Dot Cellular Automata.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 419, doi. 10.1007/s10836-022-06018-7

By:

Dehbozorgi, Leila;
Sabbaghi-Nadooshan, Reza;
Kashaninia, Alireza

Publication type:

Article

Experimental and Simulation Results of Wien Bridge Oscillator Circuıt Realized wıth Op-Amp Designed Using a Memristor.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 445, doi. 10.1007/s10836-022-06017-8

By:

Parlar, İshak;
Almali, M. Nuri

Publication type:

Article

Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization.

Published in:

Journal of Electronic Testing, 2022, v. 38, n. 4, p. 453, doi. 10.1007/s10836-022-06013-y

By:

Amin, Syed Usman;
Shahbaz, Muhammad Aaquib;
Jawed, Syed Arsalan;
Khan, Fahd;
Junaid, Muhammad;
Kaleem, Danish;
Siddiq, Musaddiq;
Warsi, Zain;
Naveed

Publication type:

Article